BibTeX record journals/tcad/SureshK16

download as .bib file

@article{DBLP:journals/tcad/SureshK16,
  author    = {Vikram B. Suresh and
               Sandip Kundu},
  title     = {Managing Test Coverage Uncertainty due to Random Noise in Nano-CMOS:
               {A} Case-Study on an {SRAM} Array},
  journal   = {{IEEE} Trans. on {CAD} of Integrated Circuits and Systems},
  volume    = {35},
  number    = {1},
  pages     = {155--165},
  year      = {2016},
  url       = {https://doi.org/10.1109/TCAD.2015.2449236},
  doi       = {10.1109/TCAD.2015.2449236},
  timestamp = {Sat, 20 May 2017 00:23:52 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/tcad/SureshK16},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
maintained by Schloss Dagstuhl LZI at University of Trier