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ORCIDBibTeX records: Elyse Rosenbaum
@inproceedings{DBLP:conf/irps/HuangPZHR23,
author = {Shudong Huang and
Srivatsan Parthasarathy and
Yuanzhong Paul Zhou and
Jean{-}Jacques Hajjar and
Elyse Rosenbaum},
title = {Optimization of {SCR} for High-Speed Digital and {RF} Applications
in 45-nm {SOI} {CMOS} Technology},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2023, Monterey,
CA, USA, March 26-30, 2023},
pages = {1--7},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/IRPS48203.2023.10118266},
doi = {10.1109/IRPS48203.2023.10118266},
timestamp = {Wed, 24 May 2023 09:43:44 +0200},
biburl = {https://dblp.org/rec/conf/irps/HuangPZHR23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/YanWSR23,
author = {Weiman Yan and
Ernest Wu and
Alexander G. Schwing and
Elyse Rosenbaum},
title = {Semantic Autoencoder for Modeling {BEOL} and {MOL} Dielectric Lifetime
Distributions},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2023, Monterey,
CA, USA, March 26-30, 2023},
pages = {1--9},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/IRPS48203.2023.10117878},
doi = {10.1109/IRPS48203.2023.10117878},
timestamp = {Wed, 24 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/YanWSR23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ZhouLR23,
author = {Yujie Zhou and
David LaFonteese and
Elyse Rosenbaum},
title = {Collector Engineering of {ESD} {PNP} in {BCD} Technologies},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2023, Monterey,
CA, USA, March 26-30, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/IRPS48203.2023.10117930},
doi = {10.1109/IRPS48203.2023.10117930},
timestamp = {Wed, 24 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/ZhouLR23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/HuangPZHR22,
author = {Shudong Huang and
Srivatsan Parthasarathy and
Yuanzhong Paul Zhou and
Jean{-}Jacques Hajjar and
Elyse Rosenbaum},
title = {A High Voltage Tolerant Supply Clamp for {ESD} Protection in a 45-nm
{SOI} Technology},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
TX, USA, March 27-31, 2022},
pages = {5},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IRPS48227.2022.9764514},
doi = {10.1109/IRPS48227.2022.9764514},
timestamp = {Mon, 09 May 2022 18:11:24 +0200},
biburl = {https://dblp.org/rec/conf/irps/HuangPZHR22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/l4dc/YangXRR22,
author = {Alan Yang and
Jie Xiong and
Maxim Raginsky and
Elyse Rosenbaum},
editor = {Roya Firoozi and
Negar Mehr and
Esen Yel and
Rika Antonova and
Jeannette Bohg and
Mac Schwager and
Mykel J. Kochenderfer},
title = {Input-to-State Stable Neural Ordinary Differential Equations with
Applications to Transient Modeling of Circuits},
booktitle = {Learning for Dynamics and Control Conference, {L4DC} 2022, 23-24 June
2022, Stanford University, Stanford, CA, {USA}},
series = {Proceedings of Machine Learning Research},
volume = {168},
pages = {663--675},
publisher = {{PMLR}},
year = {2022},
url = {https://proceedings.mlr.press/v168/yang22b.html},
timestamp = {Fri, 20 May 2022 14:36:40 +0200},
biburl = {https://dblp.org/rec/conf/l4dc/YangXRR22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/corr/abs-2202-06453,
author = {Alan Yang and
Jie Xiong and
Maxim Raginsky and
Elyse Rosenbaum},
title = {Input-to-State Stable Neural Ordinary Differential Equations with
Applications to Transient Modeling of Circuits},
journal = {CoRR},
volume = {abs/2202.06453},
year = {2022},
url = {https://arxiv.org/abs/2202.06453},
eprinttype = {arXiv},
eprint = {2202.06453},
timestamp = {Fri, 18 Feb 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/corr/abs-2202-06453.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/HuangR21,
author = {Shudong Huang and
Elyse Rosenbaum},
title = {Compact Model of {ESD} Diode Suitable for Subnanosecond Switching
Transients},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--7},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405149},
doi = {10.1109/IRPS46558.2021.9405149},
timestamp = {Wed, 05 May 2021 11:53:21 +0200},
biburl = {https://dblp.org/rec/conf/irps/HuangR21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ShahZLR21,
author = {Milan Shah and
Yujie Zhou and
David LaFonteese and
Elyse Rosenbaum},
title = {Considerations in High Voltage Lateral {ESD} {PNP} Design},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--10},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405093},
doi = {10.1109/IRPS46558.2021.9405093},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/ShahZLR21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/mlcad/XiongYRR21,
author = {Jie Xiong and
Alan Yang and
Maxim Raginsky and
Elyse Rosenbaum},
title = {Neural Networks for Transient Modeling of Circuits : Invited Paper},
booktitle = {3rd {ACM/IEEE} Workshop on Machine Learning for CAD, {MLCAD} 2021,
Raleigh, NC, USA, August 30 - Sept. 3, 2021},
pages = {1--7},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/MLCAD52597.2021.9531153},
doi = {10.1109/MLCAD52597.2021.9531153},
timestamp = {Fri, 17 Sep 2021 14:46:40 +0200},
biburl = {https://dblp.org/rec/conf/mlcad/XiongYRR21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcas/XiuR20,
author = {Yang Xiu and
Elyse Rosenbaum},
title = {Analysis and Design of Integrated Voltage Regulators for Supply Noise
Rejection During System-Level {ESD}},
journal = {{IEEE} Trans. Circuits Syst.},
volume = {67-I},
number = {12},
pages = {4199--4210},
year = {2020},
url = {https://doi.org/10.1109/TCSI.2020.3004818},
doi = {10.1109/TCSI.2020.3004818},
timestamp = {Thu, 17 Dec 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tcas/XiuR20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/AylingHR20,
author = {Alex Ayling and
Shudong Huang and
Elyse Rosenbaum},
title = {Sub-nanosecond Reverse Recovery Measurement for {ESD} Devices},
booktitle = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020,
Dallas, TX, USA, April 28 - May 30, 2020},
pages = {1--8},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/IRPS45951.2020.9129596},
doi = {10.1109/IRPS45951.2020.9129596},
timestamp = {Thu, 30 Jul 2020 15:13:12 +0200},
biburl = {https://dblp.org/rec/conf/irps/AylingHR20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/BalakirYR20,
author = {Artsiom Balakir and
Alan Yang and
Elyse Rosenbaum},
title = {An Interpretable Predictive Model for Early Detection of Hardware
Failure},
booktitle = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020,
Dallas, TX, USA, April 28 - May 30, 2020},
pages = {1--5},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/IRPS45951.2020.9129615},
doi = {10.1109/IRPS45951.2020.9129615},
timestamp = {Thu, 30 Jul 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/BalakirYR20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/uai/YangGRKR20,
author = {Alan Yang and
AmirEmad Ghassami and
Maxim Raginsky and
Negar Kiyavash and
Elyse Rosenbaum},
editor = {Ryan P. Adams and
Vibhav Gogate},
title = {Model-Augmented Conditional Mutual Information Estimation for Feature
Selection},
booktitle = {Proceedings of the Thirty-Sixth Conference on Uncertainty in Artificial
Intelligence, {UAI} 2020, virtual online, August 3-6, 2020},
series = {Proceedings of Machine Learning Research},
volume = {124},
pages = {1139--1148},
publisher = {{AUAI} Press},
year = {2020},
url = {http://proceedings.mlr.press/v124/yang20b.html},
timestamp = {Tue, 07 May 2024 20:09:01 +0200},
biburl = {https://dblp.org/rec/conf/uai/YangGRKR20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/FengVJRV19,
author = {Keven Feng and
Sandeep Vora and
Rui Jiang and
Elyse Rosenbaum and
Shobha Vasudevan},
editor = {J{\"{u}}rgen Teich and
Franco Fummi},
title = {Guilty As Charged: Computational Reliability Threats Posed By Electrostatic
Discharge-induced Soft Errors},
booktitle = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition,
{DATE} 2019, Florence, Italy, March 25-29, 2019},
pages = {156--161},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.23919/DATE.2019.8715149},
doi = {10.23919/DATE.2019.8715149},
timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
biburl = {https://dblp.org/rec/conf/date/FengVJRV19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/corr/abs-1911-04628,
author = {Alan Yang and
AmirEmad Ghassami and
Maxim Raginsky and
Negar Kiyavash and
Elyse Rosenbaum},
title = {Model-Augmented Nearest-Neighbor Estimation of Conditional Mutual
Information for Feature Selection},
journal = {CoRR},
volume = {abs/1911.04628},
year = {2019},
url = {http://arxiv.org/abs/1911.04628},
eprinttype = {arXiv},
eprint = {1911.04628},
timestamp = {Mon, 02 Dec 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/corr/abs-1911-04628.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/XiuSBMRR18,
author = {Yang Xiu and
Samuel Sagan and
Advika Battini and
Xiao Ma and
Maxim Raginsky and
Elyse Rosenbaum},
title = {Stochastic modeling of air electrostatic discharge parameters},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {2},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353548},
doi = {10.1109/IRPS.2018.8353548},
timestamp = {Fri, 10 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/XiuSBMRR18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MengCR16,
author = {Kuo{-}Hsuan Meng and
Zaichen Chen and
Elyse Rosenbaum},
title = {Compact distributed multi-finger {MOSFET} model for circuit-level
{ESD} simulation},
journal = {Microelectron. Reliab.},
volume = {63},
pages = {11--21},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2015.12.010},
doi = {10.1016/J.MICROREL.2015.12.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MengCR16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/MengSR16,
author = {Kuo{-}Hsuan Meng and
Vrashank Shukla and
Elyse Rosenbaum},
title = {Full-Component Modeling and Simulation of Charged Device Model {ESD}},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {35},
number = {7},
pages = {1105--1113},
year = {2016},
url = {https://doi.org/10.1109/TCAD.2015.2495196},
doi = {10.1109/TCAD.2015.2495196},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/MengSR16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcas/LinKFXSRS16,
author = {Yingyan Lin and
Min{-}Sun Keel and
Adam C. Faust and
Aolin Xu and
Naresh R. Shanbhag and
Elyse Rosenbaum and
Andrew C. Singer},
title = {A Study of BER-Optimal ADC-Based Receiver for Serial Links},
journal = {{IEEE} Trans. Circuits Syst. {I} Regul. Pap.},
volume = {63-I},
number = {5},
pages = {693--704},
year = {2016},
url = {https://doi.org/10.1109/TCSI.2016.2529284},
doi = {10.1109/TCSI.2016.2529284},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tcas/LinKFXSRS16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ChenMRR15,
author = {Zaichen Chen and
Robert Mertens and
Collin Reiman and
Elyse Rosenbaum},
title = {Improved {GGSCR} layout for overshoot reduction},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
CA, USA, April 19-23, 2015},
pages = {3},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/IRPS.2015.7112720},
doi = {10.1109/IRPS.2015.7112720},
timestamp = {Mon, 08 Apr 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/ChenMRR15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/cicc/FaustNBSKBRS12,
author = {Adam C. Faust and
Rajan Narasimha and
Karan S. Bhatia and
Ankit Srivastava and
Chhay Kong and
Hyeon{-}Min Bae and
Elyse Rosenbaum and
Naresh R. Shanbhag},
title = {FEC-based 4 Gb/s backplane transceiver in 90nm {CMOS}},
booktitle = {Proceedings of the {IEEE} 2012 Custom Integrated Circuits Conference,
{CICC} 2012, San Jose, CA, USA, September 9-12, 2012},
pages = {1--4},
publisher = {{IEEE}},
year = {2012},
url = {https://doi.org/10.1109/CICC.2012.6330665},
doi = {10.1109/CICC.2012.6330665},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/cicc/FaustNBSKBRS12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/3dic/RosenbaumSK11,
author = {Elyse Rosenbaum and
Vrashank Shukla and
Min{-}Sun Keel},
editor = {Mitsumasa Koyanagi and
Morihiro Kada},
title = {{ESD} protection networks for 3D integrated circuits},
booktitle = {2011 {IEEE} International 3D Systems Integration Conference (3DIC),
Osaka, Japan, January 31 - February 2, 2012},
pages = {1--7},
publisher = {{IEEE}},
year = {2011},
url = {https://doi.org/10.1109/3DIC.2012.6262965},
doi = {10.1109/3DIC.2012.6262965},
timestamp = {Wed, 16 Oct 2019 14:14:50 +0200},
biburl = {https://dblp.org/rec/conf/3dic/RosenbaumSK11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/cicc/OlsonJSR11,
author = {Nicholas Olson and
Nathan Jack and
Vrashank Shukla and
Elyse Rosenbaum},
editor = {Rakesh Patel and
Tom Andre and
Aurangzeb Khan},
title = {{CDM-ESD} induced damage in components using stacked-die packaging},
booktitle = {2011 {IEEE} Custom Integrated Circuits Conference, {CICC} 2011, San
Jose, CA, USA, Sept. 19-21, 2011},
pages = {1--4},
publisher = {{IEEE}},
year = {2011},
url = {https://doi.org/10.1109/CICC.2011.6055359},
doi = {10.1109/CICC.2011.6055359},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/cicc/OlsonJSR11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FarbizR09,
author = {Farzan Farbiz and
Elyse Rosenbaum},
title = {A new compact model for external latchup},
journal = {Microelectron. Reliab.},
volume = {49},
number = {12},
pages = {1447--1454},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2008.12.003},
doi = {10.1016/J.MICROREL.2008.12.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FarbizR09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/cicc/RosenbaumBBF09,
author = {Elyse Rosenbaum and
Hyeon{-}Min Bae and
Karan S. Bhatia and
Adam C. Faust},
title = {Moving signals on and off chip},
booktitle = {{IEEE} Custom Integrated Circuits Conference, {CICC} 2009, San Jose,
California, USA, 13-16 September, 2009, Proceedings},
pages = {585--592},
publisher = {{IEEE}},
year = {2009},
url = {https://doi.org/10.1109/CICC.2009.5280774},
doi = {10.1109/CICC.2009.5280774},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/cicc/RosenbaumBBF09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/apccas/HsuehKLR08,
author = {Kelvin K. Hsueh and
Sin{-}Hao Ke and
Jeffrey Lee and
Elyse Rosenbaum},
title = {UVeriESD: An {ESD} verification tool for SoC design},
booktitle = {{IEEE} Asia Pacific Conference on Circuits and Systems, {APCCAS} 2008,
Macao, China, November 30 2008 - December 3, 2008},
pages = {53--56},
publisher = {{IEEE}},
year = {2008},
url = {https://doi.org/10.1109/APCCAS.2008.4745958},
doi = {10.1109/APCCAS.2008.4745958},
timestamp = {Wed, 16 Oct 2019 14:14:50 +0200},
biburl = {https://dblp.org/rec/conf/apccas/HsuehKLR08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jssc/BhatiaHR07,
author = {Karan S. Bhatia and
Sami Hyvonen and
Elyse Rosenbaum},
title = {A Compact, ESD-Protected, SiGe BiCMOS {LNA} for Ultra-Wideband Applications},
journal = {{IEEE} J. Solid State Circuits},
volume = {42},
number = {5},
pages = {1121--1130},
year = {2007},
url = {https://doi.org/10.1109/JSSC.2007.894826},
doi = {10.1109/JSSC.2007.894826},
timestamp = {Sun, 30 Aug 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/jssc/BhatiaHR07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/LiZMORC06,
author = {Hongmei Li and
Cole E. Zemke and
Giorgos Manetas and
Vladimir I. Okhmatovski and
Elyse Rosenbaum and
Andreas C. Cangellaris},
title = {An automated and efficient substrate noise analysis tool},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {25},
number = {3},
pages = {454--468},
year = {2006},
url = {https://doi.org/10.1109/TCAD.2005.854628},
doi = {10.1109/TCAD.2005.854628},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/LiZMORC06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/LiJBR06,
author = {Junjun Li and
Sopan Joshi and
Ryan Barnes and
Elyse Rosenbaum},
title = {Compact modeling of on-chip {ESD} protection devices using Verilog-A},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {25},
number = {6},
pages = {1047--1063},
year = {2006},
url = {https://doi.org/10.1109/TCAD.2005.855948},
doi = {10.1109/TCAD.2005.855948},
timestamp = {Wed, 09 Dec 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tcad/LiJBR06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/cicc/BhatiaHR06,
author = {Karan S. Bhatia and
Sami Hyvonen and
Elyse Rosenbaum},
title = {An 8-mW, ESD-protected, {CMOS} {LNA} for Ultra-Wideband Applications},
booktitle = {Proceedings of the {IEEE} 2006 Custom Integrated Circuits Conference,
{CICC} 2006, DoubleTree Hotel, San Jose, California, USA, September
10-13, 2006},
pages = {385--388},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/CICC.2006.320955},
doi = {10.1109/CICC.2006.320955},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/cicc/BhatiaHR06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HyvonenJR05,
author = {Sami Hyvonen and
Sopan Joshi and
Elyse Rosenbaum},
title = {Comprehensive {ESD} protection for {RF} inputs},
journal = {Microelectron. Reliab.},
volume = {45},
number = {2},
pages = {245--254},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.05.012},
doi = {10.1016/J.MICROREL.2004.05.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HyvonenJR05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iscas/RosenbaumH05,
author = {Elyse Rosenbaum and
Sami Hyvonen},
title = {On-chip {ESD} protection for {RF} I/Os: devices, circuits and models},
booktitle = {International Symposium on Circuits and Systems {(ISCAS} 2005), 23-26
May 2005, Kobe, Japan},
pages = {1202--1205},
publisher = {{IEEE}},
year = {2005},
url = {https://doi.org/10.1109/ISCAS.2005.1464809},
doi = {10.1109/ISCAS.2005.1464809},
timestamp = {Wed, 16 Oct 2019 14:14:49 +0200},
biburl = {https://dblp.org/rec/conf/iscas/RosenbaumH05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tvlsi/KanjR04,
author = {Rouwaida Kanj and
Elyse Rosenbaum},
title = {Critical evaluation of {SOI} design guidelines},
journal = {{IEEE} Trans. Very Large Scale Integr. Syst.},
volume = {12},
number = {9},
pages = {885--894},
year = {2004},
url = {https://doi.org/10.1109/TVLSI.2004.833665},
doi = {10.1109/TVLSI.2004.833665},
timestamp = {Wed, 11 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tvlsi/KanjR04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/KanjLAR04,
author = {Rouwaida Kanj and
Timothy Lehner and
Bhavna Agrawal and
Elyse Rosenbaum},
editor = {Sharad Malik and
Limor Fix and
Andrew B. Kahng},
title = {Noise characterization of static {CMOS} gates},
booktitle = {Proceedings of the 41th Design Automation Conference, {DAC} 2004,
San Diego, CA, USA, June 7-11, 2004},
pages = {888--893},
publisher = {{ACM}},
year = {2004},
url = {https://doi.org/10.1145/996566.996803},
doi = {10.1145/996566.996803},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/KanjLAR04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JoshiR03,
author = {Sopan Joshi and
Elyse Rosenbaum},
title = {Simulator-independent compact modeling of vertical npn transistors
for {ESD} and {RF} circuit simulation},
journal = {Microelectron. Reliab.},
volume = {43},
number = {7},
pages = {1021--1027},
year = {2003},
url = {https://doi.org/10.1016/S0026-2714(03)00130-6},
doi = {10.1016/S0026-2714(03)00130-6},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JoshiR03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/cicc/LiJR03,
author = {Junjun Li and
Sopan Joshi and
Elyse Rosenbaum},
title = {A Verilog-A compact model for {ESD} protection NMOSTs},
booktitle = {Proceedings of the {IEEE} Custom Integrated Circuits Conference, {CICC}
2003, San Jose, CA, USA, September 21 - 24, 2003},
pages = {253--256},
publisher = {{IEEE}},
year = {2003},
url = {https://doi.org/10.1109/CICC.2003.1249398},
doi = {10.1109/CICC.2003.1249398},
timestamp = {Mon, 15 Nov 2021 17:53:34 +0100},
biburl = {https://dblp.org/rec/conf/cicc/LiJR03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/LiCYORC02,
author = {Hongmei Li and
Jorge Carballido and
Harry H. Yu and
Vladimir I. Okhmatovski and
Elyse Rosenbaum and
Andreas C. Cangellaris},
editor = {Lawrence T. Pileggi and
Andreas Kuehlmann},
title = {Comprehensive frequency-dependent substrate noise analysis using boundary
element methods},
booktitle = {Proceedings of the 2002 {IEEE/ACM} International Conference on Computer-aided
Design, {ICCAD} 2002, San Jose, California, USA, November 10-14, 2002},
pages = {2--9},
publisher = {{ACM} / {IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1145/774572.774573},
doi = {10.1145/774572.774573},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccad/LiCYORC02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iscas/KanjR02,
author = {Rouwaida Kanj and
Elyse Rosenbaum},
title = {A critical look at design guidelines for {SOI} logic gates},
booktitle = {Proceedings of the 2002 International Symposium on Circuits and Systems,
{ISCAS} 2002, Scottsdale, Arizona, USA, May 26-29, 2002},
pages = {261--264},
publisher = {{IEEE}},
year = {2002},
url = {https://doi.org/10.1109/ISCAS.2002.1010210},
doi = {10.1109/ISCAS.2002.1010210},
timestamp = {Wed, 16 Oct 2019 14:14:49 +0200},
biburl = {https://dblp.org/rec/conf/iscas/KanjR02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RosenbaumW01,
author = {Elyse Rosenbaum and
Jie Wu},
title = {Trap generation and breakdown processes in very thin gate oxides},
journal = {Microelectron. Reliab.},
volume = {41},
number = {5},
pages = {625--632},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00026-9},
doi = {10.1016/S0026-2714(01)00026-9},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RosenbaumW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WuJR01,
author = {Jie Wu and
Patrick Juliano and
Elyse Rosenbaum},
title = {Breakdown and latent damage of ultra-thin gate oxides under {ESD}
stress conditions},
journal = {Microelectron. Reliab.},
volume = {41},
number = {11},
pages = {1771--1779},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00033-6},
doi = {10.1016/S0026-2714(01)00033-6},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WuJR01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangJJR01,
author = {Yu Wang and
Patrick Juliano and
Sopan Joshi and
Elyse Rosenbaum},
title = {Electrothermal model for simulation of bulk-Si and {SOI} diodes in
{ESD} protection circuits},
journal = {Microelectron. Reliab.},
volume = {41},
number = {11},
pages = {1781--1787},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00034-8},
doi = {10.1016/S0026-2714(01)00034-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WangJJR01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/ChenLRK00,
author = {Danqing Chen and
Erhong Li and
Elyse Rosenbaum and
Sung{-}Mo Kang},
title = {Interconnect thermal modeling for accurate simulation of circuittiming
and reliability},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {19},
number = {2},
pages = {197--205},
year = {2000},
url = {https://doi.org/10.1109/43.828548},
doi = {10.1109/43.828548},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/ChenLRK00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/LiTRK99,
author = {Tong Li and
Ching{-}Han Tsai and
Elyse Rosenbaum and
Sung{-}Mo Kang},
editor = {Mary Jane Irwin},
title = {Substrate Modeling and Lumped Substrate Resistance Extraction for
{CMOS} ESD/Latchup Circuit Simulation},
booktitle = {Proceedings of the 36th Conference on Design Automation, New Orleans,
LA, USA, June 21-25, 1999},
pages = {549--554},
publisher = {{ACM} Press},
year = {1999},
url = {https://doi.org/10.1145/309847.309996},
doi = {10.1145/309847.309996},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/LiTRK99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ispd/ChenLRK99,
author = {Danqing Chen and
Erhong Li and
Elyse Rosenbaum and
Sung{-}Mo Kang},
editor = {D. F. Wong},
title = {Interconnect thermal modeling for determining design limits on current
density},
booktitle = {Proceedings of the 1999 International Symposium on Physical Design,
{ISPD} 1999, Monterey, CA, USA, April 12-14, 1999},
pages = {172--178},
publisher = {{ACM}},
year = {1999},
url = {https://doi.org/10.1145/299996.300057},
doi = {10.1145/299996.300057},
timestamp = {Sun, 02 Oct 2022 16:10:02 +0200},
biburl = {https://dblp.org/rec/conf/ispd/ChenLRK99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/ChengRTRK98,
author = {Yi{-}Kan Cheng and
Prasun Raha and
Chin{-}Chi Teng and
Elyse Rosenbaum and
Sung{-}Mo Kang},
title = {{ILLIADS-T:} an electrothermal timing simulator for temperature-sensitive
reliability diagnosis of {CMOS} {VLSI} chips},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {17},
number = {8},
pages = {668--681},
year = {1998},
url = {https://doi.org/10.1109/43.712099},
doi = {10.1109/43.712099},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/ChengRTRK98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/TengCRK97,
author = {Chin{-}Chi Teng and
Yi{-}Kan Cheng and
Elyse Rosenbaum and
Sung{-}Mo Kang},
title = {iTEM: a temperature-dependent electromigration reliability diagnosis
tool},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {16},
number = {8},
pages = {882--893},
year = {1997},
url = {https://doi.org/10.1109/43.644613},
doi = {10.1109/43.644613},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/TengCRK97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/ChengTDRK96,
author = {Yi{-}Kan Cheng and
Chin{-}Chi Teng and
Abhijit Dharchoudhury and
Elyse Rosenbaum and
Sung{-}Mo Kang},
editor = {Thomas Pennino and
Ellen J. Yoffa},
title = {iCET: {A} Complete Chip-Level Thermal Reliability Diagnosis Tool for
{CMOS} {VLSI} Chips},
booktitle = {Proceedings of the 33st Conference on Design Automation, Las Vegas,
Nevada, USA, Las Vegas Convention Center, June 3-7, 1996},
pages = {548--551},
publisher = {{ACM} Press},
year = {1996},
url = {https://doi.org/10.1145/240518.240622},
doi = {10.1145/240518.240622},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/ChengTDRK96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/TengCRK96,
author = {Chin{-}Chi Teng and
Yi{-}Kan Cheng and
Elyse Rosenbaum and
Sung{-}Mo Kang},
editor = {Thomas Pennino and
Ellen J. Yoffa},
title = {Hierarchical Electromigration Reliability Diagnosis for {VLSI} Interconnects},
booktitle = {Proceedings of the 33st Conference on Design Automation, Las Vegas,
Nevada, USA, Las Vegas Convention Center, June 3-7, 1996},
pages = {752--757},
publisher = {{ACM} Press},
year = {1996},
url = {https://doi.org/10.1145/240518.240661},
doi = {10.1145/240518.240661},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/TengCRK96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/ChengRK96,
author = {Yi{-}Kan Cheng and
Elyse Rosenbaum and
Sung{-}Mo Kang},
title = {{ETS-A:} {A} New Electrothermal Simulator for {CMOS} {VLSI} Circuits},
booktitle = {1996 European Design and Test Conference, ED{\&}TC 1996, Paris,
France, March 11-14, 1996},
pages = {566--570},
publisher = {{IEEE} Computer Society},
year = {1996},
url = {https://doi.org/10.1109/EDTC.1996.494357},
doi = {10.1109/EDTC.1996.494357},
timestamp = {Fri, 20 May 2022 15:52:30 +0200},
biburl = {https://dblp.org/rec/conf/date/ChengRK96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/TuRCLMQKH93,
author = {Robert H. Tu and
Elyse Rosenbaum and
Wilson Y. Chan and
Chester C. Li and
Eric R. Minami and
Khandker N. Quader and
Ping K. Ko and
Chenming Hu},
title = {Berkeley reliability tools-BERT},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {12},
number = {10},
pages = {1524--1534},
year = {1993},
url = {https://doi.org/10.1109/43.256927},
doi = {10.1109/43.256927},
timestamp = {Wed, 03 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/TuRCLMQKH93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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