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BibTeX record journals/mr/OatesL06
@article{DBLP:journals/mr/OatesL06, author = {A. S. Oates and Shou{-}Chung Lee}, title = {Electromigration failure distributions of dual damascene Cu /low - k interconnects}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1581--1586}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.038}, doi = {10.1016/J.MICROREL.2006.07.038}, timestamp = {Sat, 22 Feb 2020 19:26:40 +0100}, biburl = {https://dblp.org/rec/journals/mr/OatesL06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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