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ORCIDIEEE Transactions on Reliability, Volume 73
Volume 73, Number 1, March 2024
- Jason Rupe
, Phil Laplante, Shiuhpyng Winston Shieh:
Guest Editorial Celebrating 75 Years of Excellence: The Enduring Legacy and Future Outlook of the IEEE Reliability Society. 3-6 - Zhaojun Steven Li:
Editorial Celebrating Over 70 Years of Excellence in Reliability Engineering. 7 - Phillip A. Laplante:
The Ten Most Cited Papers From IEEE Transactions on Reliability. 12-14 - Phillip A. Laplante:
A History of Editorship of the IEEE Transactions on Reliability. 15-16 - Kishor S. Trivedi:
Reliability and Availability Assessment. 17-18 - Mohammad Modarres:
Probabilistic Physics of Failure Concept and Its Application in Reliability Engineering. 19-20 - Wayne B. Nelson:
Advances in Accelerated Life Tests With Step and Varying Stress. 21-30 - Andrew K. S. Jardine:
Vibration Monitoring in Industry: Then and Now. 31-32 - Haitao Liao:
Accelerated Testing and Smart Maintenance: History and Future. 33-37 - Hoang Pham:
Mathematical Maintenance Theory: A Historical Perspective. 38-40 - Enrico Zio:
Prognostics and Health Management Methods for Reliability Prediction and Predictive Maintenance. 41 - Yao Cheng, Haitao Liao, Elsayed A. Elsayed:
From Reliability to Resilience: More Than Just Taking One Step Further. 42-46 - Kailash C. Kapur:
Advances Beyond Binary States [Success/Failure] to Multistate and Fuzzy Sets and Customer-Focused Cumulative Experience Dynamic Models. 47-48 - David W. Coit:
History of System Reliability Optimization. 49 - Enrico Zio:
Reliability Optimization. 50 - Gregory Levitin, Liudong Xing:
Mission Aborting Policies and Multiattempt Missions. 51-52 - Ning Zhang, Yanghao Yu, Chen Fang, Yun Su, Chongqing Kang:
Power System Adequacy With Variable Resources: A Capacity Credit Perspective. 53-58 - Zhaojun Steven Li, Gongyu Wu, Rocco Cassandro, Huimin Wang:
A Review of Resilience Metrics and Modeling Methods for Cyber-Physical Power Systems (CPPS). 59-66 - Kishor S. Trivedi, Michael Grottke, Javier Alonso Lopez:
Rethinking Software Fault Tolerance. 67-72 - Shiuhpyng Winston Shieh, Jeffrey M. Voas, Phil Laplante, Jason Rupe, Christian K. Hansen, Yu-Sung Wu, Yi-Ting Chen, Chi-Yu Li, Kai-Chiang Wu:
Reliability Engineering in a Time of Rapidly Converging Technologies. 73-82 - D. Richard Kuhn:
Challenges of Assured Autonomy. 83-84 - Shanhsin Lee, Mengru Tsai, Shiuhpyng Winston Shieh:
The Game of Spear and Shield in Next Era of Cybersecurity. 85-92 - Mengru Tsai, Shanhsin Lee, Shiuhpyng Winston Shieh:
Strategy for Implementing of Zero Trust Architecture. 93-100 - Fabian Winkel, Johannes Deuse-Kleinsteuber, Joachim Böcker:
Run-to-Failure Relay Dataset for Predictive Maintenance Research With Machine Learning. 101-114 - Li Yang, Yi Chen, Xiaobing Ma, Qingan Qiu, Rui Peng:
A Prognosis-Centered Intelligent Maintenance Optimization Framework Under Uncertain Failure Threshold. 115-130 - Yaqian Hao, Xiaoyan Zhu, Way Kuo:
Optimization of Condition-Based Maintenance With Multiple Times of Component Reallocation Using Markov Decision Process. 131-141 - Wenqiang Zheng, Hanxiao Zhang, Yan-Fu Li:
A Systematic Approach to the High-Level Maintenance Scheduling for High-Speed Trains in China. 142-155 - Luiz Desuó Neto, Matheus de Souza Sant'Anna Fogliatto, Henrique de Oliveira Caetano, Benvindo R. Pereira Júnior, João Bosco A. London Jr., Carlos Dias Maciel:
A Multilayer System and Optimization Framework for Team Dispatch Towards Service Recovery. 156-169 - Kaigan Zhang, Tangbin Xia, Guojin Si, Nagi Gebraeel, Dong Wang, Ershun Pan, Lifeng Xi:
A Collaborative Scheduling Algorithm for Real-Time Production and Opportunistic Maintenance Under Cloud Manufacturing Paradigm. 170-185 - Tianyuan Hu, Bixin Li, Zhenyu Pan, Chen Qian:
Detect Defects of Solidity Smart Contract Based on the Knowledge Graph. 186-202 - Peijin Cong, Junlong Zhou, Jiali Wang, Zebin Wu, Shiyan Hu:
Learning-Based Cloud Server Configuration for Energy Minimization Under Reliability Constraint. 203-215 - Dibo Xian, Xuetao Wei:
SC-Chef: Turboboosting Smart Contract Concurrent Execution for High Contention Workloads via Chopping Transactions. 216-229 - Kun Cao, Jian Weng, Keqin Li:
Reliability-Driven End-End-Edge Collaboration for Energy Minimization in Large-Scale Cyber-Physical Systems. 230-244 - Xiangxing Kong, Zhigang Lu, Xiaoqiang Guo, Jiangfeng Zhang, Huifeng Li:
Resilience Evaluation of Cyber-Physical Power System Considering Cyber Attacks. 245-256 - Eminjan Sabir, Jianxi Fan, Jixiang Meng, Baolei Cheng:
Structure Fault-Tolerant Hamiltonian Cycle and Path Embeddings in Bipartite $k$-Ary $n$-Cube Networks. 257-269 - Hong Zhang, Shuming Zhou, Eddie Cheng, Sun-Yuan Hsieh:
Characterization of Cyclic Diagnosability of Regular Diagnosable Networks. 270-278 - Yanze Huang, Limei Lin, Li Xu, Sun-Yuan Hsieh:
Probabilistic Reliability via Subsystem Structures of Arrangement Graph Networks. 279-289 - Zilong Feng, Hiroyuki Okamura, Tadashi Dohi, Won Young Yun:
Reliability Computing Methods of Probabilistic Location Set Covering Problem Considering Wireless Network Applications. 290-303 - Peng Cheng, Shuping He, Weidong Zhang:
A Genetic Algorithm-Assisted Fault Detection Observer for Networked Systems Under Denial-of-Service Attacks. 304-316 - Yubo Shao, Xiao He, Bangcheng Zhang, Chao Cheng, Xiaopeng Xi:
ES-DLSSVM-Based Prognostics of Rolling Element Bearings. 317-327 - Tangfan Xiahou, Fu Wang, Yu Liu, Qiang Zhang:
Bayesian Dual-Input-Channel LSTM-Based Prognostics: Toward Uncertainty Quantification Under Varying Future Operations. 328-343 - Thomas Christen, Felipe Macedo:
Theory of Fokker-Planck Equations for Reliability and Remaining Useful Lifetime Prognostics. 344-356 - Tongtong Yan, Dong Wang, Tangbin Xia, Lifeng Xi:
Novel Anchor Discrimination Learning for Physics-Informed Machine Degradation Modeling. 357-369 - Kaixuan Feng, Zhenzhou Lu, Nan Ye, Pengfei He, Ying Dai:
Two-Phase Adaptive Kriging Model Based Importance Sampling Method for Estimating Time-Dependent Failure Probability. 370-383 - Chih-Hsiang Ho, Sung Keun Koo, Moinak Bhaduri, Libo Zhou:
A Cocktail of Bidirectional Tests for Power Symmetry and Repairable System Reliability. 384-398 - Shirong Zhou, Ancha Xu, Yincai Tang, Lijuan Shen:
Fast Bayesian Inference of Reparameterized Gamma Process With Random Effects. 399-412 - Silvia Tolo, John D. Andrews:
Fault Tree Analysis Including Component Dependencies. 413-421 - Nand Kumar Jyotish, Lalit Kumar Singh, Chiranjeev Kumar, Pooja Singh:
Reliability and Performance Evaluation of Safety-Critical Instrumentation and Control Systems of Nuclear Power Plant. 422-437 - Seokhyun Chung, Raed Al Kontar:
Federated Condition Monitoring Signal Prediction With Improved Generalization. 438-450 - Kento Yamada, Harumi Ikeshita, Yuta Kyoya, Makoto Ueno:
Probabilistic Modeling of Variation in Pilot Performance During Flight Training. 451-462 - Nan Ye, Zhenzhou Lu, Xiaobo Zhang, Kaixuan Feng:
Metamodel-Based Directional Importance Sampling for Structural Reliability Analysis. 463-477 - Lechang Yang, Chenxing Wang, Chunyan Ling, Min Xie:
Reliability Evaluation of an Imprecise Multistate System With Mixed Uncertainty. 478-491 - Wei Ren, Jian Shuai, Yuan Mei:
Experiment-Based Reliability Analysis of Girth Welds on Different Grade Steel Pipelines. 492-505 - Weiwen Peng, Yuan Chen, Ancha Xu, Zhi-Sheng Ye:
Collaborative Online RUL Prediction of Multiple Assets With Analytically Recursive Bayesian Inference. 506-520 - Ying Chen, Yanfang Wang, Rui Kang:
Epistemic Uncertainty Propagation and Reliability Evaluation of Feedback Control System. 521-535 - Tsai-Hung Fan, Yi-Shian Dong, Chien-Yu Peng:
A Complete Bayesian Degradation Analysis Based on Inverse Gaussian Processes. 536-548 - Hongyou Zhan, Hui Liu, Ning-Cong Xiao:
Structural Expected Lifetime Estimation for Systems With Multiple Failure Modes Based on Adaptive Learning Kriging Models. 549-559 - Fode Zhang, Hon Keung Tony Ng, Lijuan Shen:
Robust Estimation and Selection for Degradation Modeling With Inhomogeneous Increments. 560-575 - Jianjie Zheng, Pengpeng Liang, Huimin Zhao, Wu Deng:
A Broad Sparse Fine-Grained Image Classification Model Based on Dictionary Selection Strategy. 576-588 - Yushuai Che, Yan Ma, Yongxiang Li, Linhan Ouyang:
A Novel Active-Learning Kriging Reliability Analysis Method Based on Parallelized Sampling Considering Budget Allocation. 589-601 - Jesús Lázaro, Armando Astarloa, Aitzol Zuloaga, José Ángel Araujo, Jaime Jiménez:
AXI Lite Redundant On-Chip Bus Interconnect for High Reliability Systems. 602-607 - Chen Yang, Wanze Lu, Yuanqing Xia:
Positioning Accuracy Analysis of Industrial Robots Based on Non-Probabilistic Time-Dependent Reliability. 608-621 - Chen Wei, Xiaole Cui, Xiaoxin Cui:
Dy-MFNS-CAC: An Encoding Mechanism to Suppress the Crosstalk and Repair the Hard Faults in Rectangular TSV Arrays. 622-636 - Yuxia Xie, Kai Yang:
Log Anomaly Detection by Adversarial Autoencoders With Graph Feature Fusion. 637-649 - Yuqi Cai, Yihai He, Rui Shi, Jiayang Li:
A Mission-Reliability-Oriented Health Prognosis Approach for Manufacturing Systems Considering Operational Uncertainty. 650-663 - Zhanyu Yang, Lu Lu, Quanyi Zou:
Ensemble Kernel-Mapping-Based Ranking Support Vector Machine for Software Defect Prediction. 664-679 - Wei-Chun Su, Chin-Yu Huang:
Application of Weighted Combinations of Activation Functions to Defect Prediction in Software Development. 680-694 - Dong Liu, He Jiang, Shikai Guo, Yuting Chen, Lei Qiao:
What's Wrong With Low-Code Development Platforms? An Empirical Study of Low-Code Development Platform Bugs. 695-709 - Aman Omer, Santosh Singh Rathore, Sandeep Kumar:
ME-SFP: A Mixture-of-Experts-Based Approach for Software Fault Prediction. 710-725 - Rakesh Kumar, Amrita Chaturvedi:
Software Bug Prediction Using Reward-Based Weighted Majority Voting Ensemble Technique. 726-740 - Yujie Ren, Bin Liu, Shihai Wang:
Joint Instance and Feature Adaptation for Heterogeneous Defect Prediction. 741-756 - Haojun Zhao, Yueming Wu, Deqing Zou, Hai Jin:
An Empirical Study on Android Malware Characterization by Social Network Analysis. 757-770 - Dimitris Agiakatsikas, Nikos Foutris, Aitzan Sari, Vasileios Vlagkoulis, Ioanna Souvatzoglou, Mihalis Psarakis, Ruiqi Ye, John Goodacre, Mikel Luján, Maria Kastriotou, Carlo Cazzaniga, Chris Frost:
Single Event Effects Assessment of UltraScale+ MPSoC Systems Under Atmospheric Radiation. 771-783 - Siang Miang Yeo, Ho Kwang Yow, Keat Hoe Yeoh, Siti Nur Farhana Mohamad Azenal:
Elimination of Die-Pop Defect by Vacuum Reflow for Ultrathin Die With Warpage in Semiconductor Packaging Assembly. 784-791 - Yiming He, Weiming Shen:
MSiT: A Cross-Machine Fault Diagnosis Model for Machine-Level CNC Spindle Motors. 792-802
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