BibTeX record journals/mr/RafiGTTYBZC13

• > Home > journals/mr/RafiGTTYBZC13

@article{DBLP:journals/mr/RafiGTTYBZC13,
  author       = {Joan Marc Raf{\'{\i}} and
                  M. B. Gonz{\'{a}}lez and
                  Kenichiro Takakura and
                  I. Tsunoda and
                  M. Yoneoka and
                  Oihane Beldarrain and
                  Miguel Zabala and
                  Francesca Campabadal},
  title        = {2 MeV electron irradiation effects on the electrical characteristics
                  of {MOS} capacitors with {ALD} Al\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\)
                  dielectrics of different thickness},
  journal      = {Microelectron. Reliab.},
  volume       = {53},
  number       = {9-11},
  pages        = {1333--1337},
  year         = {2013},
  url          = {https://doi.org/10.1016/j.microrel.2013.07.023},
  doi          = {10.1016/J.MICROREL.2013.07.023},
  timestamp    = {Thu, 30 Jun 2022 13:39:01 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/RafiGTTYBZC13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}