BibTeX records: Rene Krenz-Baath

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@inproceedings{DBLP:conf/date/JutmanLLRJRKKE17,
  author    = {Artur Jutman and
               Christophe Lotz and
               Erik Larsson and
               Matteo Sonza Reorda and
               Maksim Jenihhin and
               Jaan Raik and
               Hans G. Kerkhoff and
               Rene Krenz{-}Baath and
               Piet Engelke},
  editor    = {David Atienza and
               Giorgio Di Natale},
  title     = {{BASTION:} Board and SoC test instrumentation for ageing and no failure
               found},
  booktitle = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition,
               {DATE} 2017, Lausanne, Switzerland, March 27-31, 2017},
  pages     = {115--120},
  publisher = {{IEEE}},
  year      = {2017},
  url       = {https://doi.org/10.23919/DATE.2017.7926968},
  doi       = {10.23919/DATE.2017.7926968},
  timestamp = {Fri, 27 Mar 2020 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/conf/date/JutmanLLRJRKKE17.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/EggersgluBSKD16,
  author    = {Stephan Eggersgl{\"{u}}{\ss} and
               Kenneth Schmitz and
               Rene Krenz{-}Baath and
               Rolf Drechsler},
  title     = {On Optimization-Based {ATPG} and Its Application for Highly Compacted
               Test Sets},
  journal   = {{IEEE} Trans. on {CAD} of Integrated Circuits and Systems},
  volume    = {35},
  number    = {12},
  pages     = {2104--2117},
  year      = {2016},
  url       = {https://doi.org/10.1109/TCAD.2016.2552822},
  doi       = {10.1109/TCAD.2016.2552822},
  timestamp = {Sun, 02 Jun 2019 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/journals/tcad/EggersgluBSKD16.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TsertovJDRLZCMK16,
  author    = {Anton Tsertov and
               Artur Jutman and
               Sergei Devadze and
               Matteo Sonza Reorda and
               Erik Larsson and
               Farrokh Ghani Zadegan and
               Riccardo Cantoro and
               Mehrdad Montazeri and
               Rene Krenz{-}Baath},
  title     = {A suite of {IEEE} 1687 benchmark networks},
  booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
               TX, USA, November 15-17, 2016},
  pages     = {1--10},
  publisher = {{IEEE}},
  year      = {2016},
  url       = {https://doi.org/10.1109/TEST.2016.7805840},
  doi       = {10.1109/TEST.2016.7805840},
  timestamp = {Fri, 27 Mar 2020 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/conf/itc/TsertovJDRLZCMK16.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZadeganKL16,
  author    = {Farrokh Ghani Zadegan and
               Rene Krenz{-}Baath and
               Erik Larsson},
  title     = {Upper-bound computation for optimal retargeting in {IEEE1687} networks},
  booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
               TX, USA, November 15-17, 2016},
  pages     = {1--10},
  publisher = {{IEEE}},
  year      = {2016},
  url       = {https://doi.org/10.1109/TEST.2016.7805838},
  doi       = {10.1109/TEST.2016.7805838},
  timestamp = {Fri, 27 Mar 2020 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/conf/itc/ZadeganKL16.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/sies/ScholerKMO16,
  author    = {Christian Scholer and
               Rene Krenz{-}Baath and
               Ayman Murshed and
               Roman Obermaisser},
  title     = {Computing optimal communication schedules for time-triggered networks
               using an {SMT} solver},
  booktitle = {11th {IEEE} Symposium on Industrial Embedded Systems, {SIES} 2016,
               Krakow, Poland, May 23-25, 2016},
  pages     = {83--91},
  publisher = {{IEEE}},
  year      = {2016},
  url       = {https://doi.org/10.1109/SIES.2016.7509415},
  doi       = {10.1109/SIES.2016.7509415},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/sies/ScholerKMO16.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Krenz-BaathZL15,
  author    = {Rene Krenz{-}Baath and
               Farrokh Ghani Zadegan and
               Erik Larsson},
  title     = {Access time minimization in {IEEE} 1687 networks},
  booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
               USA, October 6-8, 2015},
  pages     = {1--10},
  publisher = {{IEEE}},
  year      = {2015},
  url       = {https://doi.org/10.1109/TEST.2015.7342408},
  doi       = {10.1109/TEST.2015.7342408},
  timestamp = {Fri, 27 Mar 2020 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/conf/itc/Krenz-BaathZL15.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/sies/ScholerKMO15,
  author    = {Christian Scholer and
               Rene Krenz{-}Baath and
               Ayman Murshed and
               Roman Obermaisser},
  title     = {Optimal SAT-based scheduler for time-triggered networks-on-a-chip},
  booktitle = {10th {IEEE} International Symposium on Industrial Embedded Systems,
               {SIES} 2015, Siegen, Germany, June 8-10, 2015},
  pages     = {156--161},
  publisher = {{IEEE}},
  year      = {2015},
  url       = {https://doi.org/10.1109/SIES.2015.7185054},
  doi       = {10.1109/SIES.2015.7185054},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/sies/ScholerKMO15.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZadeganLJDK14,
  author    = {Farrokh Ghani Zadegan and
               Erik Larsson and
               Artur Jutman and
               Sergei Devadze and
               Rene Krenz{-}Baath},
  title     = {Design, Verification, and Application of {IEEE} 1687},
  booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
               16-19, 2014},
  pages     = {93--100},
  publisher = {{IEEE} Computer Society},
  year      = {2014},
  url       = {https://doi.org/10.1109/ATS.2014.28},
  doi       = {10.1109/ATS.2014.28},
  timestamp = {Fri, 27 Mar 2020 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/conf/ats/ZadeganLJDK14.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/EggersglussSKD14,
  author    = {Stephan Eggersgl{\"{u}}{\ss} and
               Kenneth Schmitz and
               Rene Krenz{-}Baath and
               Rolf Drechsler},
  editor    = {Giorgio Di Natale},
  title     = {Optimization-based multiple target test generation for highly compacted
               test sets},
  booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
               May 26-30, 2014},
  pages     = {1--6},
  publisher = {{IEEE}},
  year      = {2014},
  url       = {https://doi.org/10.1109/ETS.2014.6847807},
  doi       = {10.1109/ETS.2014.6847807},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/ets/EggersglussSKD14.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/Krenz-BaathGH13,
  author    = {Rene Krenz{-}Baath and
               Andreas Glowatz and
               Friedrich Hapke},
  editor    = {Luk{\'{a}}s Sekanina and
               G{\"{o}}rschwin Fey and
               Jaan Raik and
               Snorre Aunet and
               Richard Ruzicka},
  title     = {Fault collapsing of multi-conditional faults},
  booktitle = {16th {IEEE} International Symposium on Design and Diagnostics of Electronic
               Circuits {\&} Systems, {DDECS} 2013, Karlovy Vary, Czech Republic,
               April 8-10, 2013},
  pages     = {42--47},
  publisher = {{IEEE} Computer Society},
  year      = {2013},
  url       = {https://doi.org/10.1109/DDECS.2013.6549786},
  doi       = {10.1109/DDECS.2013.6549786},
  timestamp = {Wed, 16 Oct 2019 14:14:50 +0200},
  biburl    = {https://dblp.org/rec/conf/ddecs/Krenz-BaathGH13.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/KeimWMHK13,
  author    = {Martin Keim and
               Tom Waayers and
               Richard Morren and
               Friedrich Hapke and
               Rene Krenz{-}Baath},
  title     = {Industrial Application of {IEEE} {P1687} for an Automotive Product},
  booktitle = {2013 Euromicro Conference on Digital System Design, {DSD} 2013, Los
               Alamitos, CA, USA, September 4-6, 2013},
  pages     = {453--461},
  publisher = {{IEEE} Computer Society},
  year      = {2013},
  url       = {https://doi.org/10.1109/DSD.2013.57},
  doi       = {10.1109/DSD.2013.57},
  timestamp = {Wed, 16 Oct 2019 14:14:57 +0200},
  biburl    = {https://dblp.org/rec/conf/dsd/KeimWMHK13.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/EggersglussKGHD12,
  author    = {Stephan Eggersgl{\"{u}}{\ss} and
               Rene Krenz{-}Baath and
               Andreas Glowatz and
               Friedrich Hapke and
               Rolf Drechsler},
  editor    = {Jaan Raik and
               Viera Stopjakov{\'{a}} and
               Heinrich Theodor Vierhaus and
               Witold A. Pleskacz and
               Raimund Ubar and
               Helena Kruus and
               Maksim Jenihhin},
  title     = {A new SAT-based {ATPG} for generating highly compacted test sets},
  booktitle = {{IEEE} 15th International Symposium on Design and Diagnostics of Electronic
               Circuits {\&} Systems, {DDECS} 2012, Tallinn, Estonia, April 18-20,
               2012},
  pages     = {230--235},
  publisher = {{IEEE}},
  year      = {2012},
  url       = {https://doi.org/10.1109/DDECS.2012.6219063},
  doi       = {10.1109/DDECS.2012.6219063},
  timestamp = {Wed, 16 Oct 2019 14:14:50 +0200},
  biburl    = {https://dblp.org/rec/conf/ddecs/EggersglussKGHD12.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/Krenz-BaathHHMRG12,
  author    = {Rene Krenz{-}Baath and
               Friedrich Hapke and
               Rolf Hinze and
               Reinhard Meier and
               Maija Ryynaenen and
               Andreas Glowatz},
  title     = {Robust Evaluation of Weighted Random Logic {BIST} Structures in Industrial
               Designs},
  booktitle = {15th Euromicro Conference on Digital System Design, {DSD} 2012, Cesme,
               Izmir, Turkey, September 5-8, 2012},
  pages     = {823--829},
  publisher = {{IEEE} Computer Society},
  year      = {2012},
  url       = {https://doi.org/10.1109/DSD.2012.115},
  doi       = {10.1109/DSD.2012.115},
  timestamp = {Wed, 16 Oct 2019 14:14:57 +0200},
  biburl    = {https://dblp.org/rec/conf/dsd/Krenz-BaathHHMRG12.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/TilleEKSD10,
  author    = {Daniel Tille and
               Stephan Eggersgl{\"{u}}{\ss} and
               Rene Krenz{-}Baath and
               J{\"{u}}rgen Schl{\"{o}}ffel and
               Rolf Drechsler},
  title     = {Improving {CNF} representations in SAT-based {ATPG} for industrial
               circuits using BDDs},
  booktitle = {15th European Test Symposium, {ETS} 2010, Prague, Czech Republic,
               May 24-28, 2010},
  pages     = {176--181},
  publisher = {{IEEE} Computer Society},
  year      = {2010},
  url       = {https://doi.org/10.1109/ETSYM.2010.5512763},
  doi       = {10.1109/ETSYM.2010.5512763},
  timestamp = {Tue, 28 Apr 2020 11:43:44 +0200},
  biburl    = {https://dblp.org/rec/conf/ets/TilleEKSD10.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HapkeRSKGWHE10,
  author    = {Friedrich Hapke and
               Wilfried Redemund and
               J{\"{u}}rgen Schl{\"{o}}ffel and
               Rene Krenz{-}Baath and
               Andreas Glowatz and
               Michael Wittke and
               Hamidreza Hashempour and
               Stefan Eichenberger},
  editor    = {Ron Press and
               Erik H. Volkerink},
  title     = {Defect-oriented cell-internal testing},
  booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
               USA, November 2-4, 2010},
  pages     = {285--294},
  publisher = {{IEEE} Computer Society},
  year      = {2010},
  url       = {https://doi.org/10.1109/TEST.2010.5699229},
  doi       = {10.1109/TEST.2010.5699229},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/conf/itc/HapkeRSKGWHE10.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HapkeKGSHEHA09,
  author    = {Friedrich Hapke and
               Rene Krenz{-}Baath and
               Andreas Glowatz and
               J{\"{u}}rgen Schl{\"{o}}ffel and
               Hamidreza Hashempour and
               Stefan Eichenberger and
               Camelia Hora and
               Dan Adolfsson},
  editor    = {Gordon W. Roberts and
               Bill Eklow},
  title     = {Defect-oriented cell-aware {ATPG} and fault simulation for industrial
               cell libraries and designs},
  booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
               USA, November 1-6, 2009},
  pages     = {1--10},
  publisher = {{IEEE} Computer Society},
  year      = {2009},
  url       = {https://doi.org/10.1109/TEST.2009.5355741},
  doi       = {10.1109/TEST.2009.5355741},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/conf/itc/HapkeKGSHEHA09.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/Krenz-BaathGS07,
  author    = {Rene Krenz{-}Baath and
               Andreas Glowatz and
               J{\"{u}}rgen Schl{\"{o}}ffel},
  title     = {Computation and Application of Absolute Dominators in Industrial Designs},
  booktitle = {12th European Test Symposium, {ETS} 2007, Freiburg, Germany, May 20,
               2007},
  pages     = {137--144},
  publisher = {{IEEE} Computer Society},
  year      = {2007},
  url       = {https://doi.org/10.1109/ETS.2007.15},
  doi       = {10.1109/ETS.2007.15},
  timestamp = {Tue, 28 Apr 2020 11:43:44 +0200},
  biburl    = {https://dblp.org/rec/conf/ets/Krenz-BaathGS07.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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