BibTeX records: D. Iyer

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@article{DBLP:journals/mr/AmsterRYIM18,
  author       = {Oskar Amster and
                  K. A. Rubin and
                  Y. Yang and
                  D. Iyer and
                  Arron Messinger},
  title        = {Application of Scanning Microwave Microscopy nano-C-V to investigate
                  dopant defect under a poly gate device},
  journal      = {Microelectron. Reliab.},
  volume       = {88-90},
  pages        = {250--254},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.06.106},
  doi          = {10.1016/J.MICROREL.2018.06.106},
  timestamp    = {Fri, 04 Jun 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/AmsterRYIM18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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