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ORCID19. FTCS 1989: Chicago, IL, USA
- Proceedings of the Nineteenth International Symposium on Fault-Tolerant Computing, FTCS 1989, Chicago, IL, USA, 21-23 June, 1989. IEEE Computer Society 1989, ISBN 0-8186-1959-7
- Michael J. Iacoponi, David K. Vail:
The fault tolerance approach of the Advanced Architecture Onboard Processor. 6-12 - Nobuyasu Kanekawa, Hideo Maejima, Hatsuhiko Kato, Hirokazu Ihara:
Dependable onboard computer systems with a new method-stepwise negotiating voting. 13-19 - Richard E. Harper, Gail Nagle, Martin A. Serrano:
Use of a functional programming model in fault tolerant parallel processing. 20-26 - Kwang-Ting Cheng, Vishwani D. Agrawal:
An economical scan design for sequential logic test generation. 28-35 - Manoj Franklin, Kewal K. Saluja, Kozo Kinoshita:
Row/column pattern sensitive fault detection in RAMs via built-in self-test. 36-43 - Michael H. Schulz, Karl Fuchs, Franz Fink:
Advanced automatic test pattern generation techniques for path delay faults. 44-51 - Abhijit Sengupta, Anton T. Dahbura:
On self-diagnosable multiprocessor systems: diagnosis by the comparison approach. 54-61 - Douglas M. Blough, Gregory F. Sullivan, Gerald M. Masson:
Fault diagnosis for sparsely interconnected multiprocessor systems. 62-69 - Arun K. Somani, Vinod K. Agarwal:
Distributed syndrome decoding for regular interconnected structures. 70-77 - Leonard M. Napolitano Jr., David D. Andaleon, K. R. Berry, P. R. Bryson, S. R. Klapp, J. E. Leeper, G. Robert Redinbo:
Fault-tolerance in a high-speed 2D convolver/correlator: Starloc. 80-87 - John A. Trotter, Will R. Moore:
Imperfectly connected 2D arrays for image processing. 88-92 - Onat Menzilcioglu, H. T. Kung, Siang Wun Song:
Comprehensive evaluation of a two-dimensional configurable array. 93-100 - Srinivas Devadas, Hi-Keung Tony Ma, A. Richard Newton:
Easily testable PLA-based finite state machines. 102-109 - Hans-Joachim Wunderlich:
The design of random-testable sequential circuits. 110-117 - Rajesh Gupta, Rajiv Gupta, Melvin A. Breuer:
BALLAST: a methodology for partial scan design. 118-125 - Nagesh Vasanthavada, Philip Thambidurai, Peter N. Marinos:
Design of fault-tolerant clocks with realistic failure assumptions. 128-133 - Tomohiro Yoneda, Kazutoshi Nakade, Yoshihiro Tohma:
A fast timing verification method based on the independence of units. 134-141 - Philip M. Thambidurai, Alan M. Finn, Roger M. Kieckhafer, Chris J. Walter:
Clock synchronization in MAFT. 142-149 - Robert Geist, Mark Smotherman, Michael Brown:
Ultrahigh reliability estimates for systems exhibiting globally time-dependent failure processes. 152-158 - Bryan Eric Aupperle, John F. Meyer, Lu Wei:
Evaluation of fault-tolerant systems with nonhomogeneous workloads. 159-166 - Yuan-Bao Shieh, Dipak Ghosal, Satish K. Tripathi:
Modeling of fault-tolerant techniques in hierarchical systems. 167-174 - John F. Meyer, K. H. Muralidhar, William H. Sanders:
Performability of a token bus network under transient fault conditions. 175-182 - Neil A. Speirs, Peter A. Barrett:
Using passive replicates in Delta-4 to provide dependable distributed computing. 184-190 - Klaus Echtle:
Distance agreement protocols. 191-198 - Andrew Xu, Barbara Liskov:
A design for a fault-tolerant, distributed implementation of Linda. 199-206 - Jehoshua Bruck
, Mario Blaum:
Some new EC/AUED codes. 208-215 - Larry A. Dunning, Gur Dial, Murali R. Varanasi:
Unidirectional 9-bit byte error detecting codes for computer memory systems. 216-221 - Bella Bose:
Byte unidirectional error correcting codes. 222-228 - Sulaiman Al-Bassam, Bella Bose:
Design of efficient balanced codes. 229-236 - Ytzhak H. Levendel:
Defects and reliability analysis of large software systems: field experience. 238-244 - Takahiko Yamada, Satoshi Ogawa:
Fault tolerant multiprocessor for digital switching systems. 245-252 - Michele Morganti:
F-T in telecommunications networks: state, perspectives, trends. 253-258 - Robert W. Horst:
Reliable design of high-speed cache and control store memories. 259-266 - James M. Purtilo, Pankaj Jalote:
A system for supporting multi-language versions for software fault tolerance. 268-274 - A. Ravichandran, Krishna Kant:
Fault identification in robust data structures. 275-282 - Jean-Chrysostome Bolot, Pankaj Jalote:
Formal verification of programs with exceptions. 283-290 - Jon G. Jr. Udell, Edward J. McCluskey:
Pseudo-exhaustive test and segmentation: formal definitions and extended fault coverage results. 292-298 - Bernd Becker, Uwe Sparmann:
Computations over finite monoids and their test complexity. 299-306 - Mireille Jacomino, Rene David:
A new approach of test confidence estimation. 307-314 - Shamsul Chowdhury:
Estimation of maximum currents for fault tolerant design of power distribution systems in integrated circuits. 316-322 - Siu-Cheung Chau, Arthur L. Liestman:
A proposal for a fault-tolerant binary hypercube architecture. 323-330 - Alan Olson, Kang G. Shin:
Message routing in HARTS with faulty components. 331-338 - Ulf Gunneflo, Johan Karlsson, Jan Torin:
Evaluation of error detection schemes using fault injection by heavy-ion radiation. 340-347 - Jean Arlat, Yves Crouzet, Jean-Claude Laprie:
Fault injection for dependability validation of fault-tolerant computing systems. 348-355 - Ram Chillarege, Nicholas S. Bowen:
Understanding large system failures-a fault injection experiment. 356-363 - Shri Balaji, Lawrence Jenkins, Lalit M. Patnaik, Prem Shankar Goel:
Workload redistribution for fault-tolerance in a hard real-time distributed computing system. 366-373 - C. Mani Krishna, Adit D. Singh:
Modelling correlated transient failures in fault-tolerant systems. 374-381 - M. J. Iacoponi:
Optimal control of latent fault accumulation. 382-388 - Takashi Nanya, Masatoshi Uchida:
A strongly fault-secure and strongly code-disjoint realization of combinational circuits. 390-397 - Michael Nicolaidis, Serge Noraz, Bernard Courtois:
A generalized theory of fail-safe systems. 398-406 - Niraj K. Jha:
Fault detection in CVS parity trees: application in SSC CVS parity and two-rail checkers. 407-414 - Nirmal R. Saxena, Edward J. McCluskey:
Control-flow checking using watchdog assists and extended-precision checksums. 428-435 - Gurindar S. Sohi, Manoj Franklin, Kewal K. Saluja:
A study of time-redundant fault tolerance techniques for high-performance pipelined computers. 436-443 - Paul R. Lorczak, Alper K. Caglayan, Dave E. Eckhardt:
A theoretical investigation of generalized voters for redundant systems. 444-451 - Luigi Vincenzo Mancini, Santosh K. Shrivastava:
Replication within atomic actions and conversations: a case study in fault-tolerance duality. 454-461 - Ahmed Gheith, Karsten Schwan:
CHAOSart: support for real-time atomic transactions. 462-469 - Susan B. Davidson, Insup Lee, Victor Fay Wolfe:
Language constructs for timed atomic commitment. 470-477 - Pinaki Mazumder, Jih-Shyr Yih:
Neural computing for built-in self-repair of embedded memory arrays. 480-487 - Rami G. Melhem:
Bi-level reconfigurations of fault tolerant arrays in bi-modal computational environments. 488-495 - Shantanu Dutt, John P. Hayes:
An automorphic approach to the design of fault-tolerant multiprocessors. 496-503 - Samuel T. Gregory, John C. Knight:
On the provision of backward error recovery in production programming languages. 506-511 - Stuart J. Adams:
Hardware assisted recovery from transient errors in redundant processing systems. 512-519 - Kun-Lung Wu, W. Kent Fuchs:
Recoverable distributed shared virtual memory: memory coherence and storage structures. 520-527 - Chita R. Das, Jong Kim:
An analytical model for computing hypercube availability. 530-537 - Vikram V. Karmarkar, Jon G. Kuhl:
Fail-softness evaluation in multiple-bus local computer networks. 538-544 - Noé Lopez-Benitez, José A. B. Fortes:
Detailed modeling of fault-tolerant processor arrays. 545-552 - Shi-ze Huang, Jie Xu, Tinghuai Chen:
Characterization and design of sequentially t-diagnosable systems. 554-559 - Donald S. Fussell, Sampath Rangarajan:
Probabilistic diagnosis of multiprocessor systems with arbitrary connectivity. 560-565 - Arun K. Somani, Tushar R. Sarnaik:
Reliability analysis and comparison of two fail-op/fail-op/fail-safe architectures. 566-573
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