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2020 – today
- 2024
[j5]Sungmin Kang
, Gabin An, Shin Yoo:
A Quantitative and Qualitative Evaluation of LLM-Based Explainable Fault Localization. Proc. ACM Softw. Eng. 1(FSE): 1424-1446 (2024)- [j4]William B. Langdon, Gabin An, Aymeric Blot, Vesna Nowack, Justyna Petke, Shin Yoo, Oliver Krauss, Erik M. Fredericks, Daniel Blackwell:
The 13th International Workshop on Genetic Improvement(GI @ ICSE 2024). ACM SIGSOFT Softw. Eng. Notes 49(3): 42-50 (2024) - 2023
- [j3]Jinhan Kim, Gabin An, Robert Feldt, Shin Yoo:
Learning test-mutant relationship for accurate fault localisation. Inf. Softw. Technol. 162: 107272 (2023) - [j2]William B. Langdon, Vesna Nowack, Justyna Petke, Markus Wagner, Hyeonseok Lee, Erik M. Fredericks, Gabin An, Aymeric Blot:
Genetic Improvement @ ICSE 2023. ACM SIGSOFT Softw. Eng. Notes 48(4): 51-59 (2023) - [c10]Gabin An, Jingun Hong, Naryeong Kim, Shin Yoo:
Fonte: Finding Bug Inducing Commits from Failures. ICSE 2023: 589-601 - [c9]Gabin An, Minhyuk Kwon, Kyunghwa Choi, Jooyong Yi, Shin Yoo:
BUGSC++: A Highly Usable Real World Defect Benchmark for C/C++. ASE 2023: 2034-2037 - [i9]Jinhan Kim, Gabin An, Robert Feldt, Shin Yoo:
Learning Test-Mutant Relationship for Accurate Fault Localisation. CoRR abs/2306.02319 (2023) - [i8]Sungmin Kang, Gabin An, Shin Yoo:
A Preliminary Evaluation of LLM-Based Fault Localization. CoRR abs/2308.05487 (2023) - [i7]Gabin An, Juyeon Yoon, Thomas Bach, Jingun Hong, Shin Yoo:
Just-in-Time Flaky Test Detection via Abstracted Failure Symptom Matching. CoRR abs/2310.06298 (2023) - 2022
- [c8]Gabin An, Juyeon Yoon, Jeongju Sohn, Jingun Hong, Dongwon Hwang, Shin Yoo:
Automatically Identifying Shared Root Causes of Test Breakages in SAP HANA. ICSE (SEIP) 2022: 65-74 - [c7]Gabin An, Shin Yoo:
FDG: a precise measurement of fault diagnosability gain of test cases. ISSTA 2022: 14-26 - [i6]Gabin An, Jingun Hong, Naryeong Kim, Shin Yoo:
Fonte: Finding Bug Inducing Commits from Failures. CoRR abs/2212.06376 (2022) - 2021
- [c6]Jeongju Sohn, Gabin An, Jingun Hong, Dongwon Hwang, Shin Yoo:
Assisting Bug Report Assignment Using Automated Fault Localisation: An Industrial Case Study. ICST 2021: 284-294 - [c5]Jinhan Kim, Gabin An, Robert Feldt, Shin Yoo:
Ahead of Time Mutation Based Fault Localisation using Statistical Inference. ISSRE 2021: 253-263 - [c4]Gabin An, Shin Yoo:
Reducing the search space of bug inducing commits using failure coverage. ESEC/SIGSOFT FSE 2021: 1459-1462 - [c3]Gabin An, Juyeon Yoon, Shin Yoo:
Searching for Multi-fault Programs in Defects4J. SSBSE 2021: 153-158 - [i5]Gabin An, Shin Yoo:
Human-in-the-Loop Fault Localisation Using Efficient Test Prioritisation of Generated Tests. CoRR abs/2104.06641 (2021) - [i4]Gabin An, Juyeon Yoon, Joyce Jiyoung Whang, Shin Yoo:
Improving Test Distance for Failure Clustering with Hypergraph Modelling. CoRR abs/2104.10360 (2021) - [i3]Gabin An, Juyeon Yoon, Shin Yoo:
Searching for Multi-Fault Programs in Defects4J. CoRR abs/2108.04455 (2021)
2010 – 2019
- 2019
- [j1]William B. Langdon, Westley Weimer, Christopher Steven Timperley, Oliver Krauss, Zhen Yu Ding, Yiwei Lyu, Nicolas Chausseau, Eric M. Schulte, Shin Hwei Tan, Kevin Leach, Yu Huang, Gabin An:
The State and Future of Genetic Improvement. ACM SIGSOFT Softw. Eng. Notes 44(3): 25-29 (2019) - [c2]Gabin An, Aymeric Blot, Justyna Petke, Shin Yoo:
PyGGI 2.0: language independent genetic improvement framework. ESEC/SIGSOFT FSE 2019: 1100-1104 - [i2]Jinhan Kim, Gabin An, Robert Feldt, Shin Yoo:
Amortising the Cost of Mutation Based Fault Localisation using Statistical Inference. CoRR abs/1902.09729 (2019) - [i1]William B. Langdon, Westley Weimer, Christopher Steven Timperley, Oliver Krauss, Zhen Yu Ding, Yiwei Lyu, Nicolas Chausseau, Eric M. Schulte, Shin Hwei Tan, Kevin Leach, Yu Huang, Gabin An:
The State and Future of Genetic Improvement. CoRR abs/1907.03773 (2019) - 2018
- [c1]Gabin An, Jinhan Kim, Shin Yoo:
Comparing line and AST granularity level for program repair using PyGGI. GI@ICSE 2018: 19-26
Coauthor Index
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