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ORCIDTechnometrics, Volume 60
Volume 60, Number 1, 2018
- Anh Tuan Bui, Daniel W. Apley:
A Monitoring and Diagnostic Approach for Stochastic Textured Surfaces. 1-13 - Xiaochen Xian, Andi Wang, Kaibo Liu
:
A Nonparametric Adaptive Sampling Strategy for Online Monitoring of Big Data Streams. 14-25 - Yi Yang, Teng Zhang, Hui Zou:
Flexible Expectile Regression in Reproducing Kernel Hilbert Spaces. 26-35 - Le Chang, Steven Roberts, Alan H. Welsh:
Robust Lasso Regression Using Tukey's Biweight Criterion. 36-47 - Jean Hamilton, Matthew A. Nunes, Marina I. Knight, Piotr Fryzlewicz:
Complex-Valued Wavelet Lifting and Applications. 48-60 - Xiangshun Kong, Mingyao Ai, Kwok Leung Tsui:
Design for Sequential Follow-Up Experiments in Computer Emulations. 61-69 - Yongxiang Li, Qiang Zhou, Xiaohu Huang, Li Zeng:
Pairwise Estimation of Multivariate Gaussian Process Models With Replicated Observations: Application to Multivariate Profile Monitoring. 70-78 - Weijie Shen, Dennis K. J. Lin:
A Conjugate Model for Dimensional Analysis. 79-89 - Xin Wang, Zhi-Sheng Ye, Yili Hong, Loon-Ching Tang:
Analysis of Field Return Data With Failed-But-Not-Reported Events. 90-100 - Soham Sarkar, Anil Kumar Ghosh:
Some Multivariate Tests of Independence Based on Ranks of Nearest Neighbors. 101-111 - Hongxiao Zhu, Philip Caspers, Jeffrey S. Morris, Xiaowei Wu, Rolf Müller:
A Unified Analysis of Structured Sonar-Terrain Data Using Bayesian Functional Mixed Models. 112-123
- Book Reviews. 124-132
- Corrigendum. 133
Volume 60, Number 2, 2018
- Peter J. Rousseeuw, Wannes Van Den Bossche:
Detecting Deviating Data Cells. 135-145 - Nozer D. Singpurwalla, Nicholas G. Polson, Refik Soyer:
From Least Squares to Signal Processing and Particle Filtering. 146-160 - Xin Chen, Wenhui Sheng, Xiangrong Yin:
Efficient Sparse Estimate of Sufficient Dimension Reduction in High Dimension. 161-168 - Yangyang Zang, Peihua Qiu:
Phase I Monitoring of Spatial Surface Data from 3D Printing. 169-180 - Hao Yan, Kamran Paynabar, Jianjun Shi:
Real-Time Monitoring of High-Dimensional Functional Data Streams via Spatio-Temporal Smooth Sparse Decomposition. 181-197 - Shengli Tzeng, Hsin-Cheng Huang:
Resolution Adaptive Fixed Rank Kriging. 198-208 - Matthias H. Y. Tan:
Gaussian Process Modeling of a Functional Output with Information from Boundary and Initial Conditions and Analytical Approximations. 209-221 - Yimeng Xie, Caleb B. King, Yili Hong, Qingyu Yang:
Semiparametric Models for Accelerated Destructive Degradation Test Data Analysis. 222-234 - Bing Xing Wang, Fangtao Wu:
Inference on the Gamma Distribution. 235-244 - Laura L. Tupper, David S. Matteson, C. Lindsay Anderson, Luckny Zéphyr:
Band Depth Clustering for Nonstationary Time Series and Wind Speed Behavior. 245-254 - Fang Cao, Shan Ba, William A. Brenneman, V. Roshan Joseph:
Model Calibration With Censored Data. 255-262
- Book Reviews. 263-269
- Statement of Removal. 270
- Nominations Sought for 2018 William G. Hunter Award. 271
Volume 60, Number 3, 2018
- Kevin J. Wilson, Daniel A. Henderson, John Quigley:
Emulation of Utility Functions Over a Set of Permutations: Sequencing Reliability Growth Tasks. 273-285 - Ahmed Aziz Ezzat, Arash Pourhabib, Yu Ding:
Sequential Design for Functional Calibration of Computer Models. 286-296 - Lucia N. Hernandez, Christopher J. Nachtsheim:
Fast Computation of Exact G-Optimal Designs Via Iλ-Optimality. 297-305 - EunSug Park, Philip K. Hopke, Inyoung Kim, Shuman Tan, Clifford H. Spiegelman:
Bayesian Spatial Multivariate Receptor Modeling for Multisite Multipollutant Data. 306-318 - Yuwen Gu, Jun Fan, Lingchen Kong, Shiqian Ma, Hui Zou:
ADMM for High-Dimensional Sparse Penalized Quantile Regression. 319-331 - Ali Esmaieeli Sikaroudi, David A. Welch, Taylor J. Woehl, Roland Faller, James E. Evans, Nigel D. Browning, Chiwoo Park:
Directional Statistics of Preferential Orientations of Two Shapes in Their Aggregate and Its Application to Nanoparticle Aggregation. 332-344 - Long Feng, Peihua Qiu:
Difference Detection Between Two Images for Image Monitoring. 345-359 - Yuan Wang, Yajun Mei, Kamran Paynabar:
Thresholded Multivariate Principal Component Analysis for Phase I Multichannel Profile Monitoring. 360-372 - Zimo Wang, Satish T. S. Bukkapatnam:
A Dirichlet Process Gaussian State Machine Model for Change Detection in Transient Processes. 373-385 - Peihua Qiu, Xuemin Zi, Changliang Zou:
Nonparametric Dynamic Curve Monitoring. 386-397 - Guangyu Zhu, Jiahua Chen:
Multi-Parameter One-Sided Monitoring Tests. 398-407
- Book Reviews. 408-414
Volume 60, Number 4, 2018
- Joseph Guinness:
Permutation and Grouping Methods for Sharpening Gaussian Process Approximations. 415-429 - Rajarshi Guhaniyogi, Sudipto Banerjee:
Meta-Kriging: Scalable Bayesian Modeling and Inference for Massive Spatial Datasets. 430-444 - Xueou Wang, David J. Nott, Christopher C. Drovandi, Kerrie L. Mengersen, Michael Evans:
Using History Matching for Prior Choice. 445-460
- Qingqing Zhai, Zhi-Sheng Ye:
Degradation in Common Dynamic Environments. 461-471
- I-Chen Lee, Yili Hong, Sheng-Tsaing Tseng, Tirthankar Dasgupta:
Sequential Bayesian Design for Accelerated Life Tests. 472-483
- Raed Kontar, Shiyu Zhou, Chaitanya Sankavaram, Xinyu Du, Yilu Zhang:
Nonparametric Modeling and Prognosis of Condition Monitoring Signals Using Multivariate Gaussian Convolution Processes. 484-496
- Alessandra Menafoglio, Marco Grasso, Piercesare Secchi, Bianca Maria Colosimo:
Profile Monitoring of Probability Density Functions via Simplicial Functional PCA With Application to Image Data. 497-510
- Kevin H. Lee, Lingzhou Xue:
Nonparametric Finite Mixture of Gaussian Graphical Models. 511-521
- Yicheng Kang, Partha Sarathi Mukherjee, Peihua Qiu:
Efficient Blind Image Deblurring Using Nonparametric Regression and Local Pixel Clustering. 522-531
- Arman Sabbaghi, Qiang Huang, Tirthankar Dasgupta:
Bayesian Model Building From Small Samples of Disparate Data for Capturing In-Plane Deviation in Additive Manufacturing. 532-544
- Stacey L. Culp, Kenneth Joseph Ryan, Juan Chen, Michael S. Hamada:
Analysis of Repeatability and Reproducibility Studies With Ordinal Measurements. 545-556
- Technometrics Editorial Collaborators. 557-558
- Clarification. 559
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