BibTeX record conf/dft/SosnowskiWB00

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@inproceedings{DBLP:conf/dft/SosnowskiWB00,
  author       = {Janusz Sosnowski and
                  Tomasz Wabia and
                  Tomasz Bech},
  title        = {Path Delay Fault Testability Analysis},
  booktitle    = {15th {IEEE} International Symposium on Defect and Fault-Tolerance
                  in {VLSI} Systems {(DFT} 2000), 25-27 October 2000, Yamanashi, Japan,
                  Proceedings},
  pages        = {338},
  publisher    = {{IEEE} Computer Society},
  year         = {2000},
  url          = {https://doi.org/10.1109/DFTVS.2000.887174},
  doi          = {10.1109/DFTVS.2000.887174},
  timestamp    = {Fri, 24 Mar 2023 00:02:09 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/SosnowskiWB00.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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