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ORCIDSarnoff Symposium
40th Sarnoff Symposium 2019: Newark, NJ, USA
- 40th IEEE Sarnoff Symposium 2019, Newark, NJ, USA, September 23-24, 2019. IEEE 2019, ISBN 978-1-7281-2487-2 [contents]
39th Sarnoff Symposium 2018: Newark, NJ, USA
- 39th IEEE Sarnoff Symposium 2018, Newark, NJ, USA, September 24-25, 2018. IEEE 2018, ISBN 978-1-5386-6154-3 [contents]
38th Sarnoff Symposium 2017: Newark, NJ, USA
- 38th IEEE Sarnoff Symposium 2017, Newark, NJ, USA, September 18-20, 2017. IEEE 2017, ISBN 978-1-5386-3019-8 [contents]
37th Sarnoff Symposium 2016: Newark, NJ, USA
- 37th IEEE Sarnoff Symposium 2016, Newark, NJ, USA, September 19-21, 2016. IEEE 2016, ISBN 978-1-5090-1540-5 [contents]
36th Sarnoff Symposium 2015: Newark, NJ, USA
- 36th IEEE Sarnoff Symposium 2015, Newark, NJ, USA, September 20-22, 2015. IEEE 2015, ISBN 978-1-4673-8042-3 [contents]
35th Sarnoff Symposium 2012: Newark, NJ, USA
- 35th IEEE Sarnoff Symposium 2012, Newark, NJ, USA, May 21-22, 2012. IEEE 2012, ISBN 978-1-4673-1465-7 [contents]
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last updated on 2025-12-04 01:31 CET by the dblp team
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