BibTeX record conf/dac/LeeHK89

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@inproceedings{DBLP:conf/dac/LeeHK89,
  author       = {Hyung Ki Lee and
                  Dong Sam Ha and
                  Kwanghyun Kim},
  editor       = {Donald E. Thomas},
  title        = {Test Generation of Stuck-open Faults Using Stuck-at Test Sets in {CMOS}
                  Combinational Circuits},
  booktitle    = {Proceedings of the 26th {ACM/IEEE} Design Automation Conference, Las
                  Vegas, Nevada, USA, June 25-29, 1989},
  pages        = {345--350},
  publisher    = {{ACM} Press},
  year         = {1989},
  url          = {https://doi.org/10.1145/74382.74440},
  doi          = {10.1145/74382.74440},
  timestamp    = {Thu, 11 Apr 2019 16:28:52 +0200},
  biburl       = {https://dblp.org/rec/conf/dac/LeeHK89.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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