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ORCIDIEEE Transactions on Reliability, Volume 58
Volume 58, Number 1, March 2009
- Fulya Altiparmak
, Berna Dengiz, Alice E. Smith:
A General Neural Network Model for Estimating Telecommunications Network Reliability. 2-9 - Liudong Xing, Akhilesh Shrestha, Leila Meshkat, Wendai Wang:
Incorporating Common-Cause Failures Into the Modular Hierarchical Systems Analysis. 10-19 - Paolo Lollini, Andrea Bondavalli, Felicita Di Giandomenico:
A Decomposition-Based Modeling Framework for Complex Systems. 20-33 - Yi-Kuei Lin:
System Reliability Evaluation for a Multistate Supply Chain Network With Failure Nodes Using Minimal Paths. 34-40 - Juan Eloy Ruiz-Castro, Gemma Fernández-Villodre, Rafael Pérez-Ocón:
Discrete Repairable Systems With External and Internal Failures Under Phase-Type Distributions. 41-52 - Yuchang Mo:
Variable Ordering to Improve BDD Analysis of Phased-Mission Systems With Multimode Failures. 53-57 - Gregory Levitin, Kjell Hausken:
Redundancy vs. Protection vs. False Targets for Systems Under Attack. 58-68 - Christophe Simon, Philippe Weber:
Evidential Networks for Reliability Analysis and Performance Evaluation of Systems With Imprecise Knowledge. 69-87 - Suprasad V. Amari, M. J. Zuo, G. Dill:
A Fast and Robust Reliability Evaluation Algorithm for Generalized Multi-State k -out-of- n Systems. 88-97 - Hao Peng, Qianmei Feng, David W. Coit:
Simultaneous Quality and Reliability Optimization for Microengines Subject to Degradation. 98-105 - Nagi Gebraeel, Alaa Elwany, Jing Pan:
Residual Life Predictions in the Absence of Prior Degradation Knowledge. 106-117 - Hong-Zhong Huang, Zong-Wen An:
A Discrete Stress-Strength Interference Model With Stress Dependent Strength. 118-122 - Enrico Zio, Andrea Zoia:
Parameter Identification in Degradation Modeling by Reversible-Jump Markov Chain Monte Carlo. 123-131 - Narayanaswamy Balakrishnan, Eric Beutner, Maria Kateri:
Order Restricted Inference for Exponential Step-Stress Models. 132-142 - Thierry Duchesne, Fouad Marri:
General Distributional Properties of Discounted Warranty Costs With Risk Adjustment Under Minimal Repair. 143-151 - Pierre Guiraud, Víctor Leiva, Raúl Fierro:
A Non-Central Version of the Birnbaum-Saunders Distribution for Reliability Analysis. 152-160 - Félix Belzunce, Eva-María Ortega, José-María Ruiz:
Aging Properties of a Discrete-Time Failure and Repair Model. 161-171 - Eva-María Ortega:
A Note on Some Functional Relationships Involving the Mean Inactivity Time Order. 172-178 - Tsong Yueh Chen, Fei-Ching Kuo, Huai Liu:
Application of a Failure Driven Test Profile in Random Testing. 179-192 - Juan Antonio Maestro, Pedro Reviriego:
Reliability of Single-Error Correction Protected Memories. 193-201
Volume 58, Number 2, June 2009
- Eli Dolev:
Introduction to the Special Section on Prognostics and Health Management. 262-263 - Leoncio D. Lopez, Michael G. Pecht:
Modeling of IC Socket Contact Resistance for Reliability and Health Monitoring Applications. 264-270 - Nishad Patil, Jose Celaya, Diganta Das, Kai Goebel, Michael G. Pecht:
Precursor Parameter Identification for Insulated Gate Bipolar Transistor (IGBT) Prognostics. 271-276 - Flavien Peysson, Mustapha Ouladsine, Rachid Outbib, Jean-Baptiste Léger, Olivier Myx, Claude Allemand:
A Generic Prognostic Methodology Using Damage Trajectory Models. 277-285 - Yilu Zhang, Gary W. Gantt, Mark J. Rychlinski, Ryan M. Edwards, John J. Correia, Calvin E. Wolf:
Connected Vehicle Diagnostics and Prognostics, Concept, and Initial Practice. 286-294 - Jeffery C. Chan, Peter W. Tse:
A Novel, Fast, Reliable Data Transmission Algorithm for Wireless Machine Health Monitoring. 295-304 - Kiri Feldman, Taoufik Jazouli, Peter Sandborn:
A Methodology for Determining the Return on Investment Associated With Prognostics and Health Management. 305-316 - Xiaoping Zhou, Guoxiao Yang:
Using Extended R-Impact to Assess Journal Influence. 317-323 - Jinhui Pang, Xian Zhao:
Relative R-Impact Based on Normalization Method. 324-327 - Pooja Mohan, Manju Agarwal, Kanwar Sen:
Combined m -Consecutive- k -Out-of- n: F & Consecutive kc -Out-of- n: F Systems. 328-337 - Ahmad R. Sharafat, Omid Reza Ma'rouzi:
All-Terminal Network Reliability Using Recursive Truncation Algorithm. 338-347 - Amin Ranjbar, Chadi Assi:
Availability-Aware Design in Mesh Networks With Failure-Independent Path-Protecting p -Cycles. 348-363 - Adriano Polpo, Carlos Alberto De Bragança Pereira:
Reliability Nonparametric Bayesian Estimation in Parallel Systems. 364-373 - Wei-Chang Yeh, Chien-Hsing Lin:
A Squeeze Response Surface Methodology for Finding Symbolic Network Reliability Functions. 374-382 - Xian Zhao, Lirong Cui:
On the Accelerated Scan Finite Markov Chain Imbedding Approach. 383-388 - Yeh Lam:
A Geometric Process Delta -Shock Maintenance Model. 389-396 - Shey-Huei Sheu, Chin-Chih Chang:
An Extended Periodic Imperfect Preventive Maintenance Model With Age-Dependent Failure Type. 397-405
Volume 58, Number 3, September 2009
- Jason W. Rupe:
Publication Guidelines for IEEE Transactions on Reliability, and Perhaps Everyone. 414-415 - Arabin Kumar Dey, Debasis Kundu:
Discriminating Among the Log-Normal, Weibull, and Generalized Exponential Distributions. 416-424 - Yan Shen, Loon Ching Tang, Min Xie:
A Model for Upside-Down Bathtub-Shaped Mean Residual Life and Its Properties. 425-431 - Gianpaolo Pulcini, Maurizio Guida:
Reliability Analysis of Mechanical Systems With Bounded and Bathtub Shaped Intensity Function. 432-443 - Chien-Yu Peng, Sheng-Tsaing Tseng:
Mis-Specification Analysis of Linear Degradation Models. 444-455 - Dilip Roy, Tirthankar Ghosh:
A New Discretization Approach With Application in Reliability Estimation. 456-461 - Lisa M. Maillart, C. Richard Cassady, Chase Rainwater, Kellie Schneider:
Selective Maintenance Decision-Making Over Extended Planning Horizons. 462-469 - Agapios N. Platis, Emmanouil G. Drosakis:
Coverage Modeling and Optimal Maintenance Frequency of an Automated Restoration Mechanism. 470-475 - Wei-Chang Yeh:
A Convolution Universal Generating Function Method for Evaluating the Symbolic One-to-All-Target-Subset Reliability Function of Acyclic Multi-State Information Networks. 476-484 - Mingming Lu, Feng Li, Jie Wu:
Efficient Opportunistic Routing in Utility-Based Ad Hoc Networks. 485-495 - Jong-Seok Kim, Hyeong-Ok Lee, Sung-Won Kim:
Comments on "A Class of Fault-Tolerant Multiprocessor Networks". 496-500 - Leandro dos Santos Coelho:
Self-Organizing Migrating Strategies Applied to Reliability-Redundancy Optimization of Systems. 501-510 - Joffrey Clarhaut, Vincent Cocquempot, Blaise Conrard, Said Hayat:
Optimal Design of Dependable Control System Architectures Using Temporal Sequences of Failures. 511-522 - Zhengguo Xu, Yindong Ji, Donghua Zhou:
A New Real-Time Reliability Prediction Method for Dynamic Systems Based on On-Line Fault Prediction. 523-538 - Fatih Camci:
System Maintenance Scheduling With Prognostics Information Using Genetic Algorithm. 539-552 - Alejandro D. Domínguez-García, John G. Kassakian, Joel E. Schindall:
A Generalized Fault Coverage Model for Linear Time-Invariant Systems. 553-567
Volume 58, Number 4, December 2009
- Mesbahul Alam, Kazuyuki Suzuki:
Lifetime Estimation Using Only Failure Information From Warranty Database. 573-582 - Ancha Xu, Yincai Tang:
Bayesian Analysis of Pareto Reliability With Dependent Masked Data. 583-588 - Yefim Haim Michlin, Genady Grabarnik, E. Leshchenko:
Comparison of the Mean Time Between Failures for Two Systems Under Short Tests. 589-596 - Andrew G. Glen, B. L. Foote:
An Inference Methodology for Life Tests With Complete Samples or Type-II Right Censoring. 597-603 - Guangbin Yang:
Reliability Demonstration Through Degradation Bogey Testing. 604-610 - Sheng-Tsaing Tseng, Narayanaswamy Balakrishnan, Chih-Chun Tsai:
Optimal Step-Stress Accelerated Degradation Test Plan for Gamma Degradation Processes. 611-618 - Andrew F. Tappenden, James Miller:
A Novel Evolutionary Approach for Adaptive Random Testing. 619-633 - Shuang Yang, Ji Wu, Michael G. Pecht:
Reliability Assessment of Land Grid Array Sockets Subjected to Mixed Flowing Gas Environment. 634-640 - Philip A. Scarf, Cristiano A. V. Cavalcante, Richard Dwight, Peter Gordon:
An Age-Based Inspection and Replacement Policy for Heterogeneous Components. 641-648 - Bharatendra Rai:
Warranty Spend Forecasting for Subsystem Failures Influenced by Calendar Month Seasonality. 649-657 - Rajesh Mishra, Sanjay Kumar Chaturvedi:
A Cutsets-Based Unified Framework to Evaluate Network Reliability Measures. 658-666 - Yuchang Mo:
New Insights Into the BDD-Based Reliability Analysis of Phased-Mission Systems. 667-678 - Gregory Levitin, Kjell Hausken:
Redundancy vs. Protection in Defending Parallel Systems Against Unintentional and Intentional Impacts. 679-690 - Sevcan Demir:
Reliability of Combined k-out-of-n and Consecutive kc-out-of-n Systems of Markov Dependent Components. 691-693 - Albert F. Myers:
Probability of Loss Assessment of Critical k-out-of-n: G Systems Having a Mission Abort Policy. 694-701 - Sun-Yuan Hsieh, Nai-Wen Chang:
Extended Fault-Tolerant Cycle Embedding in Faulty Hypercubes. 702-710 - Chu-Ti Lin, Chin-Yu Huang:
Staffing Level and Cost Analyses for Software Debugging Activities Through Rate-Based Simulation Approaches. 711-724
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