BibTeX records: Thomas Hladschik

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@article{DBLP:journals/et/VollrathLH01,
  author       = {J{\"{o}}rg E. Vollrath and
                  Ulf Lederer and
                  Thomas Hladschik},
  title        = {Compressed Bit Fail Maps for Memory Fail Pattern Classification},
  journal      = {J. Electron. Test.},
  volume       = {17},
  number       = {3-4},
  pages        = {291--297},
  year         = {2001},
  url          = {https://doi.org/10.1023/A:1012271530348},
  doi          = {10.1023/A:1012271530348},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/VollrathLH01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/VollrathLH00,
  author       = {J{\"{o}}rg E. Vollrath and
                  Ulf Lederer and
                  Thomas Hladschik},
  title        = {Compressed bit fail maps for memory fail pattern classification},
  booktitle    = {5th European Test Workshop, {ETW} 2000, Cascais, Portugal, May 23-26,
                  2000},
  pages        = {125--130},
  publisher    = {{IEEE} Computer Society},
  year         = {2000},
  url          = {https://doi.org/10.1109/ETW.2000.873789},
  doi          = {10.1109/ETW.2000.873789},
  timestamp    = {Tue, 28 Apr 2020 13:03:46 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/VollrathLH00.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}