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S. Raja 0001

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Partha Mukhopadhyay

> Home > Persons > S. Raja 0001

Publications

2019
[j3]
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  dblp key:
  - journals/toc/ArvindJM019
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  - https://dblp.org/rec/journals/toc/ArvindJM019
Vikraman Arvind, Pushkar S. Joglekar, Partha Mukhopadhyay, S. Raja:
Randomized Polynomial-Time Identity Testing for Noncommutative Circuits. Theory Comput. 15: 1-36 (2019)
2017
[c5]
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  - conf/mfcs/ArvindDM017
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Vikraman Arvind, Rajit Datta, Partha Mukhopadhyay, S. Raja:
Efficient Identity Testing and Polynomial Factorization in Nonassociative Free Rings. MFCS 2017: 38:1-38:13
[c4]
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  - conf/stoc/ArvindJMR17
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Vikraman Arvind, Pushkar S. Joglekar, Partha Mukhopadhyay, S. Raja:
Randomized polynomial time identity testing for noncommutative circuits. STOC 2017: 831-841
[i11]
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  - journals/corr/ArvindDMR17
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Vikraman Arvind, Rajit Datta, Partha Mukhopadhyay, S. Raja:
Efficient Identity Testing and Polynomial Factorization over Non-associative Free Rings. CoRR abs/1705.00140 (2017)
[i10]
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  - electronic edition @ weizmann.ac.il (open access)
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  - journals/eccc/ArvindDMS17
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Vikraman Arvind, Rajit Datta, Partha Mukhopadhyay, Raja S:
Efficient Identity Testing and Polynomial Factorization over Non-associative Free Rings. Electron. Colloquium Comput. Complex. TR17 (2017)
2016
[i9]
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  dblp key:
  - journals/corr/ArvindMR16
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Vikraman Arvind, Partha Mukhopadhyay, S. Raja:
Randomized Polynomial Time Identity Testing for Noncommutative Circuits. CoRR abs/1606.00596 (2016)
[i8]
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Vikraman Arvind, Pushkar S. Joglekar, Partha Mukhopadhyay, S. Raja:
Identity Testing for +-Regular Noncommutative Arithmetic Circuits. CoRR abs/1611.07235 (2016)
[i7]
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  - journals/eccc/ArvindJMS16
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Vikraman Arvind, Pushkar S. Joglekar, Partha Mukhopadhyay, Raja S:
Identity Testing for +-Regular Noncommutative Arithmetic Circuits. Electron. Colloquium Comput. Complex. TR16 (2016)
[i6]
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Vikraman Arvind, Partha Mukhopadhyay, Raja S:
Randomized Polynomial Time Identity Testing for Noncommutative Circuits. Electron. Colloquium Comput. Complex. TR16 (2016)

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