BibTeX record journals/tcad/YangWZCZCL16

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@article{DBLP:journals/tcad/YangWZCZCL16,
  author       = {Jianlei Yang and
                  Peiyuan Wang and
                  Yaojun Zhang and
                  Yuanqing Cheng and
                  Weisheng Zhao and
                  Yiran Chen and
                  Hai (Helen) Li},
  title        = {Radiation-Induced Soft Error Analysis of {STT-MRAM:} {A} Device to
                  Circuit Approach},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {35},
  number       = {3},
  pages        = {380--393},
  year         = {2016},
  url          = {https://doi.org/10.1109/TCAD.2015.2474366},
  doi          = {10.1109/TCAD.2015.2474366},
  timestamp    = {Mon, 04 Jul 2022 14:19:31 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/YangWZCZCL16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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