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BibTeX records: Steven F. Oakland
@inproceedings{DBLP:conf/vts/IyengarPFWLGTDO07, author = {Vikram Iyengar and Kenneth Pichamuthu and Andrew Ferko and Frank Woytowich and David E. Lackey and Gary Grise and Mark Taylor and Mike Degregorio and Steven F. Oakland}, title = {An Integrated Framework for At-Speed and ATE-Driven Delay Test of Contract-Manufactured ASICs}, booktitle = {25th {IEEE} {VLSI} Test Symposium {(VTS} 2007), 6-10 May 2007, Berkeley, California, {USA}}, pages = {173--178}, publisher = {{IEEE} Computer Society}, year = {2007}, url = {https://doi.org/10.1109/VTS.2007.15}, doi = {10.1109/VTS.2007.15}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/vts/IyengarPFWLGTDO07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/CoryKTKKKBON06, author = {Bruce Cory and Rohit Kapur and Mick Tegethoff and Mark Kassab and Brion L. Keller and Kee Sup Kim and Dwayne Burek and Steven F. Oakland and Benoit Nadeau{-}Dostie}, editor = {Scott Davidson and Anne Gattiker}, title = {{OCI:} Open Compression Interface}, booktitle = {2006 {IEEE} International Test Conference, {ITC} 2006, Santa Clara, CA, USA, October 22-27, 2006}, pages = {1--4}, publisher = {{IEEE} Computer Society}, year = {2006}, url = {https://doi.org/10.1109/TEST.2006.297746}, doi = {10.1109/TEST.2006.297746}, timestamp = {Tue, 12 Dec 2023 09:46:27 +0100}, biburl = {https://dblp.org/rec/conf/itc/CoryKTKKKBON06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/dt/AnandCFJOOW03, author = {Darren Anand and Bruce Cowan and Owen Farnsworth and Peter Jakobsen and Steven F. Oakland and Michael Ouellette and Donald L. Wheater}, title = {An On-Chip Self-Repair Calculation and Fusing Methodology}, journal = {{IEEE} Des. Test Comput.}, volume = {20}, number = {5}, pages = {67--75}, year = {2003}, url = {https://doi.org/10.1109/MDT.2003.1232258}, doi = {10.1109/MDT.2003.1232258}, timestamp = {Sun, 17 May 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/dt/AnandCFJOOW03.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/CowanFJOOW02, author = {Bruce Cowan and Owen Farnsworth and Peter Jakobsen and Steven F. Oakland and Michael Ouellette and Donald L. Wheater}, title = {On-Chip Repair and an {ATE} Independent Fusing Methodology}, booktitle = {Proceedings {IEEE} International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002}, pages = {178--186}, publisher = {{IEEE} Computer Society}, year = {2002}, url = {https://doi.org/10.1109/TEST.2002.1041759}, doi = {10.1109/TEST.2002.1041759}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/CowanFJOOW02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Oakland02, author = {Steven F. Oakland}, title = {TAPs All Over My Chips}, booktitle = {Proceedings {IEEE} International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002}, pages = {1192}, publisher = {{IEEE} Computer Society}, year = {2002}, url = {https://doi.org/10.1109/TEST.2002.1041899}, doi = {10.1109/TEST.2002.1041899}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Oakland02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Oakland00, author = {Steven F. Oakland}, title = {Considerations for implementing {IEEE} 1149.1 on system-on-a-chip integrated circuits}, booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City, NJ, USA, October 2000}, pages = {628--637}, publisher = {{IEEE} Computer Society}, year = {2000}, url = {https://doi.org/10.1109/TEST.2000.894257}, doi = {10.1109/TEST.2000.894257}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Oakland00.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Oakland97, author = {Steven F. Oakland}, title = {Why Would an {ASIC} Foundry Accept Anything Less than Full Scan?}, booktitle = {Proceedings {IEEE} International Test Conference 1997, Washington, DC, USA, November 3-5, 1997}, pages = {1031}, publisher = {{IEEE} Computer Society}, year = {1997}, url = {https://doi.org/10.1109/TEST.1997.639721}, doi = {10.1109/TEST.1997.639721}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Oakland97.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/Oakland91, author = {Steven F. Oakland}, title = {Combining {IEEE} Standard 1149.1 with reduced-pin-count component test}, booktitle = {9th {IEEE} {VLSI} Test Symposium (VTS'91), 15-17 Apr 1991, Atlantic City, NJ, {USA}}, pages = {78--84}, publisher = {{IEEE} Computer Society}, year = {1991}, url = {https://doi.org/10.1109/VTEST.1991.208137}, doi = {10.1109/VTEST.1991.208137}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/vts/Oakland91.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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