BibTeX record journals/ieicet/ImamotoSE11

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@article{DBLP:journals/ieicet/ImamotoSE11,
  author       = {Takuya Imamoto and
                  Takeshi Sasaki and
                  Tetsuo Endoh},
  title        = {Evaluation of 1/f Noise Characteristics in High-k/Metal Gate and SiON/Poly-Si
                  Gate {MOSFET} with 65 nm {CMOS} Process},
  journal      = {{IEICE} Trans. Electron.},
  volume       = {94-C},
  number       = {5},
  pages        = {724--729},
  year         = {2011},
  url          = {https://doi.org/10.1587/transele.E94.C.724},
  doi          = {10.1587/TRANSELE.E94.C.724},
  timestamp    = {Sat, 11 Apr 2020 14:48:55 +0200},
  biburl       = {https://dblp.org/rec/journals/ieicet/ImamotoSE11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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