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ORCIDQuality and Reliability Engineering International, Volume 28
Volume 28, Number 1, February 2012
- Yanjing Ou, Di Wen, Zhang Wu, Michael B. C. Khoo
:
A comparison study on effectiveness and robustness of control charts for monitoring process mean and variance. 3-17 - Ying Zhang, Philippe Castagliola, Zhang Wu, Michael B. C. Khoo:
The variable sampling interval X̄ chart with estimated parameters. 19-34 - Wenny Chandra, Dennis K. J. Lin:
Parameter calibration and inadequacy modeling in a computer experiment. 35-46 - Tashi P. Erdmann, Jeroen de Mast:
Assessment of binary inspection with a hybrid measurand. 47-57 - Kimberly F. Sellers:
A generalized statistical control chart for over- or under-dispersed data. 59-65 - Haifeng Li, Min Zeng, Minyan Lu, Xuan Hu, Zhen Li:
Adaboosting-based dynamic weighted combination of software reliability growth models. 67-84 - Francesco Zammori, Roberto Gabbrielli:
ANP/RPN: a multi criteria evaluation of the Risk Priority Number. 85-104 - P. C. Wang, R. Dennis Cook:
Analysis and efficient 2k - 1 designs for experiments in blocks of size two. 105-113
- John S. Lawson, Sheldon Henderson, Jenifer Peterson:
Model-robust choice experiments: discussion and case study. 115-122
- Y. H. Dovoedo, Subha Chakraborti:
Boxplot-based phase I control charts for time between events. 123-130
Volume 28, Number 2, March 2012
- Shashibhushan B. Mahadik:
Variable sampling interval hotelling's T2 charts with runs rules for switching between sampling interval lengths. 131-140 - Isis Didier Lins, Márcio das Chagas Moura, Enrico Zio, Enrique López Droguett:
A particle swarm-optimized support vector machine for reliability prediction. 141-158 - Giovanni Celano, Philippe Castagliola, Enrico Trovato, Sergio Fichera:
The economic performance of the Shewhart t chart. 159-180 - Shuguang He, Wandi Huang, William H. Woodall:
CUSUM charts for monitoring a zero-inflated poisson process. 181-192 - S. K. Khilare, Digambar T. Shirke:
Nonparametric Synthetic Control Charts for Process Variation. 193-202 - Gracia Toubia-Stucky, Haitao Liao, Janet M. Twomey:
A Sequential Bayesian Cumulative Conformance Count Approach to Deterioration Detection in High Yield Processes. 203-214 - Yan Li, Xiaolong Pu:
On the Performance of Two-sided Control Charts for Short Production Runs. 215-232 - Francis G. Pascual, Shuo Li:
Monitoring the Weibull Shape Parameter by Control Charts for the Sample Range of Type II Censored Data. 233-246
Volume 28, Number 3, April 2012
- Gregory L. Boylan, Byung Rae Cho:
The Normal Probability Plot as a Tool for Understanding Data: A Shape Analysis from the Perspective of Skewness, Kurtosis, and Variability. 249-264 - Jihong Yan, Dingguo Hua, Xing Wang, Xin Li:
Sustainable Manufacturing Oriented Prognosis for Facility Reuse Combining ANN and Reliability. 265-277 - Saddam Akber Abbasi, Arden Miller:
On Proper Choice of Variability Control Chart for Normal and Non-normal Processes. 279-296 - Hong-Zhong Huang, Hua Zhang, Yanfeng Li:
A New Ordering Method of Basic Events in Fault Tree Analysis. 297-305 - Chin-Sen Lin, Sunny Kao, Long-Sheng Chen:
A Proactive Operational Framework for Business Continuity in the Semiconductor Industry. 307-320 - Zhiguo Li, Shiyu Zhou, Crispian Sievenpiper, Suresh Choubey:
Statistical Monitoring of Time-to-Failure Data Using Rank Tests. 321-333 - Amitava Mukherjee, Subha Chakraborti:
A Distribution-free Control Chart for the Joint Monitoring of Location and Scale. 335-352 - Jinsuk Lee, Rong Pan:
Bayesian Analysis of Step-Stress Accelerated Life Test with Exponential Distribution. 353-361
- Hadjadj Aoul Elias, Abdelaziz Lakehal:
Combined Anomalies Prediction Using the Bayesian Theory. 363-367
Volume 28, Number 4, June 2012
- K. K. Jose, Jane A. Luke:
Confidence Intervals for Process Capability Indices for the Unbalanced One-Way Random Effect ANOVA Model. 371-375 - Su-Fen Yang, Tsung-Chi Cheng, Ying-Chao Hung, Smiley W. Cheng:
A New Chart for Monitoring Service Process Mean. 377-386 - Michelle Mancenido, Erniel B. Barrios:
An AR-Sieve Bootstrap Control Chart for Autocorrelated Process Data. 387-395 - Shervin Asadzadeh, Abdollah Aghaie:
Improving the Product Reliability in Multistage Manufacturing and Service Operations. 397-407 - Chia-Ling Yen, Jyh-Jen Horng Shiau, Arthur B. Yeh:
Effective Control Charts for Monitoring Multivariate Process Dispersion. 409-426 - Yi-Hai He, Kai Mi, Chunhui Wu:
A New Statistical High-Quality Process Monitoring Method: The Counted Number Between Omega-Event Control Charts. 427-436 - Rassoul Noorossana, Shekary A. Maryam:
Monitoring Two Dependent Process Steps Using Special Variable Sample Sizes and Sampling Intervals Cause-Selecting Control Charts. 437-453 - Haisong Deng, Wenze Shao, Yizhong Ma, Zhuihui Wei:
Bayesian Metamodeling for Computer Experiments Using the Gaussian Kriging Models. 455-466 - Michael Perakis, Evdokia Xekalaki:
On the Implementation of the Principal Component Analysis-Based Approach in Measuring Process Capability. 467-480
- Ingrid Tano, Kerstin Vännman:
Comparing Confidence Intervals for Multivariate Process Capability Indices. 481-495
Volume 28, Number 5, July 2012
- Alessandro Di Bucchianico, Henry P. Wynn:
The ENBIS-11 Quality and Reliability Engineering International Special Issue. 498-499 - Ron S. Kenett, Moshe Pollak:
On Assessing the Performance of Sequential Procedures for Detecting a Change. 500-507 - Véronique M. Gomes, Ana C. Pereira, Pedro M. Saraiva, Marco S. Reis:
Development of Generalized Platforms for the Analysis of Complex Datasets. 508-523 - John Sheil, Dermot Hale:
The 'Democratisation' of Statistics: Parastatisticians in Manufacturing. 524-534 - Iain Reid, J. Smyth-Renshaw:
Exploring the Fundamentals of Root Cause Analysis: Are We Asking the Right Questions in Defining the Problem? 535-545 - Rainer Göb, David Baillie:
Sampling for Nonconformities and Other Issues in the Forthcoming Revision of ISO 2859-2. 546-562 - Lluís Marco-Almagro, Xavier Tort-Martorell:
Statistical Methods in Kansei Engineering: a Case of Statistical Engineering. 563-573
Volume 28, Number 6, October 2012
- B. Alkali:
Evaluation of Generalised Proportional Intensities Models with Application to the Maintenance of Gas Turbines. 577-584
- Adiel Teixeira de Almeida:
Multicriteria Model for Selection of Preventive Maintenance Intervals. 585-593 - Majid Bazrafshan, Tayebeh Hajjari:
Diagnosing Maintenance System Problems: Theory and a Case Study. 594-603 - Stuart A. Bell, David F. Percy:
Modelling Uncertainty in Preventive Maintenance Scheduling. 604-615 - Richard L. Bovey, E. T. Senalp:
Suggesting and Justifying Model Updates for Improved Troubleshooting. 616-623 - Phuc Do Van, Christophe Bérenguer:
Condition-Based Maintenance with Imperfect Preventive Repairs for a Deteriorating Production System. 624-633 - Renyan Jiang:
A General Proportional Model and Modelling Procedure. 634-647 - Xiaofei Lu, Wenbin Wang, Hongbing Yang, Ming Jian Zuo, Dong-Hua Zhou:
Optimizing the Periodic Inspection Interval for a 1-out-of-2 Cold Standby System Using the Delay-Time Concept. 648-662 - Artur Akbarov, Shaomin Wu:
Warranty Claim Forecasting Based On Weighted Maximum Likelihood Estimation. 663-669
Volume 28, Number 7, November 2012
- Amirhossein Amiri, Saeed Allahyari:
Change Point Estimation Methods for Control Chart Postsignal Diagnostics: A Literature Review. 673-685
- Philippe Castagliola, Ying Zhang, Antonio Fernando Branco Costa, Petros E. Maravelakis:
The Variable Sample Size X¯ Chart with Estimated Parameters. 687-699 - Nuno Ricardo Costa, João Lourenço, Zulema Lopes Pereira:
Multiresponse Optimization and Pareto Frontiers. 701-712 - Dae-Heung Jang, Christine M. Anderson-Cook, Youngil Kim:
Three-Dimensional Quantile Plots and Dynamic Quantile Plots of the Prediction Variance for Response Surface Designs. 713-723 - Wai Chung Yeong, Michael B. C. Khoo, Zhang Wu, Philippe Castagliola:
Economically Optimum Design of a Synthetic X¯ Chart. 725-741 - Gejza Dohnal:
Delay in Statistical Control of Systems with Wear. 743-750 - Alireza Faraz, Cédric Heuchenne, Erwin Saniga:
Optimal T2 Control Chart with a Double Sampling Scheme - An Alternative to the MEWMA Chart. 751-760 - Ali A. Ismail, Shaban E. Abu-Youssef:
A Goodness of Fit Approach to the Class of Life Distributions with Unknown Age. 761-766 - Adam L. Pintar, Christine M. Anderson-Cook, Huaiqing Wu:
Model Selection for Good Estimation and Prediction over a User-Specified Covariate Distribution for Linear Models under the Frequentist Paradigm. 767-782
- Rui Jiang, Michael Jong Kim, Viliam Makis:
Maximum Likelihood Estimation for a Hidden Semi-Markov Model with Multivariate Observations. 783-791
Volume 28, Number 8, December 2012
- Aarnout Brombacher:
Statistics: an important mathematical tool or a political instrument. 793
- Shaomin Wu:
Warranty Data Analysis: A Review. 795-805
- Emese Vágó, Sándor Kemény:
Random Effects Model for Attribute Gauge R&R. 807-823 - Jingqiang Lin, Jiwu Jing, Peng Liu:
Evaluating Intrusion-Tolerant Certification Authority Systems. 825-841 - Mehdi Davoodi, Seyed Taghi Akhavan Niaki:
Estimating the Step-Change Time of the Location Parameter in Multistage Processes Using MLE. 843-855 - Yanting Li, Fugee Tsung:
Multiple Attribute Control Charts with False Discovery Rate Control. 857-871 - Aarnout Brombacher, Eva Hopma, Ashwin Ittoo, Yuan Lu, Ilse Luyk, Laura Maruster, Joel Ribeiro, Ton Weijters, Hans Wortmann:
Improving Product Quality and Reliability with Customer Experience Data. 873-886 - Sara Lorén, Thomas Svensson:
Second Moment Reliability Evaluation vs. Monte Carlo Simulations for Weld Fatigue Strength. 887-896 - Jong In Park, Norman Kim, Suk Joo Bae:
A Genetic-Based Iterative Quantile Regression Algorithm for Analyzing Fatigue Curves. 897-909 - Vijay Rathod, Om Prakash Yadav, Ajay Pal Singh Rathore, Rakesh Jain:
Reliability-Based Design Optimization Considering Probabilistic Degradation Behavior. 911-923 - Majid Jalili, Mahdi Bashiri, Amirhossein Amiri:
A New Multivariate Process Capability Index Under Both Unilateral and Bilateral Quality Characteristics. 925-941 - Min Xie, T. N. Goh, Peipei Deng:
Circle Chart for Monitoring of Periodic Measurements. 943-948 - Yi-Hua Tina Wang, Longcheen Huwang:
On the Monitoring of Simple Linear Berkson Profiles. 949-965 - Fadel M. Megahed, Lee J. Wells, Jaime A. Camelio, William H. Woodall:
A Spatiotemporal Method for the Monitoring of Image Data. 967-980
- Xintao Xia:
Reliability Analysis of Zero-Failure Data with Poor Information. 981-990
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