BibTeX records: Robert Daasch

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@inproceedings{DBLP:conf/vts/VelamatiD09,
  author    = {Naveen Velamati and
               Robert Daasch},
  title     = {Analytical Model for Multi-site Efficiency with Parallel to Serial
               Test Times, Yield and Clustering},
  booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
               Cruz, California, {USA}},
  pages     = {270--275},
  year      = {2009},
  crossref  = {DBLP:conf/vts/2009},
  url       = {https://doi.org/10.1109/VTS.2009.42},
  doi       = {10.1109/VTS.2009.42},
  timestamp = {Thu, 25 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vts/VelamatiD09},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/vts/2009,
  title     = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
               Cruz, California, {USA}},
  publisher = {{IEEE} Computer Society},
  year      = {2009},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5116585},
  isbn      = {978-0-7695-3598-2},
  timestamp = {Wed, 05 Nov 2014 16:44:48 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/vts/2009},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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