Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

International Conference on Artificial Intelligence Testing (AITest)

> Home > Conferences and Workshops

Venue statistics

records by year

document access Please note:
▪ This facet is still work in progress.
▪ Open access information for publications is still rather incomplete.

frequent authors

AITest 2023: Athens, Greece

- view
  authority control:
- export record
  dblp key:
  - conf/aitest/2023
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/aitest/2023
IEEE International Conference On Artificial Intelligence Testing, AITest 2023, Athens, Greece, July 17-20, 2023. IEEE 2023, ISBN 979-8-3503-3629-0 [contents]

AITest 2022: Newark, CA, USA

- view
  authority control:
- export record
  dblp key:
  - conf/aitest/2022
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/aitest/2022
IEEE International Conference On Artificial Intelligence Testing, AITest 2022, Newark, CA, USA, August 15-18, 2022. IEEE 2022, ISBN 978-1-6654-8737-5 [contents]

AITest 2021: Oxford, UK

- view
  authority control:
- export record
  dblp key:
  - conf/aitest/2021
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/aitest/2021
2021 IEEE International Conference on Artificial Intelligence Testing, AITest 2021, Oxford, United Kingdom, August 23-26, 2021. IEEE 2021, ISBN 978-1-6654-3481-2 [contents]

AITest 2020: Oxford, UK

- view
- export record
  dblp key:
  - conf/aitest/2020
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/aitest/2020
IEEE International Conference On Artificial Intelligence Testing, AITest 2020, Oxford, UK, August 3-6, 2020. IEEE 2020, ISBN 978-1-7281-6984-2 [contents]

AITest 2019: Newark, CA, USA

- view
- export record
  dblp key:
  - conf/aitest/2019
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/aitest/2019
IEEE International Conference On Artificial Intelligence Testing, AITest 2019, Newark, CA, USA, April 4-9, 2019. IEEE 2019, ISBN 978-1-7281-0492-8 [contents]

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.