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BibTeX records: Dominik Kasprowicz
@article{DBLP:journals/tcad/Kasprowicz19, author = {Dominik Kasprowicz}, title = {Table-Based Model of a Dual-Gate Transistor for Statistical Circuit Simulation}, journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.}, volume = {38}, number = {8}, pages = {1493--1500}, year = {2019}, url = {https://doi.org/10.1109/TCAD.2018.2852756}, doi = {10.1109/TCAD.2018.2852756}, timestamp = {Thu, 24 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/tcad/Kasprowicz19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/mixdes/Kasprowicz19, author = {Dominik Kasprowicz}, editor = {Andrzej Napieralksi}, title = {Semiconductor Device Parameter Extraction Based on {I-V} Measurements and Simulation}, booktitle = {26th International Conference on Mixed Design of Integrated Circuits and Systems, {MIXDES} 2019, Rzesz{\'{o}}w, Poland, June 27-29, 2019}, pages = {321--326}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.23919/MIXDES.2019.8787195}, doi = {10.23919/MIXDES.2019.8787195}, timestamp = {Sat, 05 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/mixdes/Kasprowicz19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/mixdes/Kasprowicz17, author = {Dominik Kasprowicz}, title = {Variability-aware table-based {DC} model of a dual-gate transistor}, booktitle = {24th International Conference Mixed Design of Integrated Circuits and Systems, {MIXDES} 2017, Bydgoszcz, Poland, June 22-24, 2017}, pages = {154--158}, publisher = {{IEEE}}, year = {2017}, url = {https://doi.org/10.23919/MIXDES.2017.8005173}, doi = {10.23919/MIXDES.2017.8005173}, timestamp = {Wed, 16 Oct 2019 14:14:55 +0200}, biburl = {https://dblp.org/rec/conf/mixdes/Kasprowicz17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/mixdes/Kasprowicz15, author = {Dominik Kasprowicz}, title = {Channel charge model of a dual-gate junctionless transistor}, booktitle = {22nd International Conference Mixed Design of Integrated Circuits {\&} Systems, {MIXDES} 2015, Torun, Poland, June 25-27, 2015}, pages = {216--221}, publisher = {{IEEE}}, year = {2015}, url = {https://doi.org/10.1109/MIXDES.2015.7208513}, doi = {10.1109/MIXDES.2015.7208513}, timestamp = {Wed, 16 Oct 2019 14:14:55 +0200}, biburl = {https://dblp.org/rec/conf/mixdes/Kasprowicz15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mj/KasprowiczW14, author = {Dominik Kasprowicz and Hilekaan Wada}, title = {Methods for automated detection of plagiarism in integrated-circuit layouts}, journal = {Microelectron. J.}, volume = {45}, number = {9}, pages = {1212--1219}, year = {2014}, url = {https://doi.org/10.1016/j.mejo.2014.04.023}, doi = {10.1016/J.MEJO.2014.04.023}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mj/KasprowiczW14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ddecs/KasprowiczS13, author = {Dominik Kasprowicz and Bartosz Swacha}, editor = {Luk{\'{a}}s Sekanina and G{\"{o}}rschwin Fey and Jaan Raik and Snorre Aunet and Richard Ruzicka}, title = {VeSFET as an analog-circuit component}, booktitle = {16th {IEEE} International Symposium on Design and Diagnostics of Electronic Circuits {\&} Systems, {DDECS} 2013, Karlovy Vary, Czech Republic, April 8-10, 2013}, pages = {199--204}, publisher = {{IEEE} Computer Society}, year = {2013}, url = {https://doi.org/10.1109/DDECS.2013.6549816}, doi = {10.1109/DDECS.2013.6549816}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ddecs/KasprowiczS13.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/mixdes/KasprowiczW13, author = {Dominik Kasprowicz and Hilekaan Wada}, title = {Computer-aided detection of plagiarism in integrated-circuit layouts}, booktitle = {Proceedings of the 20th International Conference Mixed Design of Integrated Circuits and Systems - {MIXDES} 2013, Gdynia, Poland, June 20-22, 2013}, pages = {213--217}, publisher = {{IEEE}}, year = {2013}, url = {https://ieeexplore.ieee.org/xpl/freeabs\_all.jsp?arnumber=6613343}, timestamp = {Wed, 11 Aug 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/mixdes/KasprowiczW13.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iscas/WeisPKEMS09, author = {Marcus Weis and Andrzej Pfitzner and Dominik Kasprowicz and Rainer Emling and Wojciech Maly and Doris Schmitt{-}Landsiedel}, title = {Adder Circuits with Transistors using Independently Controlled Gates}, booktitle = {International Symposium on Circuits and Systems {(ISCAS} 2009), 24-17 May 2009, Taipei, Taiwan}, pages = {449--452}, publisher = {{IEEE}}, year = {2009}, url = {https://doi.org/10.1109/ISCAS.2009.5117782}, doi = {10.1109/ISCAS.2009.5117782}, timestamp = {Wed, 16 Oct 2019 14:14:49 +0200}, biburl = {https://dblp.org/rec/conf/iscas/WeisPKEMS09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iccd/LinMMPK08, author = {Yi{-}Wei Lin and Malgorzata Marek{-}Sadowska and Wojciech Maly and Andrzej Pfitzner and Dominik Kasprowicz}, title = {Is there always performance overhead for regular fabric?}, booktitle = {26th International Conference on Computer Design, {ICCD} 2008, 12-15 October 2008, Lake Tahoe, CA, USA, Proceedings}, pages = {557--562}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/ICCD.2008.4751916}, doi = {10.1109/ICCD.2008.4751916}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iccd/LinMMPK08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KasprowiczP03, author = {Dominik Kasprowicz and Witold A. Pleskacz}, title = {Improvement of integrated circuit testing reliability by using the defect based approach}, journal = {Microelectron. Reliab.}, volume = {43}, number = {6}, pages = {945--953}, year = {2003}, url = {https://doi.org/10.1016/S0026-2714(03)00092-1}, doi = {10.1016/S0026-2714(03)00092-1}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/KasprowiczP03.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dft/PleskaczKOK01, author = {Witold A. Pleskacz and Dominik Kasprowicz and Tomasz Oleszczak and Wieslaw Kuzmicz}, title = {{CMOS} Standard Cells Characterization for Defect Based Testing}, booktitle = {16th {IEEE} International Symposium on Defect and Fault-Tolerance in {VLSI} Systems {(DFT} 2001), 24-26 October 2001, San Francisco, CA, USA, Proceedings}, pages = {384}, publisher = {{IEEE} Computer Society}, year = {2001}, url = {https://doi.org/10.1109/DFTVS.2001.966792}, doi = {10.1109/DFTVS.2001.966792}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/dft/PleskaczKOK01.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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