BibTeX record conf/seke/AndoSUWFIOHKSNY15

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@inproceedings{DBLP:conf/seke/AndoSUWFIOHKSNY15,
  author       = {Reou Ando and
                  Seiji Sato and
                  Chihiro Uchida and
                  Hironori Washizaki and
                  Yoshiaki Fukazawa and
                  Sakae Inoue and
                  Hiroyuki Ono and
                  Yoshiiku Hanai and
                  Masanobu Kanazawa and
                  Kazutaka Sone and
                  Katsushi Namba and
                  Mikihiko Yamamoto},
  editor       = {Haiping Xu},
  title        = {How Does Defect Removal Activity of Developer Vary with Development
                  Experience?},
  booktitle    = {The 27th International Conference on Software Engineering and Knowledge
                  Engineering, {SEKE} 2015, Wyndham Pittsburgh University Center, Pittsburgh,
                  PA, USA, July 6-8, 2015},
  pages        = {540--545},
  publisher    = {{KSI} Research Inc. and Knowledge Systems Institute Graduate School},
  year         = {2015},
  url          = {https://doi.org/10.18293/SEKE2015-221},
  doi          = {10.18293/SEKE2015-221},
  timestamp    = {Wed, 03 Feb 2021 08:31:33 +0100},
  biburl       = {https://dblp.org/rec/conf/seke/AndoSUWFIOHKSNY15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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