BibTeX record conf/ats/NiiTIYFO12

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@inproceedings{DBLP:conf/ats/NiiTIYFO12,
  author       = {Koji Nii and
                  Yasumasa Tsukamoto and
                  Yuichiro Ishii and
                  Makoto Yabuuchi and
                  Hidehiro Fujiwara and
                  Kazuyoshi Okamoto},
  title        = {A Test Screening Method for 28 nm {HK/MG} Single-Port and Dual-Port
                  SRAMs Considering with Dynamic Stability and Read/Write Disturb Issues},
  booktitle    = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
                  19-22, 2012},
  pages        = {246--251},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/ATS.2012.59},
  doi          = {10.1109/ATS.2012.59},
  timestamp    = {Fri, 24 Mar 2023 00:02:33 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/NiiTIYFO12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}