BibTeX records: Rui Liu 0011

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@article{DBLP:journals/mr/LiCNCWLCKSGBWW18,
  author    = {Yuanqing Li and
               Li Chen and
               Issam Nofal and
               Mo Chen and
               Haibin Wang and
               Rui Liu and
               Qingyu Chen and
               Milos Krstic and
               Shuting Shi and
               Gang Guo and
               Sang H. Baeg and
               Shi{-}Jie Wen and
               Richard Wong},
  title     = {Modeling and analysis of single-event transient sensitivity of a 65{\unicode{8239}}nm
               clock tree},
  journal   = {Microelectron. Reliab.},
  volume    = {87},
  pages     = {24--32},
  year      = {2018},
  url       = {https://doi.org/10.1016/j.microrel.2018.05.016},
  doi       = {10.1016/j.microrel.2018.05.016},
  timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/journals/mr/LiCNCWLCKSGBWW18.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/NofalEHGLCLWCBW17,
  author    = {Issam Nofal and
               Adrian Evans and
               A.{-}L. He and
               Gang Guo and
               Yuanqing Li and
               Li Chen and
               Rui Liu and
               Haibin Wang and
               Mo Chen and
               Sang H. Baeg and
               Shi{-}Jie Wen and
               Richard Wong},
  title     = {{BPPT} - Bulk potential protection technique for hardened sequentials},
  booktitle = {23rd {IEEE} International Symposium on On-Line Testing and Robust
               System Design, {IOLTS} 2017, Thessaloniki, Greece, July 3-5, 2017},
  pages     = {28--32},
  publisher = {{IEEE}},
  year      = {2017},
  url       = {https://doi.org/10.1109/IOLTS.2017.8046194},
  doi       = {10.1109/IOLTS.2017.8046194},
  timestamp = {Wed, 20 Nov 2019 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/conf/iolts/NofalEHGLCLWCBW17.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/LiWL0LC16,
  author    = {Yuanqing Li and
               Haibin Wang and
               Lixiang Li and
               Li Chen and
               Rui Liu and
               Mo Chen},
  title     = {A Built-in Single Event Upsets Detector for Sequential Cells},
  journal   = {J. Electronic Testing},
  volume    = {32},
  number    = {1},
  pages     = {11--20},
  year      = {2016},
  url       = {https://doi.org/10.1007/s10836-015-5560-2},
  doi       = {10.1007/s10836-015-5560-2},
  timestamp = {Sat, 13 Jun 2020 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/journals/et/LiWL0LC16.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/LiLM0LWWNC16,
  author    = {Yuanqing Li and
               Lixiang Li and
               Yuan Ma and
               Li Chen and
               Rui Liu and
               Haibin Wang and
               Qiong Wu and
               Michael Newton and
               Mo Chen},
  title     = {A 10-Transistor 65 nm {SRAM} Cell Tolerant to Single-Event Upsets},
  journal   = {J. Electronic Testing},
  volume    = {32},
  number    = {2},
  pages     = {137--145},
  year      = {2016},
  url       = {https://doi.org/10.1007/s10836-016-5573-5},
  doi       = {10.1007/s10836-016-5573-5},
  timestamp = {Sat, 13 Jun 2020 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/journals/et/LiLM0LWWNC16.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ChenWCLZLCL16,
  author    = {Qingyu Chen and
               Haibin Wang and
               Li Chen and
               Lixiang Li and
               Xing Zhao and
               Rui Liu and
               Mo Chen and
               Xuantian Li},
  title     = {An SEU-Resilient {SRAM} Bitcell in 65-nm {CMOS} Technology},
  journal   = {J. Electronic Testing},
  volume    = {32},
  number    = {3},
  pages     = {385--391},
  year      = {2016},
  url       = {https://doi.org/10.1007/s10836-016-5586-0},
  doi       = {10.1007/s10836-016-5586-0},
  timestamp = {Sat, 13 Jun 2020 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/journals/et/ChenWCLZLCL16.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ccece/WangLL0HK16,
  author    = {Haibin Wang and
               Rui Liu and
               X.{-}T. Li and
               Li Chen and
               David M. Hiemstra and
               Valeri Kirischian},
  title     = {Total ionizing dose test facilities for micro-electronic circuits},
  booktitle = {2016 {IEEE} Canadian Conference on Electrical and Computer Engineering,
               {CCECE} 2016, Vancouver, BC, Canada, May 15-18, 2016},
  pages     = {1--4},
  publisher = {{IEEE}},
  year      = {2016},
  url       = {https://doi.org/10.1109/CCECE.2016.7726602},
  doi       = {10.1109/CCECE.2016.7726602},
  timestamp = {Wed, 20 Nov 2019 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/conf/ccece/WangLL0HK16.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/WangLCBLL15,
  author    = {Haibin Wang and
               Rui Liu and
               Li Chen and
               Jinshun Bi and
               Mulong Li and
               Yuanqing Li},
  title     = {A Novel Built-in Current Sensor for {N-WELL} {SET} Detection},
  journal   = {J. Electronic Testing},
  volume    = {31},
  number    = {4},
  pages     = {395--401},
  year      = {2015},
  url       = {https://doi.org/10.1007/s10836-015-5538-0},
  doi       = {10.1007/s10836-015-5538-0},
  timestamp = {Thu, 16 Jan 2020 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/journals/et/WangLCBLL15.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/LiLWLWNMC15,
  author    = {Lixiang Li and
               Yuanqing Li and
               Haibin Wang and
               Rui Liu and
               Qiong Wu and
               Michael Newton and
               Yuan Ma and
               Li Chen},
  title     = {Simulation and Experimental Evaluation of a Soft Error Tolerant Layout
               for {SRAM} 6T Bitcell in 65nm Technology},
  journal   = {J. Electronic Testing},
  volume    = {31},
  number    = {5-6},
  pages     = {561--568},
  year      = {2015},
  url       = {https://doi.org/10.1007/s10836-015-5549-x},
  doi       = {10.1007/s10836-015-5549-x},
  timestamp = {Sat, 13 Jun 2020 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/journals/et/LiLWLWNMC15.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/LiuEWLCWWF15,
  author    = {Rui Liu and
               Adrian Evans and
               Qiong Wu and
               Yuanqing Li and
               Li Chen and
               Shi{-}Jie Wen and
               Rick Wong and
               Rita Fung},
  title     = {Analysis of advanced circuits for {SET} measurement},
  booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
               CA, USA, April 19-23, 2015},
  pages     = {7},
  publisher = {{IEEE}},
  year      = {2015},
  url       = {https://doi.org/10.1109/IRPS.2015.7112827},
  doi       = {10.1109/IRPS.2015.7112827},
  timestamp = {Thu, 21 Nov 2019 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/conf/irps/LiuEWLCWWF15.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/WangLCLBWWFB14,
  author    = {Haibin Wang and
               Mulong Li and
               Li Chen and
               Rui Liu and
               Sanghyeon Baeg and
               Shi{-}Jie Wen and
               Richard Wong and
               Rita Fung and
               Jinshun Bi},
  title     = {Single Event Resilient Dynamic Logic Designs},
  journal   = {J. Electronic Testing},
  volume    = {30},
  number    = {6},
  pages     = {751--761},
  year      = {2014},
  url       = {https://doi.org/10.1007/s10836-014-5492-2},
  doi       = {10.1007/s10836-014-5492-2},
  timestamp = {Thu, 16 Jan 2020 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/journals/et/WangLCLBWWFB14.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/XieCLEAWW14,
  author    = {Hao Xie and
               Li Chen and
               Rui Liu and
               Adrian Evans and
               Dan Alexandrescu and
               Shi{-}Jie Wen and
               Rick Wong},
  title     = {New approaches for synthesis of redundant combinatorial logic for
               selective fault tolerance},
  booktitle = {2014 {IEEE} 20th International On-Line Testing Symposium, {IOLTS}
               2014, Platja d'Aro, Girona, Spain, July 7-9, 2014},
  pages     = {62--68},
  publisher = {{IEEE}},
  year      = {2014},
  url       = {https://doi.org/10.1109/IOLTS.2014.6873673},
  doi       = {10.1109/IOLTS.2014.6873673},
  timestamp = {Thu, 21 Nov 2019 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/conf/iolts/XieCLEAWW14.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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