![](https://dblp1.uni-trier.de/img/logo.ua.320x120.png)
![](https://dblp1.uni-trier.de/img/dropdown.dark.16x16.png)
![](https://dblp1.uni-trier.de/img/peace.dark.16x16.png)
Остановите войну!
for scientists:
![search dblp search dblp](https://dblp1.uni-trier.de/img/search.dark.16x16.png)
![search dblp](https://dblp1.uni-trier.de/img/search.dark.16x16.png)
default search action
Microelectronics Journal, Volume 59
Volume 59, January 2017
- Remzi Arslanalp, Erkan Yüce, Abdullah T. Tola:
Two lossy integrator loop based current-mode electronically tunable universal filter employing only grounded capacitors. 1-9 - Kristy A. Campbell
:
Self-directed channel memristor for high temperature operation. 10-14 - V. Jegadheesan, K. Sivasankaran:
RF stability performance of SOI junctionless FinFET and impact of process variation. 15-21 - Bhupendra Singh Reniwal
, Praneet Bhatia, Santosh Kumar Vishvakarma
:
Design and investigation of variability aware sense amplifier for low power, high speed SRAM. 22-32 - H. M. P. C. Jayaweera, Ali Muhtaroglu:
Design optimization of a fully integrated charge-pump with LC tank oscillator for ultra-low voltage energy harvesting. 33-39 - Wenbin Bai, Zhangming Zhu:
A 0.5-V 9.3-ENOB 68-nW 10-kS/s SAR ADC in 0.18-μm CMOS for biomedical applications. 40-46 - Kaiming Nie, Zhaoyang Yin, Jiangtao Xu:
A fast correlated multiple sampling technique based on 12-bit SAR ADC with digital calibration for low-noise CMOS image sensor. 47-54 - Gaurav Saini, Sudhanshu Choudhary
:
Improving the subthreshold performance of junctionless transistor using spacer engineering. 55-58 - Feifei Xue, Xiaomin Wei, Wu Gao, Y. Hu:
Design of a 10-bit 1 MS/s pipelined SAR ADC for CZT-based imaging system. 59-68
![](https://dblp1.uni-trier.de/img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.