BibTeX record journals/mr/ZaalDBLBZ08

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@article{DBLP:journals/mr/ZaalDBLBZ08,
  author       = {Jeroen J. M. Zaal and
                  W. D. van Driel and
                  S. Bendida and
                  Q. Li and
                  J. T. M. van Beek and
                  G. Q. Zhang},
  title        = {Packaging influences on the reliability of {MEMS} resonators},
  journal      = {Microelectron. Reliab.},
  volume       = {48},
  number       = {8-9},
  pages        = {1567--1571},
  year         = {2008},
  url          = {https://doi.org/10.1016/j.microrel.2008.06.041},
  doi          = {10.1016/J.MICROREL.2008.06.041},
  timestamp    = {Sat, 22 Feb 2020 19:26:57 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ZaalDBLBZ08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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