BibTeX record conf/dsd/SudbrockRUKP05

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@inproceedings{DBLP:conf/dsd/SudbrockRUKP05,
  author       = {Joachim Sudbrock and
                  Jaan Raik and
                  Raimund Ubar and
                  Wieslaw Kuzmicz and
                  Witold A. Pleskacz},
  title        = {Defect-Oriented Test- and Layout-Generation for Standard-Cell {ASIC}
                  Designs},
  booktitle    = {Eighth Euromicro Symposium on Digital Systems Design {(DSD} 2005),
                  30 August - 3 September 2005, Porto, Portugal},
  pages        = {79--82},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/DSD.2005.30},
  doi          = {10.1109/DSD.2005.30},
  timestamp    = {Thu, 23 Mar 2023 23:59:36 +0100},
  biburl       = {https://dblp.org/rec/conf/dsd/SudbrockRUKP05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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