BibTeX record conf/ets/XamaCEDVG17

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@inproceedings{DBLP:conf/ets/XamaCEDVG17,
  author       = {Nektar Xama and
                  Anthony Coyette and
                  Baris Esen and
                  Wim Dobbelaere and
                  Ronny Vanhooren and
                  Georges G. E. Gielen},
  title        = {Automatic testing of analog ICs for latent defects using topology
                  modification},
  booktitle    = {22nd {IEEE} European Test Symposium, {ETS} 2017, Limassol, Cyprus,
                  May 22-26, 2017},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ETS.2017.7968215},
  doi          = {10.1109/ETS.2017.7968215},
  timestamp    = {Sat, 19 Oct 2019 20:29:31 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/XamaCEDVG17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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