BibTeX record conf/dsd/PleskaczJRRUK08

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@inproceedings{DBLP:conf/dsd/PleskaczJRRUK08,
  author       = {Witold A. Pleskacz and
                  Maksim Jenihhin and
                  Jaan Raik and
                  Michal Rakowski and
                  Raimund Ubar and
                  Wieslaw Kuzmicz},
  editor       = {Luca Fanucci},
  title        = {Hierarchical Analysis of Short Defects between Metal Lines in {CMOS}
                  {IC}},
  booktitle    = {11th Euromicro Conference on Digital System Design: Architectures,
                  Methods and Tools, {DSD} 2008, Parma, Italy, September 3-5, 2008},
  pages        = {729--734},
  publisher    = {{IEEE} Computer Society},
  year         = {2008},
  url          = {https://doi.org/10.1109/DSD.2008.98},
  doi          = {10.1109/DSD.2008.98},
  timestamp    = {Thu, 23 Mar 2023 23:59:37 +0100},
  biburl       = {https://dblp.org/rec/conf/dsd/PleskaczJRRUK08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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