BibTeX record conf/aipr/DabbiruWHWBADDJ15

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@inproceedings{DBLP:conf/aipr/DabbiruWHWBADDJ15,
  author       = {Lalitha Dabbiru and
                  Pan Wei and
                  Archit Harsh and
                  Julie White and
                  John E. Ball and
                  James V. Aanstoos and
                  Patrick Donohoe and
                  Jesse Doyle and
                  Sam Jackson and
                  John Newman},
  title        = {Runway assessment via remote sensing},
  booktitle    = {2015 {IEEE} Applied Imagery Pattern Recognition Workshop, {AIPR} 2015,
                  Washington, DC, USA, October 13-15, 2015},
  pages        = {1--4},
  publisher    = {{IEEE} Computer Society},
  year         = {2015},
  url          = {https://doi.org/10.1109/AIPR.2015.7444545},
  doi          = {10.1109/AIPR.2015.7444545},
  timestamp    = {Fri, 24 Mar 2023 00:03:39 +0100},
  biburl       = {https://dblp.org/rec/conf/aipr/DabbiruWHWBADDJ15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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