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Luca Guerrazzi

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1990 – 1999

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1996
[c2]
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Roberto Bevacqua, Luca Guerrazzi, Franco Fummi:
SCAN/BIST Techniques for Decreasing Test Storage and their implications to Test Pattern Generation. EUROMICRO 1996: 351-
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Roberto Bevacqua, Luca Guerrazzi, Fabrizio Ferrandi, Franco Fummi:
Implicit Test Sequences Compaction for Decreasing Test Application Cos. ICCD 1996: 384-382

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