BibTeX records: Letícia Maria Veiras Bolzani

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@article{DBLP:journals/corr/abs-2403-13655,
  author       = {Rebecca Pelke and
                  Felix Staudigl and
                  Niklas Thomas and
                  Nils Bosbach and
                  Mohammed Hossein and
                  Jos{\'{e}} Cubero{-}Cascante and
                  Leticia Bolzani Poehls and
                  Rainer Leupers and
                  Jan Moritz Joseph},
  title        = {A Fully Automated Platform for Evaluating ReRAM Crossbars},
  journal      = {CoRR},
  volume       = {abs/2403.13655},
  year         = {2024},
  url          = {https://doi.org/10.48550/arXiv.2403.13655},
  doi          = {10.48550/ARXIV.2403.13655},
  eprinttype    = {arXiv},
  eprint       = {2403.13655},
  timestamp    = {Mon, 08 Apr 2024 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/corr/abs-2403-13655.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/XunFYAHCPTH23,
  author       = {Hanzhi Xun and
                  Moritz Fieback and
                  Sicong Yuan and
                  Hassen Aziza and
                  Mathijs Heidekamp and
                  Thiago Copetti and
                  Let{\'{\i}}cia Maria Veiras Bolzani Poehls and
                  Mottaqiallah Taouil and
                  Said Hamdioui},
  title        = {Characterization and Test of Intermittent Over {RESET} in RRAMs},
  booktitle    = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
                  14-17, 2023},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/ATS59501.2023.10317990},
  doi          = {10.1109/ATS59501.2023.10317990},
  timestamp    = {Mon, 05 Feb 2024 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/XunFYAHCPTH23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/StaudiglFPSJPL23,
  author       = {Felix Staudigl and
                  Thorben Fetz and
                  Rebecca Pelke and
                  Dominik Sisejkovic and
                  Jan Moritz Joseph and
                  Let{\'{\i}}cia Maria Bolzani P{\"{o}}hls and
                  Rainer Leupers},
  title        = {Fault Injection in Native Logic-in-Memory Computation on Neuromorphic
                  Hardware},
  booktitle    = {60th {ACM/IEEE} Design Automation Conference, {DAC} 2023, San Francisco,
                  CA, USA, July 9-13, 2023},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/DAC56929.2023.10247742},
  doi          = {10.1109/DAC56929.2023.10247742},
  timestamp    = {Sun, 24 Sep 2023 13:31:06 +0200},
  biburl       = {https://dblp.org/rec/conf/dac/StaudiglFPSJPL23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/Bolzani23,
  author       = {Let{\'{\i}}cia Maria Veiras Bolzani},
  editor       = {Maksim Jenihhin and
                  Hana Kub{\'{a}}tov{\'{a}} and
                  Nele Metens and
                  Jaan Raik and
                  Foisal Ahmed and
                  Jan Belohoubek},
  title        = {Embedded Tutorial - RRAMs: How to Guarantee Their Quality Test after
                  Manufacturing?},
  booktitle    = {26th International Symposium on Design and Diagnostics of Electronic
                  Circuits and Systems, {DDECS} 2023, Tallinn, Estonia, May 3-5, 2023},
  pages        = {167--168},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/DDECS57882.2023.10139525},
  doi          = {10.1109/DDECS57882.2023.10139525},
  timestamp    = {Wed, 07 Jun 2023 22:08:03 +0200},
  biburl       = {https://dblp.org/rec/conf/ddecs/Bolzani23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/CopettiCGB23,
  author       = {Thiago Santos Copetti and
                  A. Castelnuovo and
                  Tobias Gemmeke and
                  Let{\'{\i}}cia Maria Veiras Bolzani},
  title        = {Evaluating a New {RRAM} Manufacturing Test Strategy},
  booktitle    = {24th {IEEE} Latin American Test Symposium, {LATS} 2023, Veracruz,
                  Mexico, March 21-24, 2023},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/LATS58125.2023.10154503},
  doi          = {10.1109/LATS58125.2023.10154503},
  timestamp    = {Wed, 28 Jun 2023 16:25:05 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/CopettiCGB23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/StaudiglFPSJPL23,
  author       = {Felix Staudigl and
                  Thorben Fetz and
                  Rebecca Pelke and
                  Dominik Sisejkovic and
                  Jan Moritz Joseph and
                  Let{\'{\i}}cia Maria Veiras Bolzani Poehls and
                  Rainer Leupers},
  title        = {Invited Paper: {A} Holistic Fault Injection Platform for Neuromorphic
                  Hardware},
  booktitle    = {24th {IEEE} Latin American Test Symposium, {LATS} 2023, Veracruz,
                  Mexico, March 21-24, 2023},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/LATS58125.2023.10154482},
  doi          = {10.1109/LATS58125.2023.10154482},
  timestamp    = {Wed, 28 Jun 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/StaudiglFPSJPL23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/corr/abs-2302-07655,
  author       = {Felix Staudigl and
                  Thorben Fetz and
                  Rebecca Pelke and
                  Dominik Sisejkovic and
                  Jan Moritz Joseph and
                  Leticia Bolzani Poehls and
                  Rainer Leupers},
  title        = {Fault Injection in Native Logic-in-Memory Computation on Neuromorphic
                  Hardware},
  journal      = {CoRR},
  volume       = {abs/2302.07655},
  year         = {2023},
  url          = {https://doi.org/10.48550/arXiv.2302.07655},
  doi          = {10.48550/ARXIV.2302.07655},
  eprinttype    = {arXiv},
  eprint       = {2302.07655},
  timestamp    = {Mon, 20 Feb 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/corr/abs-2302-07655.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/aicas/StaudiglSBFSJPL22,
  author       = {Felix Staudigl and
                  Karl J. X. Sturm and
                  Maximilian Bartel and
                  Thorben Fetz and
                  Dominik Sisejkovic and
                  Jan Moritz Joseph and
                  Let{\'{\i}}cia Maria Bolzani P{\"{o}}hls and
                  Rainer Leupers},
  title        = {X-Fault: Impact of Faults on Binary Neural Networks in Memristor-Crossbar
                  Arrays with Logic-in-Memory Computation},
  booktitle    = {4th {IEEE} International Conference on Artificial Intelligence Circuits
                  and Systems, {AICAS} 2022, Incheon, Republic of Korea, June 13-15,
                  2022},
  pages        = {174--177},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/AICAS54282.2022.9869897},
  doi          = {10.1109/AICAS54282.2022.9869897},
  timestamp    = {Sun, 20 Nov 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/aicas/StaudiglSBFSJPL22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/MedeirosFGTBH22,
  author       = {Guilherme Cardoso Medeiros and
                  Moritz Fieback and
                  Anteneh Gebregiorgis and
                  Mottaqiallah Taouil and
                  Let{\'{\i}}cia Maria Veiras Bolzani and
                  Said Hamdioui},
  title        = {Hierarchical Memory Diagnosis},
  booktitle    = {{IEEE} European Test Symposium, {ETS} 2022, Barcelona, Spain, May
                  23-27, 2022},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ETS54262.2022.9810467},
  doi          = {10.1109/ETS54262.2022.9810467},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/MedeirosFGTBH22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/CopettiNFGHP22,
  author       = {Thiago Santos Copetti and
                  M. Nilovic and
                  Moritz Fieback and
                  Tobias Gemmeke and
                  Said Hamdioui and
                  Let{\'{\i}}cia Maria Bolzani Poehls},
  title        = {Exploring an On-Chip Sensor to Detect Unique Faults in RRAMs},
  booktitle    = {23rd {IEEE} Latin American Test Symposium, {LATS} 2022, Montevideo,
                  Uruguay, September 5-8, 2022},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/LATS57337.2022.9936991},
  doi          = {10.1109/LATS57337.2022.9936991},
  timestamp    = {Tue, 21 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/latw/CopettiNFGHP22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/corr/abs-2204-01501,
  author       = {Felix Staudigl and
                  Karl J. X. Sturm and
                  Maximilian Bartel and
                  Thorben Fetz and
                  Dominik Sisejkovic and
                  Jan Moritz Joseph and
                  Let{\'{\i}}cia Maria Bolzani P{\"{o}}hls and
                  Rainer Leupers},
  title        = {X-Fault: Impact of Faults on Binary Neural Networks in Memristor-Crossbar
                  Arrays with Logic-in-Memory Computation},
  journal      = {CoRR},
  volume       = {abs/2204.01501},
  year         = {2022},
  url          = {https://doi.org/10.48550/arXiv.2204.01501},
  doi          = {10.48550/ARXIV.2204.01501},
  eprinttype    = {arXiv},
  eprint       = {2204.01501},
  timestamp    = {Sun, 20 Nov 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/corr/abs-2204-01501.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/CopettiMTHPB21,
  author       = {Thiago Copetti and
                  Guilherme Cardoso Medeiros and
                  Mottaqiallah Taouil and
                  Said Hamdioui and
                  Let{\'{\i}}cia Maria Bolzani Poehls and
                  Tiago Roberto Balen},
  title        = {Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs
                  with Weak Resistive Defects},
  journal      = {J. Electron. Test.},
  volume       = {37},
  number       = {3},
  pages        = {383--394},
  year         = {2021},
  url          = {https://doi.org/10.1007/s10836-021-05949-x},
  doi          = {10.1007/S10836-021-05949-X},
  timestamp    = {Thu, 16 Sep 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/CopettiMTHPB21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/BolzaniFHCBMHG21,
  author       = {Let{\'{\i}}cia Maria Veiras Bolzani and
                  Moritz Fieback and
                  Susanne Hoffmann{-}Eifert and
                  Thiago Copetti and
                  E. Brum and
                  Stephan Menzel and
                  Said Hamdioui and
                  Tobias Gemmeke},
  title        = {Review of Manufacturing Process Defects and Their Effects on Memristive
                  Devices},
  journal      = {J. Electron. Test.},
  volume       = {37},
  number       = {4},
  pages        = {427--437},
  year         = {2021},
  url          = {https://doi.org/10.1007/s10836-021-05968-8},
  doi          = {10.1007/S10836-021-05968-8},
  timestamp    = {Tue, 21 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/et/BolzaniFHCBMHG21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tvlsi/MedeirosFWTPH21,
  author       = {Guilherme Cardoso Medeiros and
                  Moritz Fieback and
                  Lizhou Wu and
                  Mottaqiallah Taouil and
                  Let{\'{\i}}cia Maria Bolzani Poehls and
                  Said Hamdioui},
  title        = {Hard-to-Detect Fault Analysis in FinFET SRAMs},
  journal      = {{IEEE} Trans. Very Large Scale Integr. Syst.},
  volume       = {29},
  number       = {6},
  pages        = {1271--1284},
  year         = {2021},
  url          = {https://doi.org/10.1109/TVLSI.2021.3071940},
  doi          = {10.1109/TVLSI.2021.3071940},
  timestamp    = {Tue, 15 Jun 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tvlsi/MedeirosFWTPH21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dtis/MedeirosFCGTPH21,
  author       = {G. Cardoso Medeiros and
                  Moritz Fieback and
                  Thiago Santos Copetti and
                  Anteneh Gebregiorgis and
                  Mottaqiallah Taouil and
                  Leticia B. Poehls and
                  Said Hamdioui},
  title        = {Improving the Detection of Undefined State Faults in FinFET SRAMs},
  booktitle    = {16th International Conference on Design {\&} Technology of Integrated
                  Systems in Nanoscale Era, {DTIS} 2021, Montpellier, France, June 28-30,
                  2021},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/DTIS53253.2021.9505130},
  doi          = {10.1109/DTIS53253.2021.9505130},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/dtis/MedeirosFCGTPH21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/MedeirosFGTPH21,
  author       = {G. Cardoso Medeiros and
                  Moritz Fieback and
                  Anteneh Gebregiorgis and
                  Mottaqiallah Taouil and
                  Leticia Bolzani Poehls and
                  Said Hamdioui},
  title        = {Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs},
  booktitle    = {26th {IEEE} European Test Symposium, {ETS} 2021, Bruges, Belgium,
                  May 24-28, 2021},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/ETS50041.2021.9465441},
  doi          = {10.1109/ETS50041.2021.9465441},
  timestamp    = {Fri, 13 Aug 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/MedeirosFGTPH21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/BrumFCJHVB21,
  author       = {E. Brum and
                  Moritz Fieback and
                  Thiago Santos Copetti and
                  H. Jiayi and
                  Said Hamdioui and
                  Fabian Vargas and
                  Let{\'{\i}}cia Maria Veiras Bolzani},
  title        = {Evaluating the Impact of Process Variation on RRAMs},
  booktitle    = {22nd {IEEE} Latin American Test Symposium, {LATS} 2021, Punta del
                  Este, Uruguay, October 27-29, 2021},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/LATS53581.2021.9651789},
  doi          = {10.1109/LATS53581.2021.9651789},
  timestamp    = {Sat, 09 Apr 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/BrumFCJHVB21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsi/CopettiGB21,
  author       = {Thiago Santos Copetti and
                  Tobias Gemmeke and
                  Let{\'{\i}}cia Maria Veiras Bolzani},
  title        = {Validating a {DFT} Strategy's Detection Capability regarding Emerging
                  Faults in RRAMs},
  booktitle    = {29th {IFIP/IEEE} International Conference on Very Large Scale Integration,
                  VLSI-SoC 2021, Singapore, Singapore, October 4-7, 2021},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/VLSI-SoC53125.2021.9606993},
  doi          = {10.1109/VLSI-SOC53125.2021.9606993},
  timestamp    = {Tue, 21 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vlsi/CopettiGB21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsi/CopettiGP21,
  author       = {Thiago Santos Copetti and
                  Tobias Gemmeke and
                  Let{\'{\i}}cia Maria Bolzani P{\"{o}}hls},
  editor       = {Victor Grimblatt and
                  Chip{-}Hong Chang and
                  Ricardo Reis and
                  Anupam Chattopadhyay and
                  Andrea Calimera},
  title        = {A DfT Strategy for Detecting Emerging Faults in RRAMs},
  booktitle    = {VLSI-SoC: Technology Advancement on SoC Design - 29th {IFIP} {WG}
                  10.5/IEEE International Conference on Very Large Scale Integration,
                  VLSI-SoC 2021, Singapore, October 4-8, 2021, Revised and Extended
                  Selected Papers},
  series       = {{IFIP} Advances in Information and Communication Technology},
  volume       = {661},
  pages        = {93--111},
  publisher    = {Springer},
  year         = {2021},
  url          = {https://doi.org/10.1007/978-3-031-16818-5\_5},
  doi          = {10.1007/978-3-031-16818-5\_5},
  timestamp    = {Tue, 21 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vlsi/CopettiGP21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/CopettiBBAP20,
  author       = {Thiago Copetti and
                  Tiago R. Balen and
                  E. Brum and
                  C. Aquistapace and
                  Leticia Bolzani Poehls},
  title        = {Comparing the Impact of Power Supply Voltage on {CMOS-} and FinFET-Based
                  SRAMs in the Presence of Resistive Defects},
  journal      = {J. Electron. Test.},
  volume       = {36},
  number       = {2},
  pages        = {271--284},
  year         = {2020},
  url          = {https://doi.org/10.1007/s10836-020-05869-2},
  doi          = {10.1007/S10836-020-05869-2},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/CopettiBBAP20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/CopettiMTHPB20,
  author       = {Thiago Copetti and
                  Guilherme Cardoso Medeiros and
                  Mottaqiallah Taouil and
                  Said Hamdioui and
                  Leticia Bolzani Poehls and
                  Tiago R. Balen},
  title        = {Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs
                  with Weak Resistive Defects},
  booktitle    = {{IEEE} Latin-American Test Symposium, {LATS} 2020, Maceio, Brazil,
                  March 30 - April 2, 2020},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/LATS49555.2020.9093667},
  doi          = {10.1109/LATS49555.2020.9093667},
  timestamp    = {Tue, 19 May 2020 15:02:50 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/CopettiMTHPB20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/MedeirosBPCB19,
  author       = {G. Cardoso Medeiros and
                  E. Brum and
                  Leticia Bolzani Poehls and
                  Thiago Copetti and
                  Tiago R. Balen},
  title        = {Evaluating the Impact of Temperature on Dynamic Fault Behaviour of
                  FinFET-Based SRAMs with Resistive Defects},
  journal      = {J. Electron. Test.},
  volume       = {35},
  number       = {2},
  pages        = {191--200},
  year         = {2019},
  url          = {https://doi.org/10.1007/s10836-019-05784-1},
  doi          = {10.1007/S10836-019-05784-1},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/MedeirosBPCB19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/MedeirosTFPH19,
  author       = {Guilherme Cardoso Medeiros and
                  Mottaqiallah Taouil and
                  Moritz Fieback and
                  Leticia Bolzani Poehls and
                  Said Hamdioui},
  title        = {{DFT} Scheme for Hard-to-Detect Faults in FinFET SRAMs},
  booktitle    = {24th {IEEE} European Test Symposium, {ETS} 2019, Baden-Baden, Germany,
                  May 27-31, 2019},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/ETS.2019.8791517},
  doi          = {10.1109/ETS.2019.8791517},
  timestamp    = {Sat, 05 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/MedeirosTFPH19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/CopettiBBAP19,
  author       = {Thiago Santos Copetti and
                  Tiago R. Balen and
                  E. Brum and
                  C. Aquistapace and
                  Leticia Bolzani Poehls},
  title        = {A Comparative Study Between FinFET and CMOS-Based SRAMs under Resistive
                  Defects},
  booktitle    = {{IEEE} Latin American Test Symposium, {LATS} 2019, Santiago, Chile,
                  March 11-13, 2019},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/LATW.2019.8704579},
  doi          = {10.1109/LATW.2019.8704579},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/CopettiBBAP19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/LaraDGVSPV19,
  author       = {Estevan Lara and
                  Guilherme Debon and
                  Roger C. Goerl and
                  Paulo Ricardo Cechelero Villa and
                  Dorian Schramm and
                  Leticia B. Poehls and
                  Fabian Vargas},
  title        = {A New Approach to Guarantee Critical Task Schedulability in TDMA-Based
                  Bus Access of Multicore Architecture},
  booktitle    = {{IEEE} Latin American Test Symposium, {LATS} 2019, Santiago, Chile,
                  March 11-13, 2019},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/LATW.2019.8704572},
  doi          = {10.1109/LATW.2019.8704572},
  timestamp    = {Fri, 03 Sep 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/LaraDGVSPV19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GoerlVBBV18,
  author       = {Roger C. Goerl and
                  Paulo Ricardo Cechelero Villa and
                  Let{\'{\i}}cia Maria Veiras Bolzani and
                  Eduardo Augusto Bezerra and
                  Fabian Luis Vargas},
  title        = {An efficient {EDAC} approach for handling multiple bit upsets in memory
                  array},
  journal      = {Microelectron. Reliab.},
  volume       = {88-90},
  pages        = {214--218},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.07.060},
  doi          = {10.1016/J.MICROREL.2018.07.060},
  timestamp    = {Fri, 03 Sep 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/GoerlVBBV18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MedeirosBTVH18,
  author       = {G. Cardoso Medeiros and
                  Let{\'{\i}}cia Maria Veiras Bolzani and
                  Mottaqiallah Taouil and
                  Fabian Vargas and
                  Said Hamdioui},
  title        = {A defect-oriented test approach using on-Chip current sensors for
                  resistive defects in FinFET SRAMs},
  journal      = {Microelectron. Reliab.},
  volume       = {88-90},
  pages        = {355--359},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.07.092},
  doi          = {10.1016/J.MICROREL.2018.07.092},
  timestamp    = {Fri, 03 Sep 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/MedeirosBTVH18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/lascas/TubielloPWMV18,
  author       = {F. Tubiello and
                  Leticia Bolzani Poehls and
                  Thais Webber and
                  C{\'{e}}sar Augusto Missio Marcon and
                  Fabian Vargas},
  title        = {A path energy control technique for energy efficiency on wireless
                  sensor networks},
  booktitle    = {9th {IEEE} Latin American Symposium on Circuits {\&} Systems,
                  {LASCAS} 2018, Puerto Vallarta, Mexico, February 25-28, 2018},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LASCAS.2018.8399956},
  doi          = {10.1109/LASCAS.2018.8399956},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/lascas/TubielloPWMV18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/MedeirosBPCB18,
  author       = {G. Cardoso Medeiros and
                  E. Brum and
                  Leticia Bolzani Poehls and
                  Thiago Copetti and
                  Tiago R. Balen},
  title        = {Influence of temperature on dynamic fault behavior due to resistive
                  defects in FinFET-based SRAMs},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8349697},
  doi          = {10.1109/LATW.2018.8349697},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/MedeirosBPCB18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/PintoMVP18,
  author       = {George Redivo Pinto and
                  Guilherme Cardoso Medeiros and
                  Fabian Vargas and
                  Leticia Bolzani Poehls},
  title        = {A hardware-based approach for {SEU} monitoring in SRAMs with weak
                  resistive defects},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8349667},
  doi          = {10.1109/LATW.2018.8349667},
  timestamp    = {Fri, 03 Sep 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/PintoMVP18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/VillaGVPMAAMASB17,
  author       = {Paulo Ricardo Cechelero Villa and
                  Roger C. Goerl and
                  Fabian Vargas and
                  Leticia B. Poehls and
                  Nilberto H. Medina and
                  Nemitala Added and
                  Vitor A. P. de Aguiar and
                  Eduardo L. A. Macchione and
                  Fernando Aguirre and
                  Marcilei Aparecida Guazzelli da Silveira and
                  Eduardo Augusto Bezerra},
  title        = {Analysis of single-event upsets in a Microsemi ProAsic3E {FPGA}},
  booktitle    = {18th {IEEE} Latin American Test Symposium, {LATS} 2017, Bogot{\'{a}},
                  Colombia, March 13-15, 2017},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/LATW.2017.7906772},
  doi          = {10.1109/LATW.2017.7906772},
  timestamp    = {Sat, 28 Oct 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/VillaGVPMAAMASB17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsi/CopettiBMP17,
  author       = {Thiago Santos Copetti and
                  Tiago R. Balen and
                  Guilherme Cardoso Medeiros and
                  Let{\'{\i}}cia Maria Bolzani Poehls},
  title        = {Analyzing the behavior of FinFET SRAMs with resistive defects},
  booktitle    = {2017 {IFIP/IEEE} International Conference on Very Large Scale Integration,
                  VLSI-SoC 2017, Abu Dhabi, United Arab Emirates, October 23-25, 2017},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/VLSI-SoC.2017.8203483},
  doi          = {10.1109/VLSI-SOC.2017.8203483},
  timestamp    = {Wed, 16 Oct 2019 14:14:49 +0200},
  biburl       = {https://dblp.org/rec/conf/vlsi/CopettiBMP17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsi/CopettiMPB17,
  author       = {Thiago Santos Copetti and
                  Guilherme Cardoso Medeiros and
                  Let{\'{\i}}cia Maria Bolzani Poehls and
                  Tiago R. Balen},
  editor       = {Michail Maniatakos and
                  Ibrahim Abe M. Elfadel and
                  Matteo Sonza Reorda and
                  H. Fatih Ugurdag and
                  Jos{\'{e}} Monteiro and
                  Ricardo Reis},
  title        = {Evaluating the Impact of Resistive Defects on FinFET-Based SRAMs},
  booktitle    = {VLSI-SoC: Opportunities and Challenges Beyond the Internet of Things
                  - 25th {IFIP} {WG} 10.5/IEEE International Conference on Very Large
                  Scale Integration, VLSI-SoC 2017, Abu Dhabi, United Arab Emirates,
                  October 23-25, 2017, Revised and Extended Selected Papers},
  series       = {{IFIP} Advances in Information and Communication Technology},
  volume       = {500},
  pages        = {22--45},
  publisher    = {Springer},
  year         = {2017},
  url          = {https://doi.org/10.1007/978-3-030-15663-3\_2},
  doi          = {10.1007/978-3-030-15663-3\_2},
  timestamp    = {Tue, 12 Sep 2023 07:57:22 +0200},
  biburl       = {https://dblp.org/rec/conf/vlsi/CopettiMPB17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/JenihhinSCTKGVR16,
  author       = {Maksim Jenihhin and
                  Giovanni Squillero and
                  Thiago Santos Copetti and
                  Valentin Tihhomirov and
                  Sergei Kostin and
                  Marco Gaudesi and
                  Fabian Vargas and
                  Jaan Raik and
                  Matteo Sonza Reorda and
                  Leticia Bolzani Poehls and
                  Raimund Ubar and
                  Guilherme Cardoso Medeiros},
  title        = {Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale
                  Circuits},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {3},
  pages        = {273--289},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5589-x},
  doi          = {10.1007/S10836-016-5589-X},
  timestamp    = {Fri, 03 Sep 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/JenihhinSCTKGVR16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/CopettiMPV16,
  author       = {Thiago Copetti and
                  Guilherme Cardoso Medeiros and
                  Leticia Bolzani Poehls and
                  Fabian Vargas},
  title        = {NBTI-Aware Design of Integrated Circuits: {A} Hardware-Based Approach
                  for Increasing Circuits' Life Time},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {3},
  pages        = {315--328},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5592-2},
  doi          = {10.1007/S10836-016-5592-2},
  timestamp    = {Fri, 03 Sep 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/CopettiMPV16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jolpe/Poehls16,
  author       = {Let{\'{\i}}cia Maria Bolzani Poehls},
  title        = {Selected Peer Reviewed Articles from the 17th "IEEE Latin-American
                  Test Symposium, " Foz do Igua{\c{c}}u, Brazil, April 6-8, 2016},
  journal      = {J. Low Power Electron.},
  volume       = {12},
  number       = {4},
  pages        = {394},
  year         = {2016},
  url          = {https://doi.org/10.1166/jolpe.2016.1461},
  doi          = {10.1166/JOLPE.2016.1461},
  timestamp    = {Fri, 22 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/jolpe/Poehls16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GomezLMSBCV16,
  author       = {Andres F. Gomez and
                  Felipe Lavratti and
                  Guilherme Medeiros Machado and
                  M. Sartori and
                  Let{\'{\i}}cia Maria Veiras Bolzani and
                  V{\'{\i}}ctor H. Champac and
                  Fabian Vargas},
  title        = {Effectiveness of a hardware-based approach to detect resistive-open
                  defects in {SRAM} cells under process variations},
  journal      = {Microelectron. Reliab.},
  volume       = {67},
  pages        = {150--158},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.10.012},
  doi          = {10.1016/J.MICROREL.2016.10.012},
  timestamp    = {Mon, 28 Aug 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/GomezLMSBCV16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/icnsc/BiaziMSPWV16,
  author       = {Adelcio Biazi and
                  C{\'{e}}sar A. M. Marcon and
                  Fauzi de M. Shubeita and
                  Leticia B. Poehls and
                  Thais Webber and
                  Fabian Vargas},
  title        = {A dynamic TDMA-based sleep scheduling to minimize {WSN} energy consumption},
  booktitle    = {13th {IEEE} International Conference on Networking, Sensing, and Control,
                  {ICNSC} 2016, Mexico City, Mexico, April 28-30, 2016},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ICNSC.2016.7478994},
  doi          = {10.1109/ICNSC.2016.7478994},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/icnsc/BiaziMSPWV16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/CopettiMPVKJRU16,
  author       = {Thiago Copetti and
                  Guilherme Medeiros Machado and
                  Leticia Bolzani Poehls and
                  Fabian Vargas and
                  Sergei Kostin and
                  Maksim Jenihhin and
                  Jaan Raik and
                  Raimund Ubar},
  title        = {Gate-level modelling of NBTI-induced delays under process variations},
  booktitle    = {17th Latin-American Test Symposium, {LATS} 2016, Foz do Iguacu, Brazil,
                  April 6-8, 2016},
  pages        = {75--80},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/LATW.2016.7483343},
  doi          = {10.1109/LATW.2016.7483343},
  timestamp    = {Fri, 03 Sep 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/CopettiMPVKJRU16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/MartinsMCVP16,
  author       = {M. Tulio Martins and
                  G. Cardoso Medeiros and
                  Thiago Copetti and
                  Fabian Vargas and
                  Let{\'{\i}}cia Maria Bolzani Poehls},
  title        = {Analyzing {NBTI} impact on SRAMs with resistive-open defects},
  booktitle    = {17th Latin-American Test Symposium, {LATS} 2016, Foz do Iguacu, Brazil,
                  April 6-8, 2016},
  pages        = {87--92},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/LATW.2016.7483345},
  doi          = {10.1109/LATW.2016.7483345},
  timestamp    = {Fri, 03 Sep 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/MartinsMCVP16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/MedeirosPV16,
  author       = {G. Cardoso Medeiros and
                  Let{\'{\i}}cia Maria Bolzani P{\"{o}}hls and
                  Fabian Vargas},
  title        = {Analyzing the Impact of SEUs on SRAMs with Resistive-Bridge Defects},
  booktitle    = {29th International Conference on {VLSI} Design and 15th International
                  Conference on Embedded Systems, {VLSID} 2016, Kolkata, India, January
                  4-8, 2016},
  pages        = {487--492},
  publisher    = {{IEEE} Computer Society},
  year         = {2016},
  url          = {https://doi.org/10.1109/VLSID.2016.146},
  doi          = {10.1109/VLSID.2016.146},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vlsid/MedeirosPV16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/KostinRUJCVP15,
  author       = {Sergei Kostin and
                  Jaan Raik and
                  Raimund Ubar and
                  Maksim Jenihhin and
                  Thiago Copetti and
                  Fabian Vargas and
                  Let{\'{\i}}cia Maria Bolzani P{\"{o}}hls},
  editor       = {Zoran Stamenkovic and
                  Witold A. Pleskacz and
                  Jaan Raik and
                  Heinrich Theodor Vierhaus},
  title        = {SPICE-Inspired Fast Gate-Level Computation of NBTI-induced Delays
                  in Nanoscale Logic},
  booktitle    = {18th {IEEE} International Symposium on Design and Diagnostics of Electronic
                  Circuits {\&} Systems, {DDECS} 2015, Belgrade, Serbia, April 22-24,
                  2015},
  pages        = {223--228},
  publisher    = {{IEEE} Computer Society},
  year         = {2015},
  url          = {https://doi.org/10.1109/DDECS.2015.53},
  doi          = {10.1109/DDECS.2015.53},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ddecs/KostinRUJCVP15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/emccompo/OliveiraPV15,
  author       = {Christofer de Oliveira and
                  Leticia Bolzani Poehls and
                  Fabian Vargas},
  title        = {On-chip Watchdog to monitor {RTOS} activity in MPSoC exposed to noisy
                  environment},
  booktitle    = {10th International Workshop on the Electromagnetic Compatibility of
                  Integrated Circuits, {EMC} Compo 2015, Edinburgh, UK, November 10-13,
                  2015},
  pages        = {61--66},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/EMCCompo.2015.7358331},
  doi          = {10.1109/EMCCOMPO.2015.7358331},
  timestamp    = {Fri, 03 Sep 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/emccompo/OliveiraPV15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/StefaniWFCPM15,
  author       = {Marco P. Stefani and
                  Thais Webber and
                  Ramon Fernandes and
                  Rodrigo Cataldo and
                  Leticia B. Poehls and
                  C{\'{e}}sar A. M. Marcon},
  title        = {Task partitioning optimization algorithm for energy saving and load
                  balance on NoC-based MPSoCs},
  booktitle    = {Sixteenth International Symposium on Quality Electronic Design, {ISQED}
                  2015, Santa Clara, CA, USA, March 2-4, 2015},
  pages        = {130--134},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/ISQED.2015.7085412},
  doi          = {10.1109/ISQED.2015.7085412},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/isqed/StefaniWFCPM15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/ChampacZPA15,
  author       = {V{\'{\i}}ctor H. Champac and
                  Yervant Zorian and
                  Let{\'{\i}}cia Maria Bolzani P{\"{o}}hls and
                  Vishwani D. Agrawal},
  title        = {Message from the {LATS2015} Chairs},
  booktitle    = {16th Latin-American Test Symposium, {LATS} 2015, Puerto Vallarta,
                  Mexico, March 25-27, 2015},
  pages        = {1},
  publisher    = {{IEEE} Computer Society},
  year         = {2015},
  url          = {https://doi.org/10.1109/LATW.2015.7102397},
  doi          = {10.1109/LATW.2015.7102397},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/latw/ChampacZPA15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/CopettiMPV15,
  author       = {Thiago Copetti and
                  G. Cardoso Medeiros and
                  Let{\'{\i}}cia Maria Bolzani Poehls and
                  Fabian Vargas},
  title        = {NBTI-aware design of integrated circuits: a hardware-based approach},
  booktitle    = {16th Latin-American Test Symposium, {LATS} 2015, Puerto Vallarta,
                  Mexico, March 25-27, 2015},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2015},
  url          = {https://doi.org/10.1109/LATW.2015.7102525},
  doi          = {10.1109/LATW.2015.7102525},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/latw/CopettiMPV15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/PalermoTCJRKGSR15,
  author       = {N. Palermo and
                  Valentin Tihhomirov and
                  Thiago Santos Copetti and
                  Maksim Jenihhin and
                  Jaan Raik and
                  Sergei Kostin and
                  Marco Gaudesi and
                  Giovanni Squillero and
                  Matteo Sonza Reorda and
                  Fabian Vargas and
                  Let{\'{\i}}cia Maria Bolzani P{\"{o}}hls},
  title        = {Rejuvenation of nanoscale logic at NBTI-critical paths using evolutionary
                  {TPG}},
  booktitle    = {16th Latin-American Test Symposium, {LATS} 2015, Puerto Vallarta,
                  Mexico, March 25-27, 2015},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2015},
  url          = {https://doi.org/10.1109/LATW.2015.7102405},
  doi          = {10.1109/LATW.2015.7102405},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/latw/PalermoTCJRKGSR15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/FernandesBWCPM15,
  author       = {Ramon Fernandes and
                  Lucas Brahm and
                  Thais Webber and
                  Rodrigo Cataldo and
                  Leticia B. Poehls and
                  C{\'{e}}sar A. M. Marcon},
  title        = {OcNoC: Efficient One-Cycle Router Implementation for 3D Mesh Network-on-Chip},
  booktitle    = {28th International Conference on {VLSI} Design, {VLSID} 2015, Bangalore,
                  India, January 3-7, 2015},
  pages        = {105--110},
  publisher    = {{IEEE} Computer Society},
  year         = {2015},
  url          = {https://doi.org/10.1109/VLSID.2015.23},
  doi          = {10.1109/VLSID.2015.23},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vlsid/FernandesBWCPM15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/LavrattiPVCM15,
  author       = {Felipe Lavratti and
                  Let{\'{\i}}cia Maria Bolzani Poehls and
                  Fabian Vargas and
                  Andrea Calimera and
                  Enrico Macii},
  title        = {Evaluating a Hardware-Based Approach for Detecting Resistive-Open
                  Defects in SRAMs},
  booktitle    = {28th International Conference on {VLSI} Design, {VLSID} 2015, Bangalore,
                  India, January 3-7, 2015},
  pages        = {405--410},
  publisher    = {{IEEE} Computer Society},
  year         = {2015},
  url          = {https://doi.org/10.1109/VLSID.2015.74},
  doi          = {10.1109/VLSID.2015.74},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vlsid/LavrattiPVCM15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/GomezPVC15,
  author       = {Andres F. Gomez and
                  Leticia B. Poehls and
                  Fabian Vargas and
                  V{\'{\i}}ctor H. Champac},
  title        = {An early prediction methodology for aging sensor insertion to assure
                  safe circuit operation due to {NBTI} aging},
  booktitle    = {33rd {IEEE} {VLSI} Test Symposium, {VTS} 2015, Napa, CA, USA, April
                  27-29, 2015},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2015},
  url          = {https://doi.org/10.1109/VTS.2015.7116290},
  doi          = {10.1109/VTS.2015.7116290},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/GomezPVC15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/CerattiCPVF14,
  author       = {Arthur Ceratti and
                  Thiago Copetti and
                  Let{\'{\i}}cia Maria Bolzani Poehls and
                  Fabian Vargas and
                  Rubem Dutra Ribeiro Fagundes},
  title        = {An On-Chip Sensor to Monitor {NBTI} Effects in SRAMs},
  journal      = {J. Electron. Test.},
  volume       = {30},
  number       = {2},
  pages        = {159--169},
  year         = {2014},
  url          = {https://doi.org/10.1007/s10836-014-5444-x},
  doi          = {10.1007/S10836-014-5444-X},
  timestamp    = {Fri, 03 Sep 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/CerattiCPVF14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/MiryalaOPCMP14,
  author       = {Sandeep Miryala and
                  Matheus Oleiro and
                  Let{\'{\i}}cia Maria Bolzani P{\"{o}}hls and
                  Andrea Calimera and
                  Enrico Macii and
                  Massimo Poncino},
  title        = {Modeling of Physical Defects in {PN} Junction Based Graphene Devices},
  journal      = {J. Electron. Test.},
  volume       = {30},
  number       = {3},
  pages        = {357--370},
  year         = {2014},
  url          = {https://doi.org/10.1007/s10836-014-5458-4},
  doi          = {10.1007/S10836-014-5458-4},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/MiryalaOPCMP14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jolpe/PoehlsR14,
  author       = {Let{\'{\i}}cia Maria Bolzani Poehls and
                  Matteo Sonza Reorda},
  title        = {Selected Peer-Reviewed Articles from the 14th {IEEE} Latin-American
                  Test Workshop, Cordoba, Argentina, April 3-5, 2013},
  journal      = {J. Low Power Electron.},
  volume       = {10},
  number       = {1},
  pages        = {163--164},
  year         = {2014},
  url          = {https://doi.org/10.1166/jolpe.2014.1311},
  doi          = {10.1166/JOLPE.2014.1311},
  timestamp    = {Fri, 22 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/jolpe/PoehlsR14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/KostinRUJVPC14,
  author       = {Sergei Kostin and
                  Jaan Raik and
                  Raimund Ubar and
                  Maksim Jenihhin and
                  Fabian Vargas and
                  Let{\'{\i}}cia Maria Bolzani Poehls and
                  Thiago Santos Copetti},
  title        = {Hierarchical identification of NBTI-critical gates in nanoscale logic},
  booktitle    = {15th Latin American Test Workshop - {LATW} 2014, Fortaleza, Brazil,
                  March 12-15, 2014},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2014},
  url          = {https://doi.org/10.1109/LATW.2014.6841926},
  doi          = {10.1109/LATW.2014.6841926},
  timestamp    = {Fri, 03 Sep 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/KostinRUJVPC14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/MarconFCGWBP14,
  author       = {C{\'{e}}sar A. M. Marcon and
                  Ramon Fernandes and
                  Rodrigo Cataldo and
                  Fernando Grando and
                  Thais Webber and
                  Ana Benso and
                  Leticia B. Poehls},
  title        = {Tiny NoC: {A} 3D Mesh Topology with Router Channel Optimization for
                  Area and Latency Minimization},
  booktitle    = {2014 27th International Conference on {VLSI} Design, {VLSID} 2014,
                  and 2014 13th International Conference on Embedded Systems, Mumbai,
                  India, January 5-9, 2014},
  pages        = {228--233},
  publisher    = {{IEEE} Computer Society},
  year         = {2014},
  url          = {https://doi.org/10.1109/VLSID.2014.46},
  doi          = {10.1109/VLSID.2014.46},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vlsid/MarconFCGWBP14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/MarconWPP14,
  author       = {C{\'{e}}sar A. M. Marcon and
                  Thais Webber and
                  Leticia B. Poehls and
                  Igor K. Pinotti},
  title        = {Pre-mapping Algorithm for Heterogeneous MPSoCs},
  booktitle    = {2014 27th International Conference on {VLSI} Design, {VLSID} 2014,
                  and 2014 13th International Conference on Embedded Systems, Mumbai,
                  India, January 5-9, 2014},
  pages        = {252--257},
  publisher    = {{IEEE} Computer Society},
  year         = {2014},
  url          = {https://doi.org/10.1109/VLSID.2014.50},
  doi          = {10.1109/VLSID.2014.50},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vlsid/MarconWPP14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/UbarVJRKP13,
  author       = {Raimund Ubar and
                  Fabian Vargas and
                  Maksim Jenihhin and
                  Jaan Raik and
                  Sergei Kostin and
                  Let{\'{\i}}cia Maria Bolzani Poehls},
  title        = {Identifying NBTI-Critical Paths in Nanoscale Logic},
  booktitle    = {2013 Euromicro Conference on Digital System Design, {DSD} 2013, Los
                  Alamitos, CA, USA, September 4-6, 2013},
  pages        = {136--141},
  publisher    = {{IEEE} Computer Society},
  year         = {2013},
  url          = {https://doi.org/10.1109/DSD.2013.23},
  doi          = {10.1109/DSD.2013.23},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dsd/UbarVJRKP13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/emccompo/OliveiraBPVLLGH13,
  author       = {C. Oliveira and
                  Juliano Benfica and
                  Let{\'{\i}}cia Maria Bolzani Poehls and
                  Fabian Vargas and
                  Jos{\'{e}} Lipovetzky and
                  Ariel Lutenberg and
                  Edmundo Gatti and
                  Fernando Hernandez and
                  Alexandre Boyer},
  title        = {Reliability analysis of an on-chip watchdog for embedded systems exposed
                  to radiation and {EMI}},
  booktitle    = {9th International Workshop on Electromagnetic Compatibility of Integrated
                  Circuits, {EMC} Compo 2013, Nara, Japan, December 15-18, 2013},
  pages        = {89--94},
  publisher    = {{IEEE}},
  year         = {2013},
  url          = {https://doi.org/10.1109/EMCCompo.2013.6735179},
  doi          = {10.1109/EMCCOMPO.2013.6735179},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/emccompo/OliveiraBPVLLGH13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccd/MarconAWVP13,
  author       = {C{\'{e}}sar A. M. Marcon and
                  Alexandre M. Amory and
                  Thais Webber and
                  Thomas Volpato and
                  Leticia B. Poehls},
  title        = {Phoenix NoC: {A} distributed fault tolerant architecture},
  booktitle    = {2013 {IEEE} 31st International Conference on Computer Design, {ICCD}
                  2013, Asheville, NC, USA, October 6-9, 2013},
  pages        = {7--12},
  publisher    = {{IEEE} Computer Society},
  year         = {2013},
  url          = {https://doi.org/10.1109/ICCD.2013.6657018},
  doi          = {10.1109/ICCD.2013.6657018},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/iccd/MarconAWVP13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/PratesBHDVZ13,
  author       = {W. Prates and
                  Let{\'{\i}}cia Maria Veiras Bolzani and
                  Gurgen Harutyunyan and
                  A. Davtyan and
                  Fabian Vargas and
                  Yervant Zorian},
  title        = {Integrating embedded test infrastructure in {SRAM} cores to detect
                  aging},
  booktitle    = {2013 {IEEE} 19th International On-Line Testing Symposium (IOLTS),
                  Chania, Crete, Greece, July 8-10, 2013},
  pages        = {25--30},
  publisher    = {{IEEE}},
  year         = {2013},
  url          = {https://doi.org/10.1109/IOLTS.2013.6604046},
  doi          = {10.1109/IOLTS.2013.6604046},
  timestamp    = {Fri, 03 Sep 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/iolts/PratesBHDVZ13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/LavrattiBCVM13,
  author       = {Felipe Lavratti and
                  Let{\'{\i}}cia Maria Veiras Bolzani and
                  Andrea Calimera and
                  Fabian Vargas and
                  Enrico Macii},
  title        = {Technique based on On-Chip Current Sensors and Neighbourhood Comparison
                  Logic to detect resistive-open defects in SRAMs},
  booktitle    = {14th Latin American Test Workshop, {LATW} 2013, Cordoba, Argentina,
                  3-5 April, 2013},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2013},
  url          = {https://doi.org/10.1109/LATW.2013.6562688},
  doi          = {10.1109/LATW.2013.6562688},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/latw/LavrattiBCVM13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/MiryalaCMPP13,
  author       = {Sandeep Miryala and
                  Andrea Calimera and
                  Enrico Macii and
                  Massimo Poncino and
                  Let{\'{\i}}cia Maria Veiras Bolzani Poehls},
  title        = {Investigating the behavior of physical defects in pn-junction based
                  reconfigurable graphene devices},
  booktitle    = {14th Latin American Test Workshop, {LATW} 2013, Cordoba, Argentina,
                  3-5 April, 2013},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2013},
  url          = {https://doi.org/10.1109/LATW.2013.6562674},
  doi          = {10.1109/LATW.2013.6562674},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/latw/MiryalaCMPP13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/rsp/BohrerFMWPCH13,
  author       = {Vinicius Bohrer and
                  Ramon Fernandes and
                  C{\'{e}}sar A. M. Marcon and
                  Thais Webber and
                  Leticia B. Poehls and
                  Ricardo M. Czekster and
                  Fabiano Hessel},
  title        = {A flexible framework for modeling and simulation of multipurpose wireless
                  networks},
  booktitle    = {Proceedings of the 24th {IEEE} International Symposium on Rapid System
                  Prototyping, {RSP} 2013, Montreal, QC, Canada, October 3-4, 2013},
  pages        = {94--100},
  publisher    = {{IEEE}},
  year         = {2013},
  url          = {https://doi.org/10.1109/RSP.2013.6683964},
  doi          = {10.1109/RSP.2013.6683964},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/rsp/BohrerFMWPCH13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Portela-GarciaLEGLMPPV12,
  author       = {Marta Portela{-}Garc{\'{\i}}a and
                  Almudena Lindoso and
                  Luis Entrena and
                  Mario Garc{\'{\i}}a{-}Valderas and
                  Celia L{\'{o}}pez{-}Ongil and
                  N. Marroni and
                  Bernardo Pianta and
                  Let{\'{\i}}cia Maria Bolzani Poehls and
                  Fabian Vargas},
  title        = {Evaluating the Effectiveness of a Software-Based Technique Under SEEs
                  Using FPGA-Based Fault Injection Approach},
  journal      = {J. Electron. Test.},
  volume       = {28},
  number       = {6},
  pages        = {777--789},
  year         = {2012},
  url          = {https://doi.org/10.1007/s10836-012-5321-4},
  doi          = {10.1007/S10836-012-5321-4},
  timestamp    = {Sat, 09 Apr 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/Portela-GarciaLEGLMPPV12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/BenficaPVLLGH12,
  author       = {Juliano Benfica and
                  Let{\'{\i}}cia Maria Bolzani Poehls and
                  Fabian Vargas and
                  Jos{\'{e}} Lipovetzky and
                  Ariel Lutenberg and
                  Edmundo Gatti and
                  Fernando Hernandez},
  title        = {A Test Platform for Dependability Analysis of SoCs Exposed to {EMI}
                  and Radiation},
  journal      = {J. Electron. Test.},
  volume       = {28},
  number       = {6},
  pages        = {803--816},
  year         = {2012},
  url          = {https://doi.org/10.1007/s10836-012-5334-z},
  doi          = {10.1007/S10836-012-5334-Z},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/BenficaPVLLGH12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/CerattiCPV12,
  author       = {Arthur Ceratti and
                  Thiago Copetti and
                  Let{\'{\i}}cia Maria Bolzani Poehls and
                  Fabian Vargas},
  editor       = {Jaan Raik and
                  Viera Stopjakov{\'{a}} and
                  Heinrich Theodor Vierhaus and
                  Witold A. Pleskacz and
                  Raimund Ubar and
                  Helena Kruus and
                  Maksim Jenihhin},
  title        = {On-chip aging sensor to monitor {NBTI} effect in nano-scale {SRAM}},
  booktitle    = {{IEEE} 15th International Symposium on Design and Diagnostics of Electronic
                  Circuits {\&} Systems, {DDECS} 2012, Tallinn, Estonia, April 18-20,
                  2012},
  pages        = {354--359},
  publisher    = {{IEEE}},
  year         = {2012},
  url          = {https://doi.org/10.1109/DDECS.2012.6219087},
  doi          = {10.1109/DDECS.2012.6219087},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ddecs/CerattiCPV12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/CerattiCBV12,
  author       = {Arthur Ceratti and
                  Thiago Copetti and
                  Let{\'{\i}}cia Maria Veiras Bolzani and
                  Fabian Vargas},
  title        = {Investigating the use of an on-chip sensor to monitor {NBTI} effect
                  in {SRAM}},
  booktitle    = {13th Latin American Test Workshop, {LATW} 2012, Quito, Ecuador, April
                  10-13, 2012},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/LATW.2012.6261238},
  doi          = {10.1109/LATW.2012.6261238},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/latw/CerattiCBV12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jolpe/ChampacKPVZ11,
  author       = {V{\'{\i}}ctor H. Champac and
                  Fernanda Gusm{\~{a}}o de Lima Kastensmidt and
                  Let{\'{\i}}cia Maria Veiras Bolzani Poehls and
                  Fabian Vargas and
                  Yervant Zorian},
  title        = {12th "IEEE Latin-American Test Workshop" Porto de Galinhas,
                  Brazil, 27-30 March 2011},
  journal      = {J. Low Power Electron.},
  volume       = {7},
  number       = {4},
  pages        = {529--530},
  year         = {2011},
  url          = {https://doi.org/10.1166/jolpe.2011.1164},
  doi          = {10.1166/JOLPE.2011.1164},
  timestamp    = {Fri, 03 Sep 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/jolpe/ChampacKPVZ11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/SilvaSBV11,
  author       = {Dhiego Silva and
                  Kleber Stangherlin and
                  Let{\'{\i}}cia Maria Veiras Bolzani and
                  Fabian Vargas},
  title        = {A Hardware-Based Approach for Fault Detection in RTOS-Based Embedded
                  Systems},
  booktitle    = {16th European Test Symposium, {ETS} 2011, Trondheim, Norway, May 23-27,
                  2011},
  pages        = {209},
  publisher    = {{IEEE} Computer Society},
  year         = {2011},
  url          = {https://doi.org/10.1109/ETS.2011.64},
  doi          = {10.1109/ETS.2011.64},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/SilvaSBV11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/SilvaBV11,
  author       = {Dhiego Silva and
                  Let{\'{\i}}cia Maria Veiras Bolzani and
                  Fabian Vargas},
  title        = {An intellectual property core to detect task schedulling-related faults
                  in RTOS-based embedded systems},
  booktitle    = {17th {IEEE} International On-Line Testing Symposium {(IOLTS} 2011),
                  13-15 July, 2011, Athens, Greece},
  pages        = {19--24},
  publisher    = {{IEEE} Computer Society},
  year         = {2011},
  url          = {https://doi.org/10.1109/IOLTS.2011.5993805},
  doi          = {10.1109/IOLTS.2011.5993805},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/iolts/SilvaBV11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/BenficaP0LLGGHC11,
  author       = {Juliano Benfica and
                  Let{\'{\i}}cia Maria Bolzani Poehls and
                  Fabian Vargas and
                  Jos{\'{e}} Lipovetzky and
                  Ariel Lutenberg and
                  Sebasti{\'{a}}n E. Garc{\'{\i}}a and
                  Edmundo Gatti and
                  Fernando Hernandez and
                  Ney Laert Vilar Calazans},
  title        = {Configurable platform for {IC} combined tests of total-ionizing dose
                  radiation and electromagnetic immunity},
  booktitle    = {12th Latin American Test Workshop, {LATW} 2011, Beach of Porto de
                  Galinhas, Brazil, March 27-30, 2011},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2011},
  url          = {https://doi.org/10.1109/LATW.2011.5985935},
  doi          = {10.1109/LATW.2011.5985935},
  timestamp    = {Sun, 06 Aug 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/BenficaP0LLGGHC11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/LavrattiCB0M11,
  author       = {Felipe Lavratti and
                  Andrea Calimera and
                  Let{\'{\i}}cia Maria Veiras Bolzani and
                  Fabian Vargas and
                  Enrico Macii},
  title        = {A new Built-In Current Sensor scheme to detect dynamic faults in Nano-Scale
                  SRAMs},
  booktitle    = {12th Latin American Test Workshop, {LATW} 2011, Beach of Porto de
                  Galinhas, Brazil, March 27-30, 2011},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2011},
  url          = {https://doi.org/10.1109/LATW.2011.5985934},
  doi          = {10.1109/LATW.2011.5985934},
  timestamp    = {Sun, 06 Aug 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/LavrattiCB0M11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/Portela-GarciaL11,
  author       = {Marta Portela{-}Garc{\'{\i}}a and
                  Almudena Lindoso and
                  Luis Entrena and
                  Mario Garc{\'{\i}}a{-}Valderas and
                  Celia L{\'{o}}pez{-}Ongil and
                  Bernardo Pianta and
                  Let{\'{\i}}cia Maria Bolzani Poehls and
                  Fabian Vargas},
  title        = {Using an FPGA-based fault injection technique to evaluate software
                  robustness under SEEs: {A} case study},
  booktitle    = {12th Latin American Test Workshop, {LATW} 2011, Beach of Porto de
                  Galinhas, Brazil, March 27-30, 2011},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2011},
  url          = {https://doi.org/10.1109/LATW.2011.5985918},
  doi          = {10.1109/LATW.2011.5985918},
  timestamp    = {Mon, 28 Aug 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/Portela-GarciaL11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tdsc/BernardiPGR10,
  author       = {Paolo Bernardi and
                  Let{\'{\i}}cia Maria Veiras Bolzani Poehls and
                  Michelangelo Grosso and
                  Matteo Sonza Reorda},
  title        = {A Hybrid Approach for Detection and Correction of Transient Faults
                  in SoCs},
  journal      = {{IEEE} Trans. Dependable Secur. Comput.},
  volume       = {7},
  number       = {4},
  pages        = {439--445},
  year         = {2010},
  url          = {https://doi.org/10.1109/TDSC.2010.33},
  doi          = {10.1109/TDSC.2010.33},
  timestamp    = {Sun, 25 Jul 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tdsc/BernardiPGR10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/LavrattiPBVMHGS10,
  author       = {Felipe Lavratti and
                  Alex R. Pinto and
                  Let{\'{\i}}cia Maria Veiras Bolzani and
                  Fabian Vargas and
                  Carlos Barros Montez and
                  Fernando Hernandez and
                  Edmundo Gatti and
                  C. Silva},
  editor       = {Sebasti{\'{a}}n L{\'{o}}pez},
  title        = {Evaluating a Transmission Power Self-Optimization Technique for {WSN}
                  in {EMI} Environments},
  booktitle    = {13th Euromicro Conference on Digital System Design, Architectures,
                  Methods and Tools, {DSD} 2010, 1-3 September 2010, Lille, France},
  pages        = {509--515},
  publisher    = {{IEEE} Computer Society},
  year         = {2010},
  url          = {https://doi.org/10.1109/DSD.2010.116},
  doi          = {10.1109/DSD.2010.116},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dsd/LavrattiPBVMHGS10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/ChipanaBVSRTT10,
  author       = {Raul Chipana and
                  Let{\'{\i}}cia Maria Veiras Bolzani and
                  Fabian Vargas and
                  Jorge Semi{\~{a}}o and
                  Juan J. Rodr{\'{\i}}guez{-}Andina and
                  Isabel C. Teixeira and
                  Jo{\~{a}}o Paulo Teixeira},
  title        = {Investigating the Use of {BICS} to detect resistive-open defects in
                  SRAMs},
  booktitle    = {16th {IEEE} International On-Line Testing Symposium {(IOLTS} 2010),
                  5-7 July, 2010, Corfu, Greece},
  pages        = {200--201},
  publisher    = {{IEEE} Computer Society},
  year         = {2010},
  url          = {https://doi.org/10.1109/IOLTS.2010.5560207},
  doi          = {10.1109/IOLTS.2010.5560207},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/iolts/ChipanaBVSRTT10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/ChipanaB010,
  author       = {Raul Chipana and
                  Let{\'{\i}}cia Maria Veiras Bolzani and
                  Fabian Vargas},
  title        = {BICS-based March test for resistive-open defect detection in SRAMs},
  booktitle    = {11th Latin American Test Workshop, {LATW} 2010, Punta del Este, Uruguay,
                  March 28-30, 2010},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2010},
  url          = {https://doi.org/10.1109/LATW.2010.5550342},
  doi          = {10.1109/LATW.2010.5550342},
  timestamp    = {Fri, 28 Jul 2023 11:10:53 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/ChipanaB010.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/LavrattiPPB0M10,
  author       = {Felipe Lavratti and
                  Alex R. Pinto and
                  D{\'{a}}rcio Prestes and
                  Let{\'{\i}}cia Maria Veiras Bolzani and
                  Fabian Vargas and
                  Carlos Montez},
  title        = {Towards a transmission power self-optimization in reliable Wireless
                  Sensor Networks},
  booktitle    = {11th Latin American Test Workshop, {LATW} 2010, Punta del Este, Uruguay,
                  March 28-30, 2010},
  pages        = {1--3},
  publisher    = {{IEEE}},
  year         = {2010},
  url          = {https://doi.org/10.1109/LATW.2010.5550356},
  doi          = {10.1109/LATW.2010.5550356},
  timestamp    = {Sun, 06 Aug 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/LavrattiPPB0M10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/BolzaniCMMP09,
  author       = {Let{\'{\i}}cia Maria Veiras Bolzani and
                  Andrea Calimera and
                  Alberto Macii and
                  Enrico Macii and
                  Massimo Poncino},
  editor       = {Luca Benini and
                  Giovanni De Micheli and
                  Bashir M. Al{-}Hashimi and
                  Wolfgang M{\"{u}}ller},
  title        = {Enabling concurrent clock and power gating in an industrial design
                  flow},
  booktitle    = {Design, Automation and Test in Europe, {DATE} 2009, Nice, France,
                  April 20-24, 2009},
  pages        = {334--339},
  publisher    = {{IEEE}},
  year         = {2009},
  url          = {https://doi.org/10.1109/DATE.2009.5090684},
  doi          = {10.1109/DATE.2009.5090684},
  timestamp    = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl       = {https://dblp.org/rec/conf/date/BolzaniCMMP09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/TarrilloPV09,
  author       = {Jimmy Tarrillo and
                  Let{\'{\i}}cia Maria Veiras Bolzani Poehls and
                  Fabian Vargas},
  editor       = {Antonio N{\'{u}}{\~{n}}ez and
                  Pedro P. Carballo},
  title        = {A Hardware-Scheduler for Fault Detection in RTOS-Based Embedded Systems},
  booktitle    = {12th Euromicro Conference on Digital System Design, Architectures,
                  Methods and Tools, {DSD} 2009, 27-29 August 2009, Patras, Greece},
  pages        = {341--347},
  publisher    = {{IEEE} Computer Society},
  year         = {2009},
  url          = {https://doi.org/10.1109/DSD.2009.224},
  doi          = {10.1109/DSD.2009.224},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/dsd/TarrilloPV09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iscas/BolzaniCMMP09,
  author       = {Let{\'{\i}}cia Maria Veiras Bolzani and
                  Andrea Calimera and
                  Alberto Macii and
                  Enrico Macii and
                  Massimo Poncino},
  title        = {Placement-aware Clustering for Integrated Clock and Power Gating},
  booktitle    = {International Symposium on Circuits and Systems {(ISCAS} 2009), 24-17
                  May 2009, Taipei, Taiwan},
  pages        = {1723--1726},
  publisher    = {{IEEE}},
  year         = {2009},
  url          = {https://doi.org/10.1109/ISCAS.2009.5118107},
  doi          = {10.1109/ISCAS.2009.5118107},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/iscas/BolzaniCMMP09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/MaciiBCMP08,
  author       = {Enrico Macii and
                  Let{\'{\i}}cia Maria Veiras Bolzani and
                  Andrea Calimera and
                  Alberto Macii and
                  Massimo Poncino},
  editor       = {Luca Fanucci},
  title        = {Integrating Clock Gating and Power Gating for Combined Dynamic and
                  Leakage Power Optimization in Digital {CMOS} Circuits},
  booktitle    = {11th Euromicro Conference on Digital System Design: Architectures,
                  Methods and Tools, {DSD} 2008, Parma, Italy, September 3-5, 2008},
  pages        = {298--303},
  publisher    = {{IEEE} Computer Society},
  year         = {2008},
  url          = {https://doi.org/10.1109/DSD.2008.90},
  doi          = {10.1109/DSD.2008.90},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/dsd/MaciiBCMP08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/cec/BolzaniSSS07,
  author       = {Let{\'{\i}}cia Maria Veiras Bolzani and
                  Ernesto S{\'{a}}nchez and
                  Massimiliano Schillaci and
                  Giovanni Squillero},
  title        = {Co-evolution of test programs and stimuli vectors for testing of embedded
                  peripheral cores},
  booktitle    = {Proceedings of the {IEEE} Congress on Evolutionary Computation, {CEC}
                  2007, 25-28 September 2007, Singapore},
  pages        = {3474--3481},
  publisher    = {{IEEE}},
  year         = {2007},
  url          = {https://doi.org/10.1109/CEC.2007.4424922},
  doi          = {10.1109/CEC.2007.4424922},
  timestamp    = {Thu, 16 Dec 2021 14:01:04 +0100},
  biburl       = {https://dblp.org/rec/conf/cec/BolzaniSSS07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/BernardiBR07,
  author       = {Paolo Bernardi and
                  Let{\'{\i}}cia Maria Veiras Bolzani and
                  Matteo Sonza Reorda},
  editor       = {Patrick Girard and
                  Andrzej Krasniewski and
                  Elena Gramatov{\'{a}} and
                  Adam Pawlak and
                  Tomasz Garbolino},
  title        = {Extended Fault Detection Techniques for Systems-on-Chip},
  booktitle    = {Proceedings of the 10th {IEEE} Workshop on Design {\&} Diagnostics
                  of Electronic Circuits {\&} Systems {(DDECS} 2007), Krak{\'{o}}w,
                  Poland, April 11-13, 2007},
  pages        = {55--60},
  publisher    = {{IEEE} Computer Society},
  year         = {2007},
  url          = {https://doi.org/10.1109/DDECS.2007.4295254},
  doi          = {10.1109/DDECS.2007.4295254},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ddecs/BernardiBR07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/gecco/BolzaniSSS07,
  author       = {Let{\'{\i}}cia Maria Veiras Bolzani and
                  Ernesto S{\'{a}}nchez and
                  Massimiliano Schillaci and
                  Giovanni Squillero},
  editor       = {Hod Lipson},
  title        = {Coupling {EA} and high-level metrics for the automatic generation
                  of test blocks for peripheral cores},
  booktitle    = {Genetic and Evolutionary Computation Conference, {GECCO} 2007, Proceedings,
                  London, England, UK, July 7-11, 2007},
  pages        = {1912--1919},
  publisher    = {{ACM}},
  year         = {2007},
  url          = {https://doi.org/10.1145/1276958.1277342},
  doi          = {10.1145/1276958.1277342},
  timestamp    = {Tue, 06 Nov 2018 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/gecco/BolzaniSSS07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/BernardiBR07,
  author       = {Paolo Bernardi and
                  Let{\'{\i}}cia Maria Veiras Bolzani and
                  Matteo Sonza Reorda},
  title        = {A Hybrid Approach to Fault Detection and Correction in SoCs},
  booktitle    = {13th {IEEE} International On-Line Testing Symposium {(IOLTS} 2007),
                  8-11 July 2007, Heraklion, Crete, Greece},
  pages        = {107--112},
  publisher    = {{IEEE} Computer Society},
  year         = {2007},
  url          = {https://doi.org/10.1109/IOLTS.2007.8},
  doi          = {10.1109/IOLTS.2007.8},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/iolts/BernardiBR07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/BolzaniSSRS07,
  author       = {Let{\'{\i}}cia Maria Veiras Bolzani and
                  Ernesto S{\'{a}}nchez and
                  Massimiliano Schillaci and
                  Matteo Sonza Reorda and
                  Giovanni Squillero},
  title        = {An Automated Methodology for Cogeneration of Test Blocks for Peripheral
                  Cores},
  booktitle    = {13th {IEEE} International On-Line Testing Symposium {(IOLTS} 2007),
                  8-11 July 2007, Heraklion, Crete, Greece},
  pages        = {265--270},
  publisher    = {{IEEE} Computer Society},
  year         = {2007},
  url          = {https://doi.org/10.1109/IOLTS.2007.14},
  doi          = {10.1109/IOLTS.2007.14},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/iolts/BolzaniSSRS07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/sbcci/BolzaniBR07,
  author       = {Let{\'{\i}}cia Maria Veiras Bolzani and
                  Paolo Bernardi and
                  Matteo Sonza Reorda},
  editor       = {Antonio Petraglia and
                  Volnei A. Pedroni and
                  Gert Cauwenberghs},
  title        = {An optimized hybrid approach to provide fault detection and correction
                  in SoCs},
  booktitle    = {Proceedings of the 20th Annual Symposium on Integrated Circuits and
                  Systems Design, {SBCCI} 2007, Copacabana, Rio de Janeiro, Brazil,
                  September 3-6, 2007},
  pages        = {342--347},
  publisher    = {{ACM}},
  year         = {2007},
  url          = {https://doi.org/10.1145/1284480.1284570},
  doi          = {10.1145/1284480.1284570},
  timestamp    = {Sun, 25 Jul 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/sbcci/BolzaniBR07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/sbcci/BolzaniSR07,
  author       = {Let{\'{\i}}cia Maria Veiras Bolzani and
                  Edgar E. S{\'{a}}nchez and
                  Matteo Sonza Reorda},
  editor       = {Antonio Petraglia and
                  Volnei A. Pedroni and
                  Gert Cauwenberghs},
  title        = {A software-based methodology for the generation of peripheral test
                  sets based on high-level descriptions},
  booktitle    = {Proceedings of the 20th Annual Symposium on Integrated Circuits and
                  Systems Design, {SBCCI} 2007, Copacabana, Rio de Janeiro, Brazil,
                  September 3-6, 2007},
  pages        = {348--353},
  publisher    = {{ACM}},
  year         = {2007},
  url          = {https://doi.org/10.1145/1284480.1284571},
  doi          = {10.1145/1284480.1284571},
  timestamp    = {Sun, 02 Jun 2019 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/sbcci/BolzaniSR07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/BernardiBRRVV06,
  author       = {Paolo Bernardi and
                  Let{\'{\i}}cia Maria Veiras Bolzani and
                  Maurizio Rebaudengo and
                  Matteo Sonza Reorda and
                  Fabian Vargas and
                  Massimo Violante},
  title        = {A New Hybrid Fault Detection Technique for Systems-on-a-Chip},
  journal      = {{IEEE} Trans. Computers},
  volume       = {55},
  number       = {2},
  pages        = {185--198},
  year         = {2006},
  url          = {https://doi.org/10.1109/TC.2006.15},
  doi          = {10.1109/TC.2006.15},
  timestamp    = {Fri, 03 Sep 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tc/BernardiBRRVV06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/mtv/BernardiBMOVR06,
  author       = {Paolo Bernardi and
                  Let{\'{\i}}cia Maria Veiras Bolzani and
                  Alberto Manzone and
                  Massimo Osella and
                  Massimo Violante and
                  Matteo Sonza Reorda},
  editor       = {Magdy S. Abadir and
                  Li{-}C. Wang and
                  Jayanta Bhadra},
  title        = {Software-Based On-Line Test of Communication Peripherals in Processor-Based
                  Systems for Automotive Applications},
  booktitle    = {Seventh International Workshop on Microprocessor Test and Verification
                  {(MTV} 2006), Common Challenges and Solutions, 4-5 December 2006,
                  Austin, Texas, {USA}},
  pages        = {3--8},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/MTV.2006.19},
  doi          = {10.1109/MTV.2006.19},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/mtv/BernardiBMOVR06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/BernardiBRRV05,
  author       = {Paolo Bernardi and
                  Let{\'{\i}}cia Maria Veiras Bolzani and
                  Maurizio Rebaudengo and
                  Matteo Sonza Reorda and
                  Massimo Violante},
  title        = {An Integrated Approach for Increasing the Soft-Error Detection Capabilities
                  in SoCs processors},
  booktitle    = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
                  in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
  pages        = {445--453},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/DFTVS.2005.17},
  doi          = {10.1109/DFTVS.2005.17},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/BernardiBRRV05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsn/BernardiBRRVV05,
  author       = {Paolo Bernardi and
                  Let{\'{\i}}cia Maria Veiras Bolzani and
                  Maurizio Rebaudengo and
                  Matteo Sonza Reorda and
                  Fabian Vargas and
                  Massimo Violante},
  title        = {On-Line Detection of Control-Flow Errors in SoCs by Means of an Infrastructure
                  {IP} Core},
  booktitle    = {2005 International Conference on Dependable Systems and Networks {(DSN}
                  2005), 28 June - 1 July 2005, Yokohama, Japan, Proceedings},
  pages        = {50--58},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/DSN.2005.74},
  doi          = {10.1109/DSN.2005.74},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dsn/BernardiBRRVV05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/BolzaniRRVV04,
  author       = {Let{\'{\i}}cia Maria Veiras Bolzani and
                  Maurizio Rebaudengo and
                  Matteo Sonza Reorda and
                  Fabian Vargas and
                  Massimo Violante},
  title        = {Hybrid Soft Error Detection by Means of Infrastructure {IP} Cores},
  booktitle    = {10th {IEEE} International On-Line Testing Symposium {(IOLTS} 2004),
                  12-14 July 2004, Funchal, Madeira Island, Portugal},
  pages        = {79--88},
  publisher    = {{IEEE} Computer Society},
  year         = {2004},
  url          = {https://doi.ieeecomputersociety.org/10.1109/IOLTS.2004.25},
  doi          = {10.1109/IOLTS.2004.25},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/iolts/BolzaniRRVV04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/VargasBPBRR03,
  author       = {Fabian Vargas and
                  Diogo B. Brum and
                  D{\'{a}}rcio Prestes and
                  Let{\'{\i}}cia Maria Veiras Bolzani and
                  Eduardo Luis Rhod and
                  Matteo Sonza Reorda},
  title        = {Introducing SW-Based Fault Handling Mechanisms to Cope with {EMI}
                  in Embedded Electronics: Are They {A} Good Remedy?},
  booktitle    = {9th {IEEE} International On-Line Testing Symposium {(IOLTS} 2003),
                  7-9 July 2003, Kos Island, Greece},
  pages        = {163},
  publisher    = {{IEEE} Computer Society},
  year         = {2003},
  url          = {https://doi.ieeecomputersociety.org/10.1109/OLT.2003.1214389},
  doi          = {10.1109/OLT.2003.1214389},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/iolts/VargasBPBRR03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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