BibTeX records: Gaspard Hiblot

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Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
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@inproceedings{DBLP:conf/essderc/HiblotRLRFFSBWLCK23,
  author       = {Gaspard Hiblot and
                  Taras Ravsher and
                  Roger Loo and
                  Bhuvaneshwari Yengula Venkata Ramana and
                  Nathali Franchina{-}Vergel and
                  Andrea Fantini and
                  Shamin Houshmand Sharifi and
                  Nina Bazzazian and
                  Kurt Wostyn and
                  Loris Angelo Labbate and
                  Sebastien Couet and
                  Gouri Sankar Kar},
  title        = {{NPN} Si/SiGe memory selector with non-linearity{\textgreater}10\({}^{\mbox{5}}\)
                  and ON-current{\textgreater}6MA/cm\({}^{\mbox{2}}\)},
  booktitle    = {53rd {IEEE} European Solid-State Device Research Conference, {ESSDERC}
                  2023, Lisbon, Portugal, September 11-14, 2023},
  pages        = {164--167},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/ESSDERC59256.2023.10268470},
  doi          = {10.1109/ESSDERC59256.2023.10268470},
  timestamp    = {Sun, 12 Nov 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/essderc/HiblotRLRFFSBWLCK23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/irps/MishraVVBLAOBZHPWHMCR23,
  author       = {Subrat Mishra and
                  Sankatali Venkateswarlu and
                  Bjorn Vermeersch and
                  Moritz Brunion and
                  Melina Lofrano and
                  Dawit Burusie Abdi and
                  Herman Oprins and
                  Dwaipayan Biswas and
                  Odysseas Zografos and
                  Gaspard Hiblot and
                  Geert Van der Plas and
                  Pieter Weckx and
                  Geert Hellings and
                  James Myers and
                  Francky Catthoor and
                  Julien Ryckaert},
  title        = {Towards Chip-Package-System Co-optimization of Thermally-limited System-On-Chips
                  (SOCs)},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2023, Monterey,
                  CA, USA, March 26-30, 2023},
  pages        = {1--7},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/IRPS48203.2023.10117979},
  doi          = {10.1109/IRPS48203.2023.10117979},
  timestamp    = {Mon, 05 Feb 2024 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/irps/MishraVVBLAOBZHPWHMCR23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vlsit/YangSBXVCMHHR23,
  author       = {S. Yang and
                  Pieter Schuddinck and
                  Marie Garcia Bardon and
                  Yang Xiang and
                  Anabela Veloso and
                  B. T. Chan and
                  Gioele Mirabelli and
                  Gaspard Hiblot and
                  Geert Hellings and
                  Julien Ryckaert},
  title        = {{PPA} and Scaling Potential of Backside Power Options in {N2} and
                  {A14} Nanosheet Technology},
  booktitle    = {2023 {IEEE} Symposium on {VLSI} Technology and Circuits {(VLSI} Technology
                  and Circuits), Kyoto, Japan, June 11-16, 2023},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185302},
  doi          = {10.23919/VLSITECHNOLOGYANDCIR57934.2023.10185302},
  timestamp    = {Fri, 28 Jul 2023 10:40:41 +0200},
  biburl       = {https://dblp.org/rec/conf/vlsit/YangSBXVCMHHR23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vlsit/VelosoJRCAOASKH22,
  author       = {Anabela Veloso and
                  Anne Jourdain and
                  D. Radisic and
                  Rongmei Chen and
                  G. Arutchelvan and
                  B. O'Sullivan and
                  Hiroaki Arimura and
                  Michele Stucchi and
                  An De Keersgieter and
                  M. Hosseini and
                  T. Hopf and
                  K. D'Have and
                  S. Wang and
                  E. Dupuy and
                  G. Mannaert and
                  Kevin Vandersmissen and
                  S. Iacovo and
                  P. Marien and
                  S. Choudhury and
                  F. Schleicher and
                  F. Sebaai and
                  Y. Oniki and
                  X. Zhou and
                  A. Gupta and
                  Tom Schram and
                  B. Briggs and
                  C. Lorant and
                  E. Rosseel and
                  Andriy Hikavyy and
                  Roger Loo and
                  J. Geypen and
                  D. Batuk and
                  G. T. Martinez and
                  J. P. Soulie and
                  Katia Devriendt and
                  B. T. Chan and
                  S. Demuynck and
                  Gaspard Hiblot and
                  Geert Van der Plas and
                  Julien Ryckaert and
                  Gerald Beyer and
                  E. Dentoni Litta and
                  Eric Beyne and
                  Naoto Horiguchi},
  title        = {Scaled FinFETs Connected by Using Both Wafer Sides for Routing via
                  Buried Power Rails},
  booktitle    = {{IEEE} Symposium on {VLSI} Technology and Circuits {(VLSI} Technology
                  and Circuits 2022), Honolulu, HI, USA, June 12-17, 2022},
  pages        = {284--285},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/VLSITechnologyandCir46769.2022.9830177},
  doi          = {10.1109/VLSITECHNOLOGYANDCIR46769.2022.9830177},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/vlsit/VelosoJRCAOASKH22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/irps/HiblotRTDCSBDK21,
  author       = {Gaspard Hiblot and
                  Nouredine Rassoul and
                  Lieve Teugels and
                  Katia Devriendt and
                  Adrian Vaisman Chasin and
                  Michiel van Setten and
                  Attilio Belmonte and
                  Romain Delhougne and
                  Gouri Sankar Kar},
  title        = {Process-induced charging damage in {IGZO} nTFTs},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
                  CA, USA, March 21-25, 2021},
  pages        = {1--8},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/IRPS46558.2021.9405201},
  doi          = {10.1109/IRPS46558.2021.9405201},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/HiblotRTDCSBDK21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/irps/HiblotLHP19,
  author       = {Gaspard Hiblot and
                  Yefan Liu and
                  Geert Hellings and
                  Geert Van der Plas},
  title        = {Comparative Analysis of the Degradation Mechanisms in Logic and {I/O}
                  FinFET Devices Induced by Plasma Damage},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
                  CA, USA, March 31 - April 4, 2019},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/IRPS.2019.8720525},
  doi          = {10.1109/IRPS.2019.8720525},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/HiblotLHP19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/irps/LiuYHKSHVW19,
  author       = {Yefan Liu and
                  Hao Yu and
                  Gaspard Hiblot and
                  Anastasiia Kruv and
                  Marc Schaekers and
                  Naoto Horiguchi and
                  Dimitrios Velenis and
                  Ingrid De Wolf},
  title        = {Study of the Mechanical Stress Impact on Silicide Contact Resistance
                  by 4-Point Bending},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
                  CA, USA, March 31 - April 4, 2019},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/IRPS.2019.8720416},
  doi          = {10.1109/IRPS.2019.8720416},
  timestamp    = {Fri, 31 May 2019 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/LiuYHKSHVW19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/essderc/HiblotRGGB15,
  author       = {Gaspard Hiblot and
                  Quentin Rafhay and
                  Loic Gaben and
                  G{\'{e}}rard Ghibaudo and
                  Fr{\'{e}}d{\'{e}}ric Boeuf},
  title        = {Optimization of Trigate-On-Insulator {MOSFET} aspect ratio with {MASTAR}},
  booktitle    = {45th European Solid State Device Research Conference, {ESSDERC} 2015,
                  Graz, Austria, September 14-18, 2015},
  pages        = {242--245},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/ESSDERC.2015.7324759},
  doi          = {10.1109/ESSDERC.2015.7324759},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/essderc/HiblotRGGB15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/newcas/HiblotRBG15,
  author       = {Gaspard Hiblot and
                  Quentin Rafhay and
                  Fr{\'{e}}d{\'{e}}ric Boeuf and
                  G{\'{e}}rard Ghibaudo},
  title        = {Impact of short-channel effects on velocity overshoot in {MOSFET}},
  booktitle    = {{IEEE} 13th International New Circuits and Systems Conference, {NEWCAS}
                  2015, Grenoble, France, June 7-10, 2015},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/NEWCAS.2015.7182061},
  doi          = {10.1109/NEWCAS.2015.7182061},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/newcas/HiblotRBG15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/essderc/HiblotRBG14,
  author       = {Gaspard Hiblot and
                  Quentin Rafhay and
                  Fr{\'{e}}d{\'{e}}ric Boeuf and
                  G{\'{e}}rard Ghibaudo},
  title        = {Impact of quantum modulation of the inversion charge in the {MOSFET}
                  subthreshold regime},
  booktitle    = {44th European Solid State Device Research Conference, {ESSDERC} 2014,
                  Venice Lido, Italy, September 22-26, 2014},
  pages        = {286--289},
  publisher    = {{IEEE}},
  year         = {2014},
  url          = {https://doi.org/10.1109/ESSDERC.2014.6948816},
  doi          = {10.1109/ESSDERC.2014.6948816},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/essderc/HiblotRBG14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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