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ORCIDInternational Conference on Teaching, Assessment, and Learning for Engineering (TALE)
TALE 2023: Auckland, New Zealand
- IEEE International Conference on Teaching, Assessment and Learning for Engineering, TALE 2023, Auckland, New Zealand, November 28 - Dec. 1, 2023. IEEE 2023, ISBN 978-1-6654-5331-8 [contents]
TALE 2022: Hong Kong
- IEEE International Conference on Teaching, Assessment and Learning for Engineering, TALE 2022, Hung Hom, Hong Kong, December 4-7, 2022. IEEE 2022, ISBN 978-1-6654-9117-4 [contents]
TALE 2021: Hybrid Event / Wuhan, Hubei, China
- 2021 IEEE International Conference on Engineering, Technology & Education (TALE), Wuhan, Hubei Province, China, December 5-8, 2021. IEEE 2021, ISBN 978-1-6654-3687-8 [contents]
TALE 2020: Takamatsu, Japan
- Hiroyuki Mitsuhara, Yoshiko Goda, Yutato Ohashi, Ma. Mercedes T. Rodrigo, Jun Shen, Neelakantam Venkatarayalu, Gary Wong, Masanori Yamada, Chi-Un Lei:
IEEE International Conference on Teaching, Assessment, and Learning for Engineering, TALE 2020, Takamatsu, Japan, December 8-11, 2020. IEEE 2020, ISBN 978-1-7281-6942-2 [contents]
TALE 2019: Yogyakarta, Indonesia
- IEEE International Conference on Engineering, Technology and Education, TALE 2019, Yogyakarta, Indonesia, December 10-13, 2019. IEEE 2019, ISBN 978-1-7281-2665-4 [contents]
TALE 2018: Wollongong, Australia
- IEEE International Conference on Teaching, Assessment, and Learning for Engineering, TALE 2018, Wollongong, Australia, December 4-7, 2018. IEEE 2018, ISBN 978-1-5386-6522-0 [contents]
TALE 2017: Hong Kong
- IEEE 6th International Conference on Teaching, Assessment, and Learning for Engineering, TALE 2017, Hong Kong, December 12-14, 2017. IEEE 2017, ISBN 978-1-5386-0900-2 [contents]
TALE 2016: Bangkok, Thailand
- IEEE International Conference on Teaching, Assessment, and Learning for Engineering, TALE 2016, Bangkok, Thailand, December 7-9, 2016. IEEE 2016, ISBN 978-1-5090-5598-2 [contents]
TALE 2015: Zhuhai, China
- IEEE International Conference on Teaching, Assessment, and Learning for Engineering, TALE 2015, Zhuhai, China, December 10-12, 2015. IEEE 2015, ISBN 978-1-4673-9226-6 [contents]
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