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ORCIDTechnometrics, Volume 51
Volume 51, Number 1, 2009
- Ying Shi, Luis A. Escobar, William Q. Meeker:
Accelerated Destructive Degradation Test Planning. 1-13 - Jerald F. Lawless, Martin Crowder, Ker-Ai Lee
:
Analysis of Reliability and Warranty Claims in Products With Age and Usage Scales. 14-24 - Hsiuying Wang, Fugee Tsung:
Tolerance Intervals With Improved Coverage Probabilities for Binomial and Poisson Variables. 25-33 - Jung Jin Cho, Yong Chen, Yu Ding:
Calculating the Breakdown Point of Sparse Linear Models. 34-46 - Carla A. Vivacqua, Søren Bisgaard:
Post-Fractionated Strip-Block Designs. 47-55 - Timothy J. Robinson, Christine M. Anderson-Cook, Michael S. Hamada:
Bayesian Analysis of Split-Plot Experiments With Nonnormal Responses for Evaluating Nonstandard Performance Criteria. 56-65 - Chen-Tuo Liao, Feng-Shun Chai:
Design and Analysis of Two-Level Factorial Experiments With Partial Replication. 66-74 - Christine M. Anderson-Cook, Connie M. Borror, Bradley Jones:
Graphical Tools for Assessing the Sensitivity of Response Surface Designs to Model Misspecification. 75-87 - Christopher M. Gotwalt, Bradley A. Jones, David M. Steinberg:
Fast Computation of Designs Robust to Parameter Uncertainty for Nonlinear Settings. 88-95
- Peter Goos, James M. Lucas:
Letter to the Editor. 96-97
Volume 51, Number 2, 2009
- David M. Steinberg:
Editor's Note: Improved Web Site With Supplemental Materials. 109
- Brian J. Reich, Curtis B. Storlie, Howard D. Bondell:
Variable Selection in Bayesian Smoothing Spline ANOVA Models: Application to Deterministic Computer Codes. 110-120 - Jeremy E. Oakley:
Decision-Theoretic Sensitivity Analysis for Complex Computer Models. 121-129 - Robert B. Gramacy, Herbert K. H. Lee:
Adaptive Design and Analysis of Supercomputer Experiments. 130-145 - William Q. Meeker, Luis A. Escobar, Yili Hong:
Using Accelerated Life Tests Results to Predict Product Field Reliability. 146-161 - Baibing Li:
A Non-Gaussian Kalman Filter With Application to the Estimation of Vehicular Speed. 162-172 - Milan Zukovic, Dionissios T. Hristopulos:
The Method of Normalized Correlations: A Fast Parameter Estimation Method for Random Processes and Isotropic Random Fields That Focuses on Short-Range Dependence. 173-185 - Yanting Li, Fugee Tsung:
False Discovery Rate-Adjusted Charting Schemes for Multistage Process Monitoring and Fault Identification. 186-205 - Max D. Morris, Brad Dilts, Stuart J. Birrell, Philip M. Dixon:
Composite Response Surface Designs for Factors With Jointly Symmetric Effects. 206-214
Volume 51, Number 3, 2009
- Haipeng Shen:
On Modeling and Forecasting Time Series of Smooth Curves. 227-238 - Ryan P. Browne, R. Jock MacKay, Stefan H. Steiner:
Two-Stage Leveraged Measurement System Assessment. 239-249 - Lulu Kang, V. Roshan Joseph:
Bayesian Optimal Single Arrays for Robust Parameter Design. 250-261 - Hongquan Xu:
Algorithmic Construction of Efficient Fractional Factorial Designs With Large Run Sizes. 262-277 - Gang Han, Thomas J. Santner, William I. Notz, Donald L. Bartel:
Prediction for Computer Experiments Having Quantitative and Qualitative Input Variables. 278-288 - Jong-Hoon Joo, Peihua Qiu:
Jump Detection in a Regression Curve and Its Derivative. 289-305 - Michael J. Brusco, Douglas L. Steinley, J. Dennis Cradit:
An Exact Algorithm for Hierarchically Well-Formulated Subsets in Second-Order Polynomial Regression. 306-315 - Jin Zhang, Michael A. Stephens:
A New and Efficient Estimation Method for the Generalized Pareto Distribution. 316-325 - Dulal K. Bhaumik, Kush Kapur, Robert D. Gibbons:
Testing Parameters of a Gamma Distribution for Small Samples. 326-334 - Sheng-Tsaing Tseng, Bo-Yan Jou:
A Technical Note on "Sample Size Determination for Achieving Stability of Double Multivariate Exponentially Weighted Moving Average Controller". 335-338
Volume 51, Number 4, 2009
- David M. Steinberg:
Editorial Announcement. 349 - David M. Steinberg:
Editor's Report. 350-352 - Maria J. Bayarri, Jim Berger, David M. Steinberg:
Special Issue on Computer Modeling. 353
- Ying Hung, V. Roshan Joseph, Shreyes N. Melkote:
Design and Analysis of Computer Experiments With Branching and Nested Factors. 354-365 - Jason L. Loeppky, Jerome Sacks, William J. Welch:
Choosing the Sample Size of a Computer Experiment: A Practical Guide. 366-376 - Jonathan A. Cumming, Michael Goldstein:
Small Sample Bayesian Designs for Complex High-Dimensional Models Based on Information Gained Using Fast Approximations. 377-388 - Matthew Taddy, Herbert K. H. Lee, Genetha A. Gray, Joshua D. Griffin:
Bayesian Guided Pattern Search for Robust Local Optimization. 389-401 - Maria J. Bayarri, James O. Berger, Eliza S. Calder, Keith Dalbey, Simon Lunagomez, Abani K. Patra, E. Bruce Pitman, Elaine T. Spiller, Robert L. Wolpert:
Using Statistical and Computer Models to Quantify Volcanic Hazards. 402-413 - Jonathan Rougier, Serge Guillas, Astrid Maute, Arthur D. Richmond:
Expert Knowledge and Multivariate Emulation: The Thermosphere-Ionosphere Electrodynamics General Circulation Model (TIE-GCM). 414-424 - Leonardo Soares Bastos, Anthony O'Hagan:
Diagnostics for Gaussian Process Emulators. 425-438 - Shuchun Wang, Wei Chen, Kwok-Leung Tsui:
Bayesian Validation of Computer Models. 439-451 - Sébastien Da Veiga, François Wahl, Fabrice Gamboa:
Local Polynomial Estimation for Sensitivity Analysis on Models With Correlated Inputs. 452-463 - Gang Han, Thomas J. Santner, Jeremy J. Rawlinson:
Simultaneous Determination of Tuning and Calibration Parameters for Computer Experiments. 464-474
- Robert Mee:
Letter to the Editor. 475-476
- Chen-Tuo Liao, Feng-Shun Chai:
Response. 477-478
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