BibTeX records: Y. Iyama

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@inproceedings{DBLP:conf/vts/ImamiyaMOTI92,
  author       = {K. Imamiya and
                  J. Miyamoto and
                  N. Ohtuska and
                  N. Tomita and
                  Y. Iyama},
  title        = {Optimum redundancy design for new-generation EPROMs based on yield
                  analysis of previous generation},
  booktitle    = {10th {IEEE} {VLSI} Test Symposium (VTS'92), 7-9 Apr 1992, Atlantic
                  City, NJ, {USA}},
  pages        = {182--187},
  publisher    = {{IEEE} Computer Society},
  year         = {1992},
  url          = {https://doi.org/10.1109/VTEST.1992.232746},
  doi          = {10.1109/VTEST.1992.232746},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/ImamiyaMOTI92.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/MiyamotoOITI91,
  author       = {J. Miyamoto and
                  N. Ohtsuka and
                  K. Imamiya and
                  N. Tomita and
                  Y. Iyama},
  title        = {Multi-Step Stress Test for Yield Improvement of 16Mbit EPROMs with
                  Redundancy Scheme},
  booktitle    = {Proceedings {IEEE} International Test Conference 1991, Test: Faster,
                  Better, Sooner, Nashville, TN, USA, October 26-30, 1991},
  pages        = {540--547},
  publisher    = {{IEEE} Computer Society},
  year         = {1991},
  url          = {https://doi.org/10.1109/TEST.1991.519716},
  doi          = {10.1109/TEST.1991.519716},
  timestamp    = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/MiyamotoOITI91.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}