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4th Image Processing: Machine Vision Applications 2011: San Francisco, CA, USA
- David Fofi, Philip R. Bingham:
Image Processing: Machine Vision Applications IV, San Francisco Airport, California, USA, January 23-27, 2011. SPIE Proceedings 7877, SPIE 2011, ISBN 9780819484147
Front Matter: Volume 7877
- Front Matter: Volume 7877. 787701
Image and Signal Processing I
- Bushra Jalil, Ouadi Beya, Eric Fauvet, Olivier Laligant:
Lipschitz exponents based signal restoration. 787702 - Denis Petker, Volker Lohweg, Eugen Gillich, Thomas Türke, Harald Willeke, Jens Lochmüller, Johannes Schaede:
Real-time wavelet-based inline banknote-in-bundle counting for cut-and-bundle machines. 787703 - Andrea Cohen, Cyril Meurie, Yassine Ruichek, Juliette Marais:
A robust segmentation and tracking method for characterizing GNSS signals reception environment. 787704
Image and Signal Processing II
- Fabian Timm, Erhardt Barth:
Accurate, fast, and robust centre localisation for images of semiconductor components. 787705 - Xinnan Yu, Yu-Jin Zhang:
A 2D histogram representation of images for pooling. 787706 - Amir Badshah, Paul O'Leary, Matthew Harker:
Gram polynomial image decimation and its application to non-rigid registration. 787707 - Reid B. Porter, Christy Ruggiero, Don R. Hush, Neal R. Harvey, Patrick Kelly, Wayne Scoggins, Lav Tandon:
Interactive image quantification tools in nuclear material forensics. 787708
Outdoor Vision
- Saleh Mosaddegh, Amir Fazlollahi, David Fofi, Pascal Vasseur:
Line segment based structure and motion from two views. 787709 - SunJae Ham, ByoungChul Ko, Jae-Yeal Nam:
Vision based forest smoke detection using analyzing of temporal patterns of smoke and their probability models. 78770A - Thierry Molinier, Lucile Rossi, Moulay Akhloufi, Yves Tison, Antoine Pieri:
Estimation of fire volume by stereovision. 78770B - E. Salari, G. Bao:
Pavement distress detection and severity analysis. 78770C
Features and Pattern Recognition
- Seokwon Yeom:
Multi-frame decision level fusion for face classification based on a photon-counting linear discriminant analysis. 78770F - Thorsten Gernoth, André Gooßen, Rolf-Rainer Grigat:
Pose-robust face recognition using shape-adapted texture features. 78770G
Medical Imaging
- JaWon Gim, JunOh Park, Ji-Hyeon Lee, ByoungChul Ko, Jae-Yeal Nam:
A novel framework for white blood cell segmentation based on stepwise rules and morphological features. 78770H - Weixing Wang, Jibing Zeng, Sibai Yin, Xiao Wang:
Image fusion on redundant lifting non-separable wavelet transforms. 78770I
Machine Vision and Industrial Applications I
- Fabian Timm, Erhardt Barth:
Non-parametric texture defect detection using Weibull features. 78770J - Vincent C. Paquit, Mark W. Wendel, David K. Felde, Bernie W. Riemer:
Quantitative measurement by artificial vision of small bubbles in flowing mercury. 78770L
Machine Vision and Industrial Applications II
- Philip R. Bingham, Hector J. Santos-Villalobos, Kenneth W. Tobin:
Coded source neutron imaging. 78770M - Julio Molleda, Rubén Usamentiaga, Daniel F. García, Francisco G. Bulnes:
Towards autonomic computing in machine vision applications: techniques and strategies for in-line 3D reconstruction in harsh industrial environments. 78770N - Ludovic J. Angot, Chuan-Chung Chang, Yung-Lin Chen:
Evaluating distances using a coded lens camera and a blur metric. 78770O - Sridharan Kamalakannan, Christopher J. Mann, Philip R. Bingham, Thomas P. Karnowski, Shaun S. Gleason:
Automatic firearm class identification from cartridge cases. 78770P
Interactive Paper Session
- Jonghyun Park, Soonyoung Park, Wanhyun Cho, Sun-Worl Kim, Gisoo Kim, Gukdong Ahn, Myungeun Lee, Junsik Lim:
Segmentation and visualization of anatomical structures from volumetric medical images. 78770U - Bertrand Boisier, Bastien Billiot, Z. Abdessalem, Pierre Gouton, Jon Yngve Hardeberg:
Extraction and fusion of spectral parameters for face recognition. 78770V - Vincent C. Paquit, Shaun S. Gleason, Udaya C. Kalluri:
Monitoring plant growth using high resolution micro-CT images. 78770W - J. G. Huang, Panos Liatsis, Kevin Cooke, Dennis Teer:
Automating the estimation of coating thickness measurements in the ball crater technique. 78770X
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