BibTeX record journals/mr/RigaudPANVAB11

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@article{DBLP:journals/mr/RigaudPANVAB11,
  author       = {Fabrice Rigaud and
                  Jean{-}Michel Portal and
                  Hassen Aziza and
                  Didier N{\'{e}}e and
                  Julien Vast and
                  Fabrice Argoud and
                  Bertrand Borot},
  title        = {Back-end soft and hard defect monitoring using a single test chip},
  journal      = {Microelectron. Reliab.},
  volume       = {51},
  number       = {6},
  pages        = {1136--1141},
  year         = {2011},
  url          = {https://doi.org/10.1016/j.microrel.2011.02.007},
  doi          = {10.1016/J.MICROREL.2011.02.007},
  timestamp    = {Fri, 24 Dec 2021 10:43:43 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/RigaudPANVAB11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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