BibTeX records: M. Cho

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@inproceedings{DBLP:conf/irps/KaczerFCGRTBWPT15,
  author       = {Ben Kaczer and
                  Jacopo Franco and
                  M. Cho and
                  Tibor Grasser and
                  Philippe J. Roussel and
                  Stanislav Tyaginov and
                  M. Bina and
                  Yannick Wimmer and
                  Luis{-}Miguel Procel and
                  Lionel Trojman and
                  Felice Crupi and
                  Gregory Pitner and
                  Vamsi Putcha and
                  Pieter Weckx and
                  Erik Bury and
                  Z. Ji and
                  An De Keersgieter and
                  Thomas Chiarella and
                  Naoto Horiguchi and
                  Guido Groeseneken and
                  Aaron Thean},
  title        = {Origins and implications of increased channel hot carrier variability
                  in nFinFETs},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
                  CA, USA, April 19-23, 2015},
  pages        = {3},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/IRPS.2015.7112706},
  doi          = {10.1109/IRPS.2015.7112706},
  timestamp    = {Mon, 05 Feb 2024 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/irps/KaczerFCGRTBWPT15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/icicdt/FrancoKMTCERGCK12,
  author       = {Jacopo Franco and
                  Ben Kaczer and
                  J{\'{e}}r{\^{o}}me Mitard and
                  Maria Toledano{-}Luque and
                  Felice Crupi and
                  Geert Eneman and
                  Ph. J. Rousse and
                  Tibor Grasser and
                  M. Cho and
                  Thomas Kauerauf and
                  Liesbeth Witters and
                  Geert Hellings and
                  L.{-}{\AA}. Ragnarsson and
                  Naoto Horiguchi and
                  Marc M. Heyns and
                  Guido Groeseneken},
  title        = {Superior reliability and reduced Time-Dependent variability in high-mobility
                  SiGe channel pMOSFETs for {VLSI} logic applications},
  booktitle    = {{IEEE} International Conference on {IC} Design {\&} Technology,
                  {ICICDT} 2012, Austin, TX, USA, May 30 - June 1, 2012},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2012},
  url          = {https://doi.org/10.1109/ICICDT.2012.6232839},
  doi          = {10.1109/ICICDT.2012.6232839},
  timestamp    = {Sat, 19 Oct 2019 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/icicdt/FrancoKMTCERGCK12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/imaging/LiLLPCK07,
  author       = {X. Li and
                  Changjun Li and
                  M. Ronnier Luo and
                  Michael R. Pointer and
                  M. Cho and
                  J. Kim},
  title        = {A New Colour Gamut for Object Colours},
  booktitle    = {15th Color and Imaging Conference, {CIC} 2007, Albuquerque, New Mexico,
                  USA, November 5-9, 2007},
  pages        = {283--287},
  publisher    = {Society for Imaging Science and Technology},
  year         = {2007},
  url          = {http://www.ingentaconnect.com/content/ist/cic/2007/00002007/00000001/art00053},
  timestamp    = {Sat, 15 Jul 2023 00:21:52 +0200},
  biburl       = {https://dblp.org/rec/conf/imaging/LiLLPCK07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mj/BuckmasterYSYSYHGCK05,
  author       = {Ryan Buckmaster and
                  J. H. Yoo and
                  K. Shin and
                  Y. Yao and
                  Takashi Sekiguchi and
                  M. Yokoyama and
                  Takashi Hanada and
                  Takenari Goto and
                  M. Cho and
                  Yoshiyuki Kawazoe},
  title        = {GaN nanodot fabrication by implant source growth},
  journal      = {Microelectron. J.},
  volume       = {36},
  number       = {3-6},
  pages        = {456--459},
  year         = {2005},
  url          = {https://doi.org/10.1016/j.mejo.2005.02.046},
  doi          = {10.1016/J.MEJO.2005.02.046},
  timestamp    = {Fri, 13 Oct 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mj/BuckmasterYSYSYHGCK05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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