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BibTeX records: Emre Ilgünsatiroglu
@article{DBLP:journals/mr/CiappaII14, author = {Mauro Ciappa and Alexey Yu. Illarionov and Emre Ilg{\"{u}}nsatiroglu}, title = {Exact 3D simulation of Scanning Electron Microscopy images of semiconductor devices in the presence of electric and magnetic fields}, journal = {Microelectron. Reliab.}, volume = {54}, number = {9-10}, pages = {2081--2087}, year = {2014}, url = {https://doi.org/10.1016/j.microrel.2014.07.033}, doi = {10.1016/J.MICROREL.2014.07.033}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/CiappaII14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/CiappaII14a, author = {Mauro Ciappa and Emre Ilg{\"{u}}nsatiroglu and Alexey Yu. Illarionov}, title = {Exploring the limits of scanning electron microscopy for the metrology of critical dimensions of photoresist structures in the nanometer range}, journal = {Microelectron. Reliab.}, volume = {54}, number = {9-10}, pages = {2123--2127}, year = {2014}, url = {https://doi.org/10.1016/j.microrel.2014.07.041}, doi = {10.1016/J.MICROREL.2014.07.041}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/CiappaII14a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/essderc/CiappaIIFS14, author = {Mauro Ciappa and Emre Ilg{\"{u}}nsatiroglu and Alexey Yu. Illarionov and F. Filosomi and C. Santini}, title = {Monte Carlo modeling of the extraction of roughness parameters at nanometer scale by Critical Dimension Scanning Electron Microscopy}, booktitle = {44th European Solid State Device Research Conference, {ESSDERC} 2014, Venice Lido, Italy, September 22-26, 2014}, pages = {357--360}, publisher = {{IEEE}}, year = {2014}, url = {https://doi.org/10.1109/ESSDERC.2014.6948834}, doi = {10.1109/ESSDERC.2014.6948834}, timestamp = {Wed, 16 Oct 2019 14:14:50 +0200}, biburl = {https://dblp.org/rec/conf/essderc/CiappaIIFS14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/IlgunsatirogluIC13, author = {Emre Ilg{\"{u}}nsatiroglu and Alexey Yu. Illarionov and Mauro Ciappa}, title = {Unstructured tetrahedric meshes for the description of complex three-dimensional sample geometries in Monte Carlo simulation of scanning electron microscopy images for metrology applications}, journal = {Microelectron. Reliab.}, volume = {53}, number = {9-11}, pages = {1381--1386}, year = {2013}, url = {https://doi.org/10.1016/j.microrel.2013.07.131}, doi = {10.1016/J.MICROREL.2013.07.131}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/IlgunsatirogluIC13.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/CiappaII12, author = {Mauro Ciappa and Emre Ilg{\"{u}}nsatiroglu and Alexey Yu. Illarionov}, title = {Monte Carlo simulation of emission site, angular and energy distributions of secondary electrons in silicon at low beam energies}, journal = {Microelectron. Reliab.}, volume = {52}, number = {9-10}, pages = {2139--2143}, year = {2012}, url = {https://doi.org/10.1016/j.microrel.2012.06.091}, doi = {10.1016/J.MICROREL.2012.06.091}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/CiappaII12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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