


default search action
International Workshop on Metamorphic Testing (MET)
8th MET@ICSE 2023: Melbourne, Australia
- 8th IEEE/ACM International Workshop on Metamorphic Testing, MET@ICSE 2023, Melbourne, Australia, May 14, 2023. IEEE 2023, ISBN 979-8-3503-0176-2 [contents]

7th MET@ICSE 2022: Pittsburgh, PA, USA
- IEEE/ACM 7th International Workshop on Metamorphic Testing, MET@ICSE 2022, Pittsburgh, PA, USA, May 9, 2022. ACM 2022, ISBN 978-1-4503-9307-2 [contents]

6th MET@ICSE 2021: Madrid, Spain
- 6th IEEE/ACM International Workshop on Metamorphic Testing, MET@ICSE 2021, Madrid, Spain, June 2, 2021. IEEE 2021, ISBN 978-1-6654-4464-4 [contents]

5th MET@ICSE 2020: Seoul, Korea
- ICSE '20: 42nd International Conference on Software Engineering, Workshops, Seoul, Republic of Korea, 27 June - 19 July, 2020. ACM 2020, ISBN 978-1-4503-7963-2 [contents]

4th MET@ICSE 2019: Montreal, QC, Canada
- Xiaoyuan Xie, Pak-Lok Poon, Laura L. Pullum:

Proceedings of the 4th International Workshop on Metamorphic Testing, MET@ICSE 2019, Montreal, QC, Canada, May 26, 2019. IEEE / ACM 2019, ISBN 978-1-7281-2235-9 [contents]
3rd MET@ICSE 2018: Gothenburg, Sweden
- Xiaoyuan Xie, Laura L. Pullum, Pak-Lok Poon:

3rd IEEE/ACM International Workshop on Metamorphic Testing, MET 2018, Gothenburg, Sweden, May 27, 2018. ACM 2018, ISBN 978-1-4503-5729-6 [contents]
2nd MET@ICSE 2017: Buenos Aires, Argentina
- 2nd IEEE/ACM International Workshop on Metamorphic Testing, MET@ICSE 2017, Buenos Aires, Argentina, May 22, 2017. IEEE Computer Society 2017, ISBN 978-1-5386-0424-3 [contents]

1st MET@ICSE 2016: Austin, Texas, USA
- Proceedings of the 1st International Workshop on Metamorphic Testing, MET@ICSE 2016, Austin, Texas, USA, May 16, 2016. ACM 2016, ISBN 978-1-4503-4163-9 [contents]


manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.




Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCID
















