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ORCIDBibTeX records: Jae-Seong Jeong
@article{DBLP:journals/mr/JeongLLC17,
author = {Jae{-}Seong Jeong and
Won{-}kyoung Lee and
Chung{-}kuk Lee and
Joongho Choi},
title = {Lifetime and failure analysis of perovskite-based ceramic {NTC} thermistors
by thermal cycling and abrasion combined stress},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {112--116},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.07.080},
doi = {10.1016/J.MICROREL.2017.07.080},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JeongLLC17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JeongKPKC16,
author = {Jae{-}Seong Jeong and
Yong{-}Hyun Kim and
Chang{-}kyun Park and
Heon{-}Do Kim and
Joongho Choi},
title = {Effect of H/Ar treatment on ZnO: {B} transparent conducting oxide
for flexible a-Si: H/{\(\mu\)}c-Si: {H} photovoltaic modules under
damp heat stress},
journal = {Microelectron. Reliab.},
volume = {64},
pages = {640--645},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.07.135},
doi = {10.1016/J.MICROREL.2016.07.135},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JeongKPKC16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JeongKPKC15,
author = {Jae{-}Seong Jeong and
Yong{-}Hyun Kim and
Chang{-}kyun Park and
Heon{-}Do Kim and
Joongho Choi},
title = {The degradation mechanism of flexible a-Si: H/{\(\mu\)}c-Si: {H} photovoltaic
modules},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1804--1810},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.151},
doi = {10.1016/J.MICROREL.2015.06.151},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JeongKPKC15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ParkJH14,
author = {Nochang Park and
Jae{-}Seong Jeong and
Changwoon Han},
title = {Estimation of the degradation rate of multi-crystalline silicon photovoltaic
module under thermal cycling stress},
journal = {Microelectron. Reliab.},
volume = {54},
number = {8},
pages = {1562--1566},
year = {2014},
url = {https://doi.org/10.1016/j.microrel.2014.03.021},
doi = {10.1016/J.MICROREL.2014.03.021},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ParkJH14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Jeong13,
author = {Jae{-}Seong Jeong},
title = {Field failure mechanism and reproduction due to moisture for low-voltage
ZnO varistors},
journal = {Microelectron. Reliab.},
volume = {53},
number = {9-11},
pages = {1632--1637},
year = {2013},
url = {https://doi.org/10.1016/j.microrel.2013.07.080},
doi = {10.1016/J.MICROREL.2013.07.080},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Jeong13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Jeong12,
author = {Jae{-}Seong Jeong},
title = {Failure mechanism and reliability test method for {USB} interface
circuitry on CPUs for mobile devices},
journal = {Microelectron. Reliab.},
volume = {52},
number = {9-10},
pages = {2014--2018},
year = {2012},
url = {https://doi.org/10.1016/j.microrel.2012.07.017},
doi = {10.1016/J.MICROREL.2012.07.017},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Jeong12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JeongPH12,
author = {Jae{-}Seong Jeong and
Nochang Park and
Changwoon Han},
title = {Field failure mechanism study of solder interconnection for crystalline
silicon photovoltaic module},
journal = {Microelectron. Reliab.},
volume = {52},
number = {9-10},
pages = {2326--2330},
year = {2012},
url = {https://doi.org/10.1016/j.microrel.2012.06.027},
doi = {10.1016/J.MICROREL.2012.06.027},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JeongPH12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JeongK10,
author = {Jae{-}Seong Jeong and
Young Jeon Kim},
title = {Failure mechanism of {COF} based Line Driver {IC} for Flat Panel Display
by contamination},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1488--1493},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.063},
doi = {10.1016/J.MICROREL.2010.07.063},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JeongK10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iceis/JeongK10,
author = {Jae{-}Seong Jeong and
Soon Ghon Kim},
editor = {Joaquim Filipe and
Jos{\'{e}} Cordeiro},
title = {An Efficient Method for Game Development using Compiler},
booktitle = {{ICEIS} 2010 - Proceedings of the 12th International Conference on
Enterprise Information Systems, Volume 3, ISAS, Funchal, Madeira,
Portugal, June 8 - 12, 2010},
pages = {447--450},
publisher = {SciTePress},
year = {2010},
timestamp = {Tue, 04 Jan 2011 08:32:08 +0100},
biburl = {https://dblp.org/rec/conf/iceis/JeongK10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JeongP09,
author = {Jae{-}Seong Jeong and
Sang{-}Deuk Park},
title = {Failure analysis of video processor defined as No Fault Found {(NFF):}
Reproduction in system level and advanced analysis technique in {IC}
level},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1153--1157},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.049},
doi = {10.1016/J.MICROREL.2009.07.049},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JeongP09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JeongJP08,
author = {Jae{-}Seong Jeong and
Jin{-}Kyu Jung and
Sang{-}Deuk Park},
title = {Reliability improvement of InGaN {LED} backlight module by accelerated
life test {(ALT)} and screen policy of potential leakage {LED}},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1216--1220},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.029},
doi = {10.1016/J.MICROREL.2008.07.029},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JeongJP08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JeongHP07,
author = {Jae{-}Seong Jeong and
Soon{-}Ha Hong and
Sang{-}Deuk Park},
title = {Field failure mechanism and improvement of {EOS} failure of integrated
{IGBT} inverter modules},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1795--1799},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.087},
doi = {10.1016/J.MICROREL.2007.07.087},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JeongHP07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JeongLHP05,
author = {Jae{-}Seong Jeong and
Jae{-}Hyun Lee and
Jong{-}Shin Ha and
Sang{-}Deuk Park},
title = {Stress Mechanism about Field Lightning Surge of High Voltage {BJT}
Based Line Driver for {ADSL} System},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1398--1401},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.052},
doi = {10.1016/J.MICROREL.2005.07.052},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JeongLHP05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JeongHP04,
author = {Jae{-}Seong Jeong and
Jong{-}Shin Ha and
Sang{-}Deuk Park},
title = {Field Failure Mechanism Investigation of GaAs based {HBT} Power Amplifier
Mmodule {(PAM)}},
journal = {Microelectron. Reliab.},
volume = {44},
number = {9-11},
pages = {1393--1398},
year = {2004},
url = {https://doi.org/10.1016/j.microrel.2004.07.022},
doi = {10.1016/J.MICROREL.2004.07.022},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JeongHP04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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