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DeepTest@ICSE 2025: Ottawa, ON, Canada
- IEEE/ACM International Workshop on Deep Learning for Testing and Testing for Deep Learning, DeepTest@ICSE 2025, Ottawa, ON, Canada, May 3, 2025. IEEE 2025, ISBN 979-8-3315-0190-7
- Lorena Poenaru-Olaru, Luis Cruz, Jan S. Rellermeyer, Arie van Deursen:
Improving the Reliability of Failure Prediction Models through Concept Drift Monitoring. 1-8 - Somin Kim, Shin Yoo:
DANDI: Diffusion as Normative Distribution for Deep Neural Network Input. 9-16 - Naryeong Kim, Sungmin Kang, Gabin An, Shin Yoo:
Lachesis: Predicting LLM Inference Accuracy using Structural Properties of Reasoning Paths. 17-20 - Gordon Lim, Stefan Larson, Kevin Leach:
Robust Testing for Deep Learning using Human Label Noise. 21-28 - Luciano Baresi, Davide Yi Xian Hu, Muhammad Irfan Mas'udi, Giovanni Quattrocchi:
DILLEMA: Diffusion and Large Language Models for Multi-Modal Augmentation. 29-36 - Benjamin Steenhoek, Michele Tufano, Neel Sundaresan, Alexey Svyatkovskiy:
Reinforcement Learning from Automatic Feedback for High-Quality Unit Test Generation. 37-44 - Myron David Lucena Campos Peixoto, Davy de Medeiros Baia, Nathalia Nascimento, Paulo Alencar, Baldoino Fonseca, Márcio Ribeiro:
On the Effectiveness of LLMs for Manual Test Verifications. 45-52 - Qurban Ali, Andrea Stocco, Leonardo Mariani, Oliviero Riganelli:
OpenCat: Improving Interoperability of ADS Testing. 53-60

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