BibTeX record journals/ieicet/NakataKOJSTNNYFNKKY14

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@article{DBLP:journals/ieicet/NakataKOJSTNNYFNKKY14,
  author       = {Yohei Nakata and
                  Yuta Kimi and
                  Shunsuke Okumura and
                  Jinwook Jung and
                  Takuya Sawada and
                  Taku Toshikawa and
                  Makoto Nagata and
                  Hirofumi Nakano and
                  Makoto Yabuuchi and
                  Hidehiro Fujiwara and
                  Koji Nii and
                  Hiroyuki Kawai and
                  Hiroshi Kawaguchi and
                  Masahiko Yoshimoto},
  title        = {A 40-nm Resilient Cache Memory for Dynamic Variation Tolerance Delivering
                  {\texttimes}91 Failure Rate Improvement under 35{\%} Supply Voltage
                  Fluctuation},
  journal      = {{IEICE} Trans. Electron.},
  volume       = {97-C},
  number       = {4},
  pages        = {332--341},
  year         = {2014},
  url          = {https://doi.org/10.1587/transele.E97.C.332},
  doi          = {10.1587/TRANSELE.E97.C.332},
  timestamp    = {Mon, 11 Mar 2024 15:42:29 +0100},
  biburl       = {https://dblp.org/rec/journals/ieicet/NakataKOJSTNNYFNKKY14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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