BibTeX records: Hohyung Lee

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@article{DBLP:journals/mr/NiuWSWLP18,
  author       = {Yuling Niu and
                  Jing Wang and
                  Shuai Shao and
                  Huayan Wang and
                  Hohyung Lee and
                  Seungbae Park},
  title        = {A comprehensive solution for electronic packages' reliability assessment
                  with digital image correlation {(DIC)} method},
  journal      = {Microelectron. Reliab.},
  volume       = {87},
  pages        = {81--88},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.06.006},
  doi          = {10.1016/J.MICROREL.2018.06.006},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/NiuWSWLP18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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