Software Testing, Verification & Reliability, Volume 32

Volume 32, Number 1, January 2022

Editorial

• 
  Robert M. Hierons, Tao Xie:
  Model checking, testing and debugging.

Research Articles

• 
  Felipe R. Monteiro, Mikhail R. Gadelha, Lucas C. Cordeiro:
  Model checking C++ programs.
• 
  Vanya Yaneva, Ajitha Rajan, Christophe Dubach:
  GPU acceleration of finite state machine input execution: Improving scale and performance.
• 
  Zahra Sadri-Moshkenani, Justin M. Bradley, Gregg Rothermel:
  Survey on test case generation, selection and prioritization for cyber-physical systems.
• 
  Justin Chu, Tingting Yu, Jane Huffman Hayes, Xue Han, Yu Zhao:
  Effective fault localization and context-aware debugging for concurrent programs.

Volume 32, Number 2, March 2022

Editorial

• 
  Robert M. Hierons, Tao Xie:
  Combinatorial testing and model-based testing.

Research Articles

• 
  Bernhard Garn, Dominik-Philip Schreiber, Dimitris E. Simos, Rick Kuhn, Jeffrey M. Voas, Raghu Kacker:
  Combinatorial methods for testing Internet of Things smart home systems.
• 
  Robert Sachtleben, Jan Peleska:
  Effective grey-box testing with partial FSM models.

Volume 32, Number 3, May 2022

Editorial

• 
  Robert M. Hierons, Tao Xie:
  Metamorphic testing and test automation.

Research Article

• 
  Madhusudan Srinivasan, Upulee Kanewala:
  Metamorphic relation prioritization for effective regression testing.

Survey Article

• 
  Yuqing Wang, Mika V. Mäntylä, Zihao Liu, Jouni Markkula, Päivi Raulamo-Jurvanen:
  Improving test automation maturity: A multivocal literature review.

Volume 32, Number 4, June 2022

Editorials

• 
  Robert M. Hierons:
  Farewell after an 11-year journey as joint editor-in-chief.
• 
  Yves Le Traon, Tao Xie:
  Integration testing and metamorphic testing.

Research Articles

• 
  Dominik Hellhake, Justus Bogner, Tobias Schmid, Stefan Wagner:
  Towards using coupling measures to guide black-box integration testing in component-based systems.
• 
  Matt Windsor, Alastair F. Donaldson, John Wickerson:
  High-coverage metamorphic testing of concurrency support in C compilers.

Volume 32, Number 5, August 2022

Special Issue: IEEE International Conference on Software Testing, Verification and Validation (ICST 2020)
Editorial

• 
  Corina S. Pasareanu, Andreas Zeller:
  IEEE International Conference on Software Testing, Verification and Validation (ICST 2020).

Special Issue Papers

• 
  Julien Leveau, Xavier Blanc, Laurent Réveillère, Jean-Rémy Falleri, Romain Rouvoy:
  Fostering the diversity of exploratory testing in web applications.
• 
  Lucas Cabral, Breno Miranda, Igor Lima, Marcelo d'Amorim:
  RVprio: A tool for prioritizing runtime verification violations.
• 
  Davide Corradini, Amedeo Zampieri, Michele Pasqua, Emanuele Viglianisi, Michael Dallago, Mariano Ceccato:
  Automated black-box testing of nominal and error scenarios in RESTful APIs.

Volume 32, Number 6, September 2022

Editorial

• 
  Yves Le Traon, Tao Xie:
  Combinatorial testing and model checking.

Research Articles

• 
  Bernhard Garn, Jovan Zivanovic, Manuel Leithner, Dimitris E. Simos:
  Combinatorial methods for dynamic gray-box SQL injection testing.
• 
  Jingcheng Yuan, Toshiaki Aoki, Xiaoyun Guo:
  Comprehensive evaluation of file systems robustness with SPIN model checking.

Volume 32, Number 7, November 2022

Special Issue: Mutation Analysis and its Industrial Applications - Part I
Editorial

• 
  Rahul Gopinath, Jie M. Zhang, Marinos Kintis, Mike Papadakis:
  Mutation analysis and its industrial applications.

Special Issue Papers

• 
  Manar H. Alalfi, Sajeda Parveen, Bara' Nazzal:
  A mutation framework for evaluating security analysis tools in IoT applications.
• 
  Khaled El-Fakih, Ayman Alzaatreh, Uraz Cengiz Türker:
  Assessing test suites of extended finite state machines against model- and code-based faults.
• 
  Yunho Kim, Shin Hong:
  Learning-based mutant reduction using fine-grained mutation operators.

Volume 32, Number 8, December 2022

Special Issue: Mutation Analysis and its Industrial Applications - Part II
Editorial

• 
  Rahul Gopinath, Jie M. Zhang, Marinos Kintis, Mike Papadakis:
  Mutation analysis and its industrial applications.

Special Issue Papers

• 
  Jong-In Jang, Duksan Ryu, Jongmoon Baik:
  HOTFUZ: Cost-effective higher-order mutation-based fault localization.
• 
  Lingjun Liu, Eunkyoung Jee, Doo-Hwan Bae:
  MuFBDTester: A mutation-based test sequence generator for FBD programs implementing nuclear power plant software.
• 
  João Batista de Souza Neto, Anamaria Martins Moreira, Genoveva Vargas-Solar, Martin A. Musicante:
  TRANSMUT-Spark: Transformation mutation for Apache Spark.
• 
  Henrique Neves da Silva, Jackson A. Prado Lima, Silvia Regina Vergilio, André Takeshi Endo:
  A mapping study on mutation testing for mobile applications.