BibTeX records: Sang H. Baeg

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@article{DBLP:journals/mr/LiCNCWLCKSGBWW18,
  author       = {Yuanqing Li and
                  Li Chen and
                  Issam Nofal and
                  Mo Chen and
                  Haibin Wang and
                  Rui Liu and
                  Qingyu Chen and
                  Milos Krstic and
                  Shuting Shi and
                  Gang Guo and
                  Sang H. Baeg and
                  Shi{-}Jie Wen and
                  Richard Wong},
  title        = {Modeling and analysis of single-event transient sensitivity of a 65{\unicode{8239}}nm
                  clock tree},
  journal      = {Microelectron. Reliab.},
  volume       = {87},
  pages        = {24--32},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.05.016},
  doi          = {10.1016/J.MICROREL.2018.05.016},
  timestamp    = {Mon, 05 Feb 2024 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LiCNCWLCKSGBWW18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/WangDWNCSSBLGCB18,
  author       = {Haibin Wang and
                  Xixi Dai and
                  Yangsheng Wang and
                  Issam Nofal and
                  Li Cai and
                  Zicai Shen and
                  Wanxiu Sun and
                  Jinshun Bi and
                  Bo Li and
                  Gang Guo and
                  Li Chen and
                  Sang H. Baeg},
  title        = {A single event upset tolerant latch design},
  journal      = {Microelectron. Reliab.},
  volume       = {88-90},
  pages        = {909--913},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.07.019},
  doi          = {10.1016/J.MICROREL.2018.07.019},
  timestamp    = {Wed, 26 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/WangDWNCSSBLGCB18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/iolts/NofalEHGLCLWCBW17,
  author       = {Issam Nofal and
                  Adrian Evans and
                  Anlin He and
                  Gang Guo and
                  Yuanqing Li and
                  Li Chen and
                  Rui Liu and
                  Haibin Wang and
                  Mo Chen and
                  Sang H. Baeg and
                  Shi{-}Jie Wen and
                  Richard Wong},
  title        = {{BPPT} - Bulk potential protection technique for hardened sequentials},
  booktitle    = {23rd {IEEE} International Symposium on On-Line Testing and Robust
                  System Design, {IOLTS} 2017, Thessaloniki, Greece, July 3-5, 2017},
  pages        = {28--32},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/IOLTS.2017.8046194},
  doi          = {10.1109/IOLTS.2017.8046194},
  timestamp    = {Wed, 26 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/iolts/NofalEHGLCLWCBW17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/JunCB04,
  author       = {Hong Shin Jun and
                  Sung Soo Chung and
                  Sang H. Baeg},
  title        = {Removing {JTAG} Bottlenecks in System Interconnect Test},
  booktitle    = {Proceedings 2004 International Test Conference {(ITC} 2004), October
                  26-28, 2004, Charlotte, NC, {USA}},
  pages        = {173--180},
  publisher    = {{IEEE} Computer Society},
  year         = {2004},
  url          = {https://doi.org/10.1109/TEST.2004.1386950},
  doi          = {10.1109/TEST.2004.1386950},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/JunCB04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}