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BibTeX records: Wei Li 0023
@inproceedings{DBLP:conf/isvlsi/LiRP05, author = {Wei Li and Sudhakar M. Reddy and Irith Pomeranz}, title = {On Reducing Peak Current and Power during Test}, booktitle = {2005 {IEEE} Computer Society Annual Symposium on {VLSI} {(ISVLSI} 2005), New Frontiers in {VLSI} Design, 11-12 May 2005, Tampa, FL, {USA}}, pages = {156--161}, publisher = {{IEEE} Computer Society}, year = {2005}, url = {https://doi.org/10.1109/ISVLSI.2005.53}, doi = {10.1109/ISVLSI.2005.53}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/isvlsi/LiRP05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vlsid/LiWCR05, author = {Wei Li and Seongmoon Wang and Srimat T. Chakradhar and Sudhakar M. Reddy}, title = {Distance Restricted Scan Chain Reordering to Enhance Delay Fault Coverage}, booktitle = {18th International Conference on {VLSI} Design {(VLSI} Design 2005), with the 4th International Conference on Embedded Systems Design, 3-7 January 2005, Kolkata, India}, pages = {471--478}, publisher = {{IEEE} Computer Society}, year = {2005}, url = {https://doi.org/10.1109/ICVD.2005.83}, doi = {10.1109/ICVD.2005.83}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/vlsid/LiWCR05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dac/LiRP04, author = {Wei Li and Sudhakar M. Reddy and Irith Pomeranz}, editor = {Sharad Malik and Limor Fix and Andrew B. Kahng}, title = {On test generation for transition faults with minimized peak power dissipation}, booktitle = {Proceedings of the 41th Design Automation Conference, {DAC} 2004, San Diego, CA, USA, June 7-11, 2004}, pages = {504--509}, publisher = {{ACM}}, year = {2004}, url = {https://doi.org/10.1145/996566.996706}, doi = {10.1145/996566.996706}, timestamp = {Tue, 06 Nov 2018 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/dac/LiRP04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dac/LiYRP03, author = {Wei Li and Chaowen Yu and Sudhakar M. Reddy and Irith Pomeranz}, title = {A scan {BIST} generation method using a markov source and partial bit-fixing}, booktitle = {Proceedings of the 40th Design Automation Conference, {DAC} 2003, Anaheim, CA, USA, June 2-6, 2003}, pages = {554--559}, publisher = {{ACM}}, year = {2003}, url = {https://doi.org/10.1145/775832.775974}, doi = {10.1145/775832.775974}, timestamp = {Tue, 06 Nov 2018 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/dac/LiYRP03.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/YuLRP03, author = {Chaowen Yu and Wei Li and Sudhakar M. Reddy and Irith Pomeranz}, title = {An Improved Markov Source Design for Scan {BIST}}, booktitle = {9th {IEEE} International On-Line Testing Symposium {(IOLTS} 2003), 7-9 July 2003, Kos Island, Greece}, pages = {106--110}, publisher = {{IEEE} Computer Society}, year = {2003}, url = {https://doi.org/10.1109/OLT.2003.1214375}, doi = {10.1109/OLT.2003.1214375}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/YuLRP03.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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